Temperature schematic apparatus

Schematic drawing of a temperature-jump apparatus (adapted from Ref. 13). Shown are the analyzing lamp, observation cell, monochromator, photomultiplier, oscilloscope, spark gap, and high-voltage supply.

A schematic of this high temperature reduction apparatus is shown in Figure 4. 

Fig. 8. Schematic diagram of the experimental arrangement used in making live-time X-ray diffraction measurements with the temperature gradient apparatus...

Fig. 8-3 Schematic drawing of a temperature jump apparatus. (A) Light source (B) monochromator (C) observation cell (D) photomultiplier, emitter follower (E) oscilloscope (F) spark gap (G) high voltage.

A low-temperature flexibility apparatus, described in MIL-S-8516 and modified by the addition of insulated walls, was used to bend the coated aluminum strips around the 4-in.-diameter mandrel. This is schematically shown in Fig. 1. The entire apparatus was cooled first with dry ice and then w ith liquid nitrogen. The specimens W ere then inserted and liquid nitrogen was allowed to flow over them for approximately one minute before testing. 

Imagine the following schematic apparatus. Take a semi-infinite tube and fill it with one stable stationary state, call it 1, and take another semi-infinite tube and fill it with the other stable stationary state, call it 3. Both tubes are at the same external constraints, of temperature, pressure and concentration of species. Place the tubes lengthwise together, see Fig. 5.2a, at first with a partition between them. 

Fig. 1. Schematic diagram of the electric field/temperature-jump apparatus. The equilibrium solution in the sample cell is perturbed by a square pulse produced by the high voltage pulse generator (HV PG). It consists of an energy storage (ES) unit, spark gaps (G I and G II) and a probe (PR). The analyzing light source [power supply (PS), lamp (L), monochromator (M), polarizer (P)] and the detector [analyzer (A), fiber optic (FO), photo multiplier (PM), power supply (PS), oscilloscope (OSC)] represent the detection system. The timing control provides for synchronization.

Fig. 2. Schematic diagram of the laser temperature-jump apparatus.

Fig. 2. Schematic of apparatus for temperature-jump (T-jump) measurements.

A schematic representation of a PR apparatus is shown in Figure 2. In PR a pump beam (laser or other light source) chopped at frequency 2 creates photo-injected electron-hole pairs that modulate the built-in electric field of the semiconductor. The photon energy of the pump beam must be larger than the lowest energy gap of the material. A typical pump beam for measurements at or below room temperature is a 5-mW He-Ne laser. (At elevated temperatures a more powerful pump must be employed.)... 

Modified ARC Experiments. Pressure and temperature data at pre-exotherm temperatures may be collected by running the ARC under modified conditions. A schematic diagram of the experimental setup of a modified ARC apparatus is shown in Figure 1. 

The pyrolysis of the plastics was carried out in a semi-batch reactor which was made of cylindrical stainless steel tube with 80mm in internal diameter and 135mm in height. A schematic diagram of the experimental apparatus is shown in Fig. 1, which includes the main reactor, temperature controller, agitator, condenser and analyzers. 

This method was similar to that used by Hiteshue et al (3). In this method sand (50 g, mesh 0.42 - 0.15 mm) was mixed with the coal (25 g, mesh 0.5 - 0.25 mm). The addition of sand to the coal helped to prevent agglomeration (4). All the experiments used an aqueous solution of stannous chloride impregnated on the coal as a catalyst. The amount of catalyst added on a tin basis was 1% of the mass of the coal. These mixtures were placed in a hot-rod reactor and heated to 500°C at a heating rate of 200°C per minute. Residence time at temperature was 15 minutes. Hydrogen at a flow rate of 22 liters/minute and a pressure of 25 MPa was continously passed through the fixed bed of coal/sand/catalyst. The volatile products were collected in high-pressure cold traps. A schematic of the apparatus used is shown in Figure 2. 

Using the dilatometer technique, a small sample of powder (about 1 -2 grams) is heated at constant rate in the apparatus depicted schematically in Fig. 43. Dilatation of the sample is measured by a linear voltage transducer (LVDT) contraction of the sample indicates particle-particle surface flattening and defines the minimum softening point ox sintering temperature, Ts. In... 

Fig. 14 Schematic diagram of apparatus suitable for thermogravimetric analysis. The experimental observable is the percent weight loss of the sample, which will be plotted as a function of the system temperature.

Figure 7. Schematic diagram of a photothermal deflection spectroscopy (PDS) apparatus for infrared- spectral measurements of surfaces at high temperatures and high pressures constructed at Utah by L.B. Lloyd.

The apparatus and the special accessories necessary for this work are schematically illustrated in the Fig. 22. The reaction chamber used for the Knudsen effusion method is positioned above the balance. The reaction chamber is thermostatically controlled and connected with a cold trap. Both of them are protected from outside temperature effects by an insulating material. This protection leads to a more constant temperature and a straight line in the recorded loss in weight. 

Figure 2 gives a schematic of the apparatus used for pH measurements at 25 and 80°C. It consisted of a stoppered Erlen-meyer flask submerged in a temperature bath regulated at either 25 or 80°C. The contents of the flask were stirred by means of a magnetic stirrer coupled to a motor beneath the bath. A pH probe and thermometer were inserted through the stopper at the top of the flask and another hole was stoppered for use in pi-peting solution into or out of the flask. 

Figure 1 shows a schematic (elevation) of the Plastofrost apparatus as modified for the present study. The two main components are the heater and the coking attachment. The heater consists of a nickel-plated copper slab in which four 300 watt cartridge heaters are enclosed. A chromel/alumel thermocouple insulated with ceramic tubing placed 5 mm beneath the top surface of the slab measures the temperature (see Fig. 1). The bead of the TC is at the centre of the slab. Figure 2 is a photograph of the assembled apparatus.

Figure 15.19 (a) Schematic preparation procedure and apparatus for Rh and PtRh nanoparticle catalysts from Rh and PtRh salt-impregnated silicates by super critical fluid CO2 treatment (b) phase diagram of super critical CO2 as functions of pressure and temperature. 

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