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Thin film , formation

There are therefore two ways in which lasers may be used to bring about photon-assisted film formation. If the laser emits radiation in the near-ultra-violet or above, photochemical decomposition occurs in the gas phase and some unabsorbed radiation arrives at the substrate, but this latter should be a minor effect in die thin film formation. This procedure is referred to as photolysis. Alternatively, if the laser emits radiation in the infra-red, and tire photons are only feebly absorbed to raise the rotational energy levels of the gaseous... [Pg.82]

In this section, the thin-film formation of OPVs is investigated with optical microscopy and X-ray diffraction (XRD). In the case of Oocl-OPV5, this has been supplemented with surface imaging by means of atomic force microscopy. It is demonstrated how an annealing treatment of the films alter deposition influences... [Pg.307]

Anionic Dendrimer for Calcium Carbonate Thin Films Formation 155... [Pg.141]

Anionic Dendrimer for Caicium Carbonate Thin Films Formation... [Pg.155]

Sharma RK, Singh G, Shul YG, Kim H (2007) Mechanism of manganese (mono and di) telluride thin-film formation and properties. Physica B 390 314-319... [Pg.147]

Furthermore, LEED is an important tool to study thin film growth, and can reveal the mechanism of thin film formation as well as the final stmcture of mono/multi topmost layers versus substrate [Attard et al., 1995]. [Pg.247]

Lipowsky, P. Jia, S. Hoffmann, R. C. Jin-Phillipp, N. Y. Bill, J. Ruhle, M. 2006. Thin film formation by oriented attachment of polymer-capped nanocrystalline ZnO. Zeitschrift fur Metalllcunde 97(5) 607-613. [Pg.233]

Tab. 2.2 Etch rates of common materials used in semiconductor manufacturing in the most popular wet etching solutions. Note that this table gives only a rough overview etch rates may vary significantly depending on the details of thin film formation parameters, etchant composition, temperature and additives, e.g. surfactants. Tab. 2.2 Etch rates of common materials used in semiconductor manufacturing in the most popular wet etching solutions. Note that this table gives only a rough overview etch rates may vary significantly depending on the details of thin film formation parameters, etchant composition, temperature and additives, e.g. surfactants.
Thin-Film Stage. The mechanism of thin-film formation is characterized by three simultaneous crystal building processes nucleation (formation), growth, and coalescence of three-dimensional crystallites (TDCs). [Pg.156]

F.-J. Tsai, D. Kang and M. Anand, Thin Film Composite Gas Separation Membranes On the Dynamics of Thin Film Formation Mechanism on Porous Substrates, Sep. Sci. Technol. 30, 1639 (1995). [Pg.157]

Ni2Si Comparison with thin-film formation // J.Appl.Phys- 1990 - V.67, No.7-... [Pg.284]

A self-consistent picture arises, in which the optical changes of the PPEs upon thin-film formation can be attributed to an aggregation-induced planarization of single polymer chains. While the aggregation process involves many chains that enforce their mutual pla-... [Pg.239]

In Section 3.4, we considered the intercalation of surface molecules into the interstices available within a host compound. We consider the case where the surface molecules remain on the surface to form a thin crystalline film. Thin-film formation is at the heart of integrated-circuit manufacturing. An example of... [Pg.120]

The use of chemical engineering concepts has already contributed significantly to crystal growth [4], thin-film formation [5-7], and plasma... [Pg.397]

Thin Film Formation Liquid Phase Coating Physical Vapor Deposition Chemical Vapor Deposition... [Pg.397]

Through the combination of SPR with a - poten-tiostat, SPR can be measured in-situ during an electrochemical experiment (electrochemical surface plasmon resonace, ESPR). Respective setups are nowadays commercially available. Voltammetric methods, coupled to SPR, are advantageously utilized for investigations of - conducting polymers, thin film formation under influence of electric fields or potential variation, as well as - electropolymerization, or for development of -> biosensors and - modified electrodes. Further in-situ techniques, successfully used with SPR, include electrochemical - impedance measurements and -+ electrochemical quartz crystal microbalance. [Pg.505]

Chemical vapor deposition is a key process for thin film formation in the development and manufacture of microelectronic devices. It shares many kinetic and transport phenomena with heterogeneous catalysis, but CVD reactor design has not yet reached the level of sophistication used in analyzing heterogeneous catalytic reactors. With the exception of the tubular LPCVD reactor, conventional CVD reactors may be viewed as variations on the original horizontal reactor. These reactors have complex flow fields and it is consequently difficult to control and predict the effect of operating conditions on the film thickness and composition. [Pg.208]

In the fabrication of semiconductors, CVD is an important technique for the thin-film formations with an increase in device intensity performance. Tungsten hexafluoride has been widely used as a source gas of tungsten silicide (WSi,v) and tungsten metal for electrodes and interconnects. [Pg.641]


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See also in sourсe #XX -- [ Pg.24 , Pg.25 , Pg.26 , Pg.27 , Pg.28 , Pg.29 , Pg.30 , Pg.31 , Pg.32 , Pg.33 , Pg.34 , Pg.35 , Pg.36 ]




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