Analytical techniques optical microscopy

There are various reasons to study the composition of ancients cements. The actual composition of a cement, for example, provides information on its nature, the technology used for making it, and the provenance of its components (Middendorf et al. 2005). It may also elicit differences between the nature of an original cement used for building and that used for later repairs (Streicher 1991 Jedrzejewska 1990). Most analytical work concerning ancient cement in the recent past has been based mainly on the use of optical microscopy and classical analysis techniques. Sometimes, such studies are complemented with information derived by instrumental techniques (Blauer-Bohm and Jagers 1997). 

Although electron microscopy is approached in this chapter as an analytical technique (a variant of XRF), it is essential to state at the outset that electron microscopy is far more versatile than this. Many standard descriptions of electron microscopy approach the subject from the microscopy end, regarding it as a higher resolution version of optical microscopy. Several texts, such as Goodhew et al. (2001), Reed (1993) and Joy et al. (1986), are devoted to the broad spectrum of analytical electron microscopy, but the emphasis here on the analytical capacity is justified in the context of a book on archaeological chemistry. 

Membrane filters are particularly useful when surface analytical techniques, such as optical and electron microscopy and X-ray fluorescence analysis, are to be used subsequent to collection, because most of the particles remain on the surface of the filter. 

The most frequently applied analytical methods used for characterizing bulk and layered systems (wafers and layers for microelectronics see the example in the schematic on the right-hand side) are summarized in Figure 9.4. Besides mass spectrometric techniques there are a multitude of alternative powerful analytical techniques for characterizing such multi-layered systems. The analytical methods used for determining trace and ultratrace elements in, for example, high purity materials for microelectronic applications include AAS (atomic absorption spectrometry), XRF (X-ray fluorescence analysis), ICP-OES (optical emission spectroscopy with inductively coupled plasma), NAA (neutron activation analysis) and others. For the characterization of layered systems or for the determination of surface contamination, XPS (X-ray photon electron spectroscopy), SEM-EDX (secondary electron microscopy combined with energy disperse X-ray analysis) and... 

The kinetics of transition from the liquid crystal to the fully ordered crystal of flexible, linear macromolecules was studied by Warner and Jaffe 38) on copolyesters of hydroxybenzoic acid, naphthalene dicarboxylic acid, isophthalic acid, and hydro-quinone. The analytical techniques were optical microscopy, calorimetry and wide angle X-ray diffraction. Despite the fact that massive structural rearrangements did not occur on crystallization, nucleation and growth followed the Avrami expression with an exponent of 2. The authors suggested a rod-like crystal growth. 

Asbestos can be determined by several analytical techniques, including optical microscopy, electron microscopy, X-ray diffraction (XRD), light scattering, laser microprobe mass analysis, and thermal analysis. It can also be characterized by chemical analysis of metals by atomic absorption, X-ray fluorescence, or neutron activation techniques. Electron microscopy methods are, however, commonly applied for the analysis of asbestos in environmental matrices. 

Technical examination of objects coated with a protective covering derived from the sap of a shrubby tree produces information that can be used to determine the materials and methods of manufacture. This information sometimes indicates when and where the piece was made. This chapter is intended to present a brief review of the raw material urushi, and the history and study of its use. Analytical techniques have included atomic absorption spectroscopy, thin layer chromatography, differential thermal analysis, emission spectroscopy, x-ray radiography, and optical and scanning electron microscopy these methods and results are reviewed. In addition, new methods are reported, including the use of energy dispensive x-ray fluorescence, scanning photoacoustical microscopy, laser microprobe and nondestructive IR spectrophotometry. 

Energy-dispersive X-ray microanalysis Surface analytical techniques Scanning near-field optical microscopy Scanning thermal microscopy Atomic force microscopy X-ray photoelectron spectroscopy... 

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