X-rays mirrors

Recent applications of e-beam and HF-plasma SNMS have been published in the following areas aerosol particles [3.77], X-ray mirrors [3.78, 3.79], ceramics and hard coatings [3.80-3.84], glasses [3.85], interface reactions [3.86], ion implantations [3.87], molecular beam epitaxy (MBE) layers [3.88], multilayer systems [3.89], ohmic contacts [3.90], organic additives [3.91], perovskite-type and superconducting layers [3.92], steel [3.93, 3.94], surface deposition [3.95], sub-surface diffusion [3.96], sensors [3.97-3.99], soil [3.100], and thermal barrier coatings [3.101]. 

The scattering of the X-ray beam in the forward direction adds out-of-phase components to the propagating beam, as the classical electron scattering has a negative sign. This implies that the X-ray refractive index n differs from unity. The reduction in n leads to total reflection at very small angles, which is applied in the design of X-ray mirrors. 

Figure 6.1 Comparison of 26 — 6 scan profiles obtained by a monochromatized (pure Cu kal) parallel beam configuration (hybrid x-ray mirror) and a conventional parallel beam configuration achieved by divergence slit (ds) module measured at 001/100 (a), 002/200 (b), 003/300 (c), 004/400 (d) of 500nm-thick Pb(Zro.B4Tio.46)03 thin film. Dotted lines represent the second derivative of the profiles, indicating the peak positions. Note that the profiles are simulated fitted profiles for obtained spectrum using pseudo-Voight function (mixed Lorentz and Gauss function).

Figure 6.2 (a)Example of overview of high-resolution X-ray diffractometer (PANalytical s X Pert PRO-MRD system), and (b) schematics of incident and diffracted side optics used in the present study. For incident beam optics, a hybrid X-ray mirror and X-ray polycapillaries are used in combination with line focus and point focus of X-ray tube, respectively. 

PLD for series production Pilot scale production PLD systems are in successful operation for X-ray mirrors and are commercially available with excellent thickness and composition homogeneity and reproducibility [14,128]... 

Finally, it can he added that very thin nickel films are used as seed layers for the growth of fullerenes and of silicon carbide SiC whiskers, and that C/Ni multilayers are used as x-ray mirrors. ... 

Diamond like films are amorphous, smooth and lightweight. The ability to produce very thin (2-6 nm) and smooth films together with low atomic number makes these films an ideal material for use as protective coatings on x-ray mirrors. Also, these films are scratch/chemical resistant and block ultraviolet radiation. These properties taken together can revolutionize the spectacle and goggle industry. These properties... 

X-ray mirrors play an essential role at SR sources in focussing applications and/or rejecting high order harmonic reflections from a monochromator. 

The X-ray mirror on the camera consisted of two 20 cm segments of fused quartz each of which had a separate bending mechanism. The monochromator was either a bent quartz crystal (101 plane) or Ge (111), each with an oblique cut of 7° the crystals were rectangular with equal couples applied at each end to obtain the necessary curvature (same principle as the mirror bender). 

We report results of nano-scale surface replication by thin polymer layers. The surfaces of deeply polished Si plates were used as etalon surfaces for the replication. AFM investigations showed that polymer layers replicate the surface of etalon samples fairly well. The X-ray reflectivity measurements showed that the half-width and peak values of the spectral dependences for X-ray mirrors grown on combined glass-polymer substrates practically coincided with those for mirrors on Si etalon substrates. 

Polymer materials find a wide application in replication technologies for producing structures with submicron elements of intricate shapes and for nano-scale surface replication [1-4]. They show considerable promise for smoothing out the surface roughness to obtain good-quality inexpensive substrates used in fabrication of X-ray optic components [5,6], In this work, the features of silicon wafer surface replication by polymers were studied by atomic-force microscopy (AFM) and X-ray reflectometry (XRR) with a view to applying this replication technique to produce smooth polymer-glass combination substrates to be used in multilayer X-ray mirrors. 

Electroluminescence was excited by v oltage i mposed to the ELT samples by stripe contacts. Photoluminescence (PL) and lasing were excited at T=18-500 K by the radiation of a N2 laser ( A v = 3.68 eV, /= 1 kHz, Tp = 8 ns) and a CW HeCd laser (Av=3.81 eV). The X-ray diffraction was measured with a Philips X Pert Materials Research Diffractometer. The system uses CuX radiation and a four-crystal Ge monochromator in the (220) setting. It is also equipped with an X-ray mirror in order to increase the intensity of the primary beam. The beam size was limited to 1.4x3 mm, co - 20 scans were performed using a triple bounce Ge (220) analyser. 

Using a fine focus X-Ray tube helps compensate these effects. The excitation radiation of such a tube can be transmitted optimally to the sample by X-ray lenses or X-ray mirrors. As a mirror for X-rays, again a crystal can be used, which in this case is concave-shaped. The reflected radiation is polarized [2,4,5]. Figtire 5 shows this in a linear plane schematic. 

R. Hudec and B. Valnicek 1986, Czechoslovak Replica X-ray mirrors for astronomical applications , SPIE Proc. Vol. 597, 111. 

Metal organic chemical vapor deposition (MOCVD) is a promising method for the preparation of thin films. Metal/silicon multilayers with a single layer thickness of 1-10 nm, as used for soft X-ray mirrors [1,2], demand very smooth layers (roughness < 0.5 nm). 

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