Spectroscopy Spatial Resolution

Sample preparation is straightforward for a scattering process such as Raman spectroscopy. Sample containers can be of glass or quartz, which are weak Raman scatterers, and aqueous solutions pose no problems. Raman microprobes have a spatial resolution of - 1 //m, much better than the diffraction limit imposed on ir microscopes (213). Eiber-optic probes can be used in process monitoring (214). 

Cathodoluminescence (CL), i.e., the emission of light as the result of electron-beam bombardment, was first reported in the middle of the nineteenth century in experiments in evacuated glass tubes. The tubes were found to emit light when an electron beam (cathode ray) struck the glass, and subsequendy this phenomenon led to the discovery of the electron. Currendy, cathodoluminescence is widely used in cathode-ray tube-based (CRT) instruments (e.g., oscilloscopes, television and computer terminals) and in electron microscope fluorescent screens. With the developments of electron microscopy techniques (see the articles on SEM, STEM and TEM) in the last several decades, CL microscopy and spectroscopy have emerged as powerfirl tools for the microcharacterization of the electronic propenies of luminescent materials, attaining spatial resolutions on the order of 1 pm and less. Major applications of CL analysis techniques include ... 

As mentioned earlier, CL is a powerful tool for the characterization of optical properties of wide band-gap materials, such as diamond, for which optical excitation sources are not readily available. In addition, electron-beam excitation of solids may produce much greater carrier generation rates than typical optical excitation. In such cases, CL microscopy and spectroscopy are valuable methods in identifying various impurities, defects, and their complexes, and in providing a powerful means for the analysis of their distribution, with spatial resolution on the order of 1 pm and less. ... 

Scanning Auger Electron Spectroscopy (SAM) and SIMS (in microprobe or microscope modes). SAM is the most widespread technique, but generally is considered to be of lesser sensitivity than SIMS, at least for spatial resolutions (defined by primary beam diameter d) of approximately 0.1 im. However, with a field emission electron source, SAM can achieve sensitivities tanging from 0.3% at. to 3% at. for Pranging from 1000 A to 300 A, respectively, which is competitive with the best ion microprobes. Even with competitive sensitivity, though, SAM can be very problematic for insulators and electron-sensitive materials. 

The technique of photoemission electron spectroscopy (PEEM) is a particularly attractive and important one for spatially resolved work function measurements, as both the Kelvin probe technique and UPS are integral methods with very poor ( mm) spatial resolution. The PEEM technique, pioneered in the area of catalysis by Ertl,72-74 Block75 76 and Imbihl,28 has been used successfully to study catalytic oscillatory phenomena on noble metal surfaces.74,75... 

Analytical electron microscopy permits structural and chemical analyses of catalyst areas nearly 1000 times smaller than those studied by conventional bulk analysis techniques. Quantitative x-ray analyses of bismuth molybdates are shown from lOnm diameter regions to better than 5% relative accuracy for the elements 61 and Mo. Digital x-ray images show qualitative 2-dimensional distributions of elements with a lateral spatial resolution of lOnm in supported Pd catalysts and ZSM-5 zeolites. Fine structure in CuLj 2 edges from electron energy loss spectroscopy indicate d>ether the copper is in the form of Cu metal or Cu oxide. These techniques should prove to be of great utility for the analysis of active phases, promoters, and poisons. 

The combination of atomic force microscopy (AFM) and Raman spectroscopy is another approach to attain high spatial resolution. AFM also employs a sharp tip close to a sample surface. When the tip is made of metal and light is irradiated onto the tip and surface, Raman scattering is largely enhanced. In this way, a spatial resolution of 15 nm is achieved [2]. 

In summary, recent progress and future prospects in the research field of fiuorescence and Raman spectroscopy combined with STM in order to achieve high spatial resolution spectroscopy have been reviewed. In the near future, single (sub-) molecule STM spectroscopy is expected to be applied to the nano-world of science and engineering. 

In 1994, we proposed that a metallic needle having a nano-tip at its apex be employed as a nano-light-source for microscopy attaining nanometric spatial resolution [2]. Later, we expanded the technique to Raman spectroscopy for molecular nano-identification, nano-analysis and nano-imaging. In this chapter, we give a brief introduction to local plasmons and microscopy using a metallic nano-needle to produce the local plasmons. Then, we describe the microscope that we built and... 

A nano-light-source generated on the metallic nano-tip induces a variety of optical phenomena in a nano-volume. Hence, nano-analysis, nano-identification and nanoimaging are achieved by combining the near-field technique with many kinds of spectroscopy. The use of a metallic nano-tip applied to nanoscale spectroscopy, for example, Raman spectroscopy [9], two-photon fluorescence spectroscopy [13] and infrared absorption spectroscopy [14], was reported in 1999. We have incorporated Raman spectroscopy with tip-enhanced near-field microscopy for the direct observation of molecules. In this section, we will give a brief introduction to Raman spectroscopy and demonstrate our experimental nano-Raman spectroscopy and imaging results. Furthermore, we will describe the improvement of spatial resolution... 

Similarly, the first-order expansion of the p° and a of Eq. (5.1) is, respectively, responsible for IR absorption and Raman scattering. According to the parity, one can easily understand that selection mles for hyper-Raman scattering are rather similar to those for IR [17,18]. Moreover, some of the silent modes, which are IR- and Raman-inactive vibrational modes, can be allowed in hyper-Raman scattering because of the nonlinearity. Incidentally, hyper-Raman-active modes and Raman-active modes are mutually exclusive in centrosymmetric molecules. Similar to Raman spectroscopy, hyper-Raman spectroscopy is feasible by visible excitation. Therefore, hyper-Raman spectroscopy can, in principle, be used as an alternative for IR spectroscopy, especially in IR-opaque media such as an aqueous solution [103]. Moreover, its spatial resolution, caused by the diffraction limit, is expected to be much better than IR microscopy. 

XANES spectroscopy is also the basis of chemically sensitive X-ray imaging, as well as qualitative and quantitative microspectroscopy [306], ptXANES is attractive for chemical analysis, with its spatial resolution down to 10 ptm. Variations on the theme are surface EXAFS (SEXAFS), grazing incidence XAS and in situ time-resolved XAS investigations. Grazing angle XAFS can be used for the study of ultrathin multilayer systems. 

Elemental distribution and chemical state of ppm metal impurities can be measured using synchrotron-based X-ray fluorescence ( iXRF) and X-ray absorption spectroscopy ( iXAS), both with a I -2 irn2 spatial resolution [314]. 

We shall concern ourselves here with the use of an X-ray probe as a surface analysis technique in X-ray photoelectron spectroscopy (XPS) also known as Electron Spectroscopy for Chemical Analysis (ESCA). High energy photons constitute the XPS probe, which are less damaging than an electron probe, therefore XPS is the favoured technique for the analysis of the surface chemistry of radiation sensitive materials. The X-ray probe has the disadvantage that, unlike an electron beam, it cannot be focussed to permit high spatial resolution imaging of the surface. 

X-ray photoelectron spectroscopy is frequently applied in the fields of catalysis and polymer technology. It has poor spatial resolution, and is generally limited to homogenous samples. Radiation sensitive materials are more appropriate for XPS analysis, as the X-ray beam is less damaging to the specimen surface than the electron beam used in AES, partly due to the lower flux densities that are used. 

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