X-ray diffractometer

Fig. 12. Siemens SMART Single Crystal X-ray Diffractometer System.

X-ray crystallography, 864-865 X-ray diffractometer. 865 oXylene, ozonolysis of, 542 Xylose, configuration of, 982... 

X-ray measurements were carried out on an automatic small-angle x-ray diffractometer with linear-position-sensitive detector (Mogilevski et al. 1984, Erokhin et al. 1995b). CuK (= 1.54 A) radiation was used. The sample was rotated with respect to the initial beam, while the intensity was registered in all channels of the detector. 

This work was supported by the Brain Korea 21 Project in 2003. We wish to thank Korea Basic Science Institute (Daegu Branch) for the use of X-ray diffractometer. 

X-ray diffraction XRD was performed to determine the bulk crystalline phases of catalyst. It was conducted using a SIEMENS D-5000 X-ray diffractometer with CuX (k = 1.54439 A). The spectra were scanned at a rate of 2.4 degree/min in the range 20 = 20-80 degrees. 

We have adapted a commercially available x-ray diffractometer normally used for structure determinations on single crystals to operate as a very flexible device for performing x-ray pole figure determinations and related studies on polymeric materials. Descriptions of crystallite orientations, as provided by pole figures, are useful in studying many aspects of the behavior of products made from semicrystalline polymers. This paper describes the software that we have written for our pole figure facility. Except for some vendor-provided routines to drive the hardware Interface all of our software is written in FORTRAN. Menu driven operation is provided to maximize user convenience. 

Fig. 2. X-ray diffractometer patterns from layers of Pd and Ag deposited at 0°C (a) and after heating at 530°C for 1 hr (b), 2 hr (c), and 3 hr (d). Vertical lines show expected peak positions (30).

The decomposition of formic acid over evaporated Pd-Au alloy films has been studied by Clarke and Rafter (69) the same reaction on Pd-Au alloy wires was studied by Eley and Luetic (128). The alloy films were prepared in a conventional high vacuum system by simultaneous evaporation of the component metals from tungsten hairpins. The alloy films were characterized by X-ray diffraction and electron microscopy. The X-ray diffractometer peaks were analyzed by a method first used by Moss and Thomas (SO). It was found that alloys deposited at a substrate temperature of 450°C followed by annealing for one hour at the same temperature were substantially homogeneous. Electron microscopy revealed that all compositions were subject to preferred orientation (Section III). 

Nakano, T., Kaibara, K., Tabata, Y., Nagata, N., Enomoto, S., Marukawa, E. and Umakoshi, Y. (2002) Unique alignment and texture of biological apatite crystallites in typical calcified tissues analyzed by microbeam X-ray diffractometer system. Bone, 31, 479-487. 

X-ray diffraction (XRD) patterns for the materials were recorded on a X-ray diffractometer using nickel-filtered CuKa (0.154 nm) radiation and a liquid nitrogen-cooled germanium solid-state detector. Thermal stability of the materials was performed using a thermogravimetric analyser. The acidity of calcined samples were determined... 

The XRD patterns of the catalysts were obtained before and after the catalytic reaction by a Rigaku MiniflexII X-Ray diffractometer. The BET surface areas of the samples were measured with a QUNTACHROMNova2200 automatic adsorption instrument. 

Differential refraction( ) and colorimetric measurements ) were used to determine the amount of carbohydrate polymer adsorbed from solution. A Phillips X-ray diffractometer was used to quantify the degree of interlayer expansion(60. The cation exchange capacity of the peptized sodium and potassium... 

Fig. 27 X-ray diffraction pattern of our Ti02 fiber. The Ti02 fiber was pulverized, and the X-ray diffraction pattern of the powder was recorded with a Rigaku X-ray diffractometer with CuKa radiation with a nickel filter...

R. Jenkins and J. A. Nicolosi, Long wavelength X-ray diffractometer, North American Phillips Corporation Patent Application, 1987. 

The electronic structure and physical properties of any molecule can in principle be determined by quantum-mechanical calculations. However, only in the last 20 years, with the availability and aid of computers, has it become possible to solve the necessary equations without recourse to rough approximations and dubious simplifications2. Computational chemistry is now an established part of the chemist s armoury. It can be used as an analytical tool in the same sense that an NMR spectrometer or X-ray diffractometer can be used to rationalize the structure of a known molecule. Its true place, however, is a predictive one. Therefore, it is of special interest to predict molecular structures and physical properties and compare these values with experimentally obtained data. Moreover, quantum-mechanical computations are a very powerful tool in order to elucidate and understand intrinsic bond properties of individual species. 

The X-ray diffraction pattern of griseofulvln was obtained on a Phillips ADP-3500 X-ray Diffractometer using Cu K(x radiation (1.5405A0) and Ni filter. The data is given in Table VI. 

The crystal properties of pseudoephedrine hydrochloride were determined with a GE model XRD-6 x-ray diffractometer using Zr filtered MoK radiation on a crystal grown from water.8 Pseudoephedrine hydrochloride has an orthorhombic crystal system belonging to the P212121 space group. The cell dimensions are a=25.358 A, b=6.428 A, c=6.901 A with each cell containing four molecules. 

X-ray diffraction profile, 26 417 X-ray diffractometers commonly used, 26 422 X-ray effect, 20 661 X-ray electromagnetic spectrum,... 

Troy Heany of the Molex, Inc., positions an electroplated specimen in the x-ray diffractometer (left) and then observes the computer image of the location on the specimen where the thickness is measured (right). 

Solutions and precipitates were analyzed on a Beckman Spectra-Span VI direct current plasma emission spectrophotometer (DCP), Precision for the Ca2 + analyses was 3% and for the Ba2 + 2% except for the most dilute samples In which It rose as high as 5%. Calcite mineralogy was determined on a Philips x-ray diffractometer calcite was the only phase recorded except In speed runs of under one hour In duration (not Included In this study) which produced vaterite. Details of analytic procedures are available In Pingitore and Eastman (30,31). 

Model 467), x-ray powder diffracton (Philips XRG-3000, x-ray diffractometer, CuK radiation Ni filter), and scanning electron microscopy, SEM (ISI scanning electron microscope, Model II). Infrared spectra and powder diffraction data were in agreement with the published values for apatite (19,20). Chemical analysis of the solid gave a molar ratio of Ca/P = 1.64 +0.01 the SSA was 21.5 m g"1. 

XRD patterns were recorded with a Rigaku Rotalflex (RU-200B) X-ray diffractometer using Cu Ka radiation with a Ni filter. The tube current was 100 mA with a tube voltage of 40 kV. The 20 angular regions between 15 and 85° were explored at a scan rate of 5° min . The Pt (220) peak (64 to 72°) was scanned at 1° min to obtain... 

The complexity of the solvable structure strongly depends on the spectral resolution of the diffraction method in use. Structures with about 60 atoms in the asymmetric unit were solved from powder data combining synchrotron X-ray diffraction with refinement from neutron diffraction data from the same material (Morris et al. 1994 Admans 2000). About half of that complexity can be achieved with good laboratory X-ray diffractometers (Masciocchi et al. 1996 Kariuki et al. 1999). Neutron diffraction data can better be used for structure refinement than for structure determination, for the same reason. 

It must be also noted that modem X-ray diffractometers are usually equipped with software that calculates grain size and lattice strain. 

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