AEM

The overwhelming majority of AEM studies on organic surfaces has concerned organic thin films on inorganic snbstrates and, in particvilar, those deposited via Langmnir-Blodgett or self-assembly processes [35]. These films... 

Shimada, J., Mikakawa, S. and Ohashi, T. 1992 Design for Manufacture, Tools and Methods the Assemblability Evaluation Method (AEM). In Proceedings FISITA 92 Congress, London, No. C389/460. 

The STEM instrument itself can produce highly focused high-intensity beams down to 2 A if a field-emission source is used. Such an instrument provides a higher spatial resolution compositional analysis than any other widely used technique, but to capitalize on this requires very thin samples, as stated above. EELS and EDS are the two composition techniques usually found on a STEM, but CL, and even AES are sometimes incorporated. In addition simultaneous crystallographic information can be provided by diffraction, as in the TEM, but with 100 times better spatial resolution. The combination of diffraction techniques and analysis techniques in a TEM or STEM is termed Analytical Electron Microscopy, AEM. A well-equipped analytical TEM or STEM costs well over 1,000,000. 

D. B. Williams. Practical Analytical Electron Microscopy in Materials Science. Verlag Chemie International, Weinheim, 1984. A good monograph discussing the use and applications of AEM, especially at intermediate voltages. The discussion on EDS is an excellent primer for using X-ray analysis on a TEM. 

Principles of Analytical Electron Microscopy (D. C. Joy, A. D. Romig, and J. I. Goldstein, eds.) Plenum Press, New York, 1986. Another book, more readily available, discussing all aspects of AEM. Approximately one-quarter of the book is devoted to EDS and a discussion of thin-film analysis in the TEM. 

The uniqueness and desirability of EELS is realized when it is combined with the power of a TEM or STEM to form an Analytical Electron Microscope (AEM). This combination allows the analyst to perform spatially resolved nondestructive analysis with high-resolution imaging (< 3 A). Thus, not oiJy can the analyst observe the microstructure of interest (see the TEM article) but, by virtue of the focusing ability of the incident beam in the electron microscope, he or she can simultaneously analyze a specific region of interest. Lateral spatial resolutions of regions as small as 10 A in diameter are achievable with appropriate specimens and probe-forming optics in the electron microscope. 

Ethylene-vinyl acetate mbbers (EAM)—this chapter Ethylene-acrylate mbbers (AEM)—this chapter Fluorombbers (FKM, CFM, FFKM, FZ, AFMU etc.)—Chapter 13 Silicone and fluorosilicone mbbers (MQ, VMQ, PMQ, PVMQ and FVMQ)— Chapter 29... 

AES has also been applied to study preferential sputtering of TiSi forming for low-resistivity conductor films in ULSI devices [2.151], or the electromigration behavior of Au-Ag films on Si02 using AES, XPS and AEM [2.152]. 

Since Jm,m+i is always greater than zero, the AW energy of recombination is generally greater than AEm ym+i and in many cases is probably also greater than AEm- m+i- This fact implies that the excitation should be feasible. 

Pandey et al. have used ultrasonic velocity measurement to study compatibility of EPDM and acrylonitrile-butadiene rubber (NBR) blends at various blend ratios and in the presence of compa-tibilizers, namely chloro-sulfonated polyethylene (CSM) and chlorinated polyethylene (CM) [22]. They used an ultrasonic interferometer to measure sound velocity in solutions of the mbbers and then-blends. A plot of ultrasonic velocity versus composition of the blends is given in Eigure 11.1. Whereas the solution of the neat blends exhibits a wavy curve (with rise and fall), the curves for blends with compatibihzers (CSM and CM) are hnear. They resemble the curves for free energy change versus composition, where sinusoidal curves in the middle represent immiscibility and upper and lower curves stand for miscibihty. Similar curves are obtained for solutions containing 2 and 5 wt% of the blends. These results were confirmed by measurements with atomic force microscopy (AEM) and dynamic mechanical analysis as shown in Eigures 11.2 and 11.3. Substantial earher work on binary and ternary blends, particularly using EPDM and nitrile mbber, has been reported. 

Galuska, A.A., Poulter, R.R., and McElrath, K.O., Eorce modulation AEM of elastomer blends Morphology, fillers and cross-hnking. Surf. Interface Anal., 25, 418, 1997. 

Eastman and Zhn [52] performed a study of SisN4 tips, subsequently coated with gold and finally with paraffin thin films, adhering to mica. The study was purely qualitative, because they did not have accnrate valnes for either their lever stiffnesses or their tip radii. By enclosing their AEM in a sealed container and controlling the humidity they found that hydrophobic tips show a lower adhesion with a surface expected to have a thin water film, as also observed by Jarvis and Pethica [51]. Surprisingly they did not see any dependence of adhesion on hnmidity for any of their tips. 

Analytical electron microscopy (AEM) permits elemental and structural data to be obtained from volumes of catalyst material vastly smaller in size than the pellet or fluidized particle typically used in industrial processes. Figure 1 shows three levels of analysis for catalyst materials. Composite catalyst vehicles in the 0.1 to lOim size range can be chemically analyzed in bulk by techniques such as electron microprobe, XRD, AA, NMR,... 

However, these techniques may not detect important phenomena taking place on the surface of or within the interior of individual Inm-to Ipm-diameter inorganic particles that are s3rnthesized specifically for their catalytic activity. AEM is an extremely useful technique for analysis of the individual heterogeneous catalyst particle and its relationship to various supporting materials. Structural and chemical analyses can be obtained from specimen regions nearly 1000 times smaller than those studied by conventional bulk analysis techniques. This high lateral spatial... 

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