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Attractive atomic forces

To summarize, the existence and role of force in STM is now a well-established scientific fact. At a relatively large absolute distance, for example, 5 A, the force between these two parties is attractive. (By absolute distance we mean the distance between the nucleus of the apex atom of the tip and the top-layer nuclei of the sample surface.) At very short absolute distances, for example, 1.5 A, the force between these two parts is repulsive. Between these two extremes, there is a well-defined position where the net force between the tip and the sample is zero. It is the equilibrium distance. On the absolute distance scale, the equilibrium distance is about 2-2.5 A. Therefore, the tip-sample distance of normal STM operation is 3-7 A on the absolute distance scale. In this range, the attractive atomic force dominates, and the distortion of wavefunctions cannot be disregarded. Therefore, any serious attempt to understand the imaging mechanism of STM should consider the effect of atomic forces and the wavefunction distortions. [Pg.38]

Second, the sensitivity of AFM. In a typical AFM (Binnig et al., 1986), the force sensitivity is about 0.01 nN. In the range of 4-10 a.u., the resonance force in the hydrogen molecular ion is 4 nN to 0.01 nN. Therefore, the resonance force (attractive atomic force) of a single chemical bond, extended over a distance of 3 A, can be detected. On the other hand, the van der Waals force of a pair of neutral atoms, when it is distinguishable from the total force. [Pg.185]

Fig. 7.6. Perturbation theory of the attractive atomic force in STM. (a) The geometry of the system. A separation surface is drawn between the tip and the sample, (b) The potential of the coupled system, (c) The potential surface of the unperturbed Hamiltonian of the sample, Us, which may be different from the potential surface of the free sample, Uso, (d) The potential surface of the unperturbed Hamiltonian of the tip, Ut, which may be different from the potential surface of the free tip, U-m- The effect of the difference between the "free" tip (sample) potential and the "distorted" tip (sample) potential can be evaluated using the perturbation method see Chapter 2. (Reproduced from Chen, 1991b, with permission.)... Fig. 7.6. Perturbation theory of the attractive atomic force in STM. (a) The geometry of the system. A separation surface is drawn between the tip and the sample, (b) The potential of the coupled system, (c) The potential surface of the unperturbed Hamiltonian of the sample, Us, which may be different from the potential surface of the free sample, Uso, (d) The potential surface of the unperturbed Hamiltonian of the tip, Ut, which may be different from the potential surface of the free tip, U-m- The effect of the difference between the "free" tip (sample) potential and the "distorted" tip (sample) potential can be evaluated using the perturbation method see Chapter 2. (Reproduced from Chen, 1991b, with permission.)...
Chen, C. J. (1991c). Attractive atomic force as a tunneling phenomenon. J. Phys. Cond. Matter 3, 1227-1245. [Pg.387]

Key words Surface force - amine-modified surface - long-range attraction - atomic force microscope - isoelectric point... [Pg.277]

All this being said, perhaps the most definitive study of the relative roles of electrostatic and van der Waals forces was performed by Gady et al. [86,101,102]. In their studies, they attached a spherical polystyrene particle, having a radius between 3 and 6 p.m, to the cantilever of an atomic force microscope. They then conducted three distinct measurements that allowed them to distinguish between electrostatic and van der Waals forces that attracted the particle to various conducting, smooth substrates. [Pg.176]

It is relatively easy to summarize how nuclear stability (and hence the attractive nuclear forces) depends upon the numbers of protons and neutrons in the nucleus. For atoms with atomic number less than 20, the most stable nuclei are those in which there are equal numbers of protons and neutrons. For atoms with atomic numbers between 20 and 83, the most stable nuclei have more neutrons than protons. For atoms of atomic number greater than 83, no nucleus can be considered stable by our definition. These... [Pg.416]

Typical forces profdes measmed between glass surfaces in ethanol-cyclohexane mixtures are shown in Fig. 2. Colloidal probe atomic force microscopy has been employed. In pure cyclohexane, the observed force agrees well with the conventional van der Waals attraction calculated with the nometarded Hamaker constant for glass/cyclohexane/glass. [Pg.3]

Atomic force microscopy (AFM) or, as it is also called, scanning force microscopy (SFM) is based on the minute but detectable forces - of the order of nano Newtons -between a sharp tip and atoms on the surface. The tip is mounted on a flexible arm, called a cantilever, and is positioned at a subnanometre distance from the surface. If the sample is scanned under the tip in the x-y plane, it feels the attractive or repulsive force from the surface atoms and hence it is deflected in the z-direction. The deflection can be measured with a laser and photo detectors as indicated schematically in Fig. 4.29. Atomic force microscopy can be applied in two ways. [Pg.164]

Figure 4.29. Experimental set-up for atomic force microscopy. The sample is mounted on a piezo electric scanner and can be positioned with a precision better than 0.01 nm in thex, y, and z directions. The tip is mounted on a flexible arm, the cantilever. When the tip is attracted or repelled by the sample, the deflection of the cantilever/tip assembly is... Figure 4.29. Experimental set-up for atomic force microscopy. The sample is mounted on a piezo electric scanner and can be positioned with a precision better than 0.01 nm in thex, y, and z directions. The tip is mounted on a flexible arm, the cantilever. When the tip is attracted or repelled by the sample, the deflection of the cantilever/tip assembly is...
Parameters Bi , ai - and Ci - for light atoms have been listed by Gavezzoti [63], Examples of the resulting potential functions are shown in Fig. 5.1. The minimum point in each graph corresponds to the interatomic equilibrium distance between two single atoms. In a crystal shorter distances result because a molecule contains several atoms and thus several attractive atom-atom forces are active between two molecules, and because attractive forces with further surrounding molecules cause an additional compression. All attractive forces taken together are called van der Waals forces. [Pg.43]

An ordered distribution of spheres of different sizes always allows a better filling of space the atoms are closer together, and the attractive bonding forces become more effective. As for the structures of other types of compound, we observe the validity of the principle of the most efficient filling of space. A definite order of atoms requires a definite chemical composition. Therefore, metal atoms having different radii preferentially will combine in the solid state with a definite stoichiometric ratio they will form an inter-metallic compound. [Pg.158]

A less obvious explanation is that the observed residual structure is not due to attractive interactions, but rather to repulsive ones. The steric repulsion between atoms forced to partially overlap is a dominant, if not the dominant, force in all of chemistry. These highly local interactions are known to be important in polymer conformations (Flory, 1969 Ramachandran and Sasisekharan, 1968). For homopolymers or simple alternating polymers, they can often be safely neglected by assuming they confer no net directionality to the chain. Polypeptide chains, however, are chiral and support specific sequences of 20 differently shaped... [Pg.38]

Figure 7.14 Experimental set-up for atomic force microscopy. The sample is mounted on a piezoelectric scanner and can be positioned with a precision better than 0.01 nm in the x, y, and z direction. The tip is mounted on a flexible arm the cantilever. When the tip is attracted or repelled by the sample, the deflection of the cantilever/tip assembly is measured as follows. A laser beam is focussed at the end of the cantilever and reflected to two photodiodes, numbered 1 and 2. If the tip bends towards the surface, photodiode 2 receives more light than 1, and the difference in intensity between 1 and 2 is a measure of the deflection of the cantilever and thus of the force between the sample and the tip. With four photodiodes, one can also measure the sideways deflection of the tip, for example at an edge on the sample surface. Figure 7.14 Experimental set-up for atomic force microscopy. The sample is mounted on a piezoelectric scanner and can be positioned with a precision better than 0.01 nm in the x, y, and z direction. The tip is mounted on a flexible arm the cantilever. When the tip is attracted or repelled by the sample, the deflection of the cantilever/tip assembly is measured as follows. A laser beam is focussed at the end of the cantilever and reflected to two photodiodes, numbered 1 and 2. If the tip bends towards the surface, photodiode 2 receives more light than 1, and the difference in intensity between 1 and 2 is a measure of the deflection of the cantilever and thus of the force between the sample and the tip. With four photodiodes, one can also measure the sideways deflection of the tip, for example at an edge on the sample surface.

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