Silicon Strips

FIGURE 3.3 Examples of passive samplers affected by deposition of suspended particulate matter and biofouling (a) silicone strip sampler, (b) nonpolar version of the Chemcatcher, (c) MESCO sampler fitted with a cellulose membrane, and (d) MESCO sampler fitted with polyethylene membrane (front) and SPMD (back). 

The lay-out of the detector is shown in Fig. 6. Two layers of 16 silicon strip detector modules each for charged particle tracking and vertex reconstruction are surrounded by a cylinder constructed of 16 rows of 12 Csl (pure) crystals for the detection of the two 511 keV 7-rays. This arrangement gives a large solid angle coverage for both particle types and a sufficiently fine resolution for vertex reconstruction. 

Antiproton-matter annihilation at rest produces on average 3 charged pions with momenta around 300 MeV/c. These particles must first traverse the trap electrodes, the wall of the surrounding vacuum vessel, the walls of the inner dewar, and finally the walls of the enclosure of the detectors. Multiple scattering in these layers leads to an uncertainty of the annihilation vertex position of about 0.5 mm and the accuracy of the hit measurement in each of the two layers of the silicon strip detector should be matched to this extrapolation accuracy. 

Fig. 6. Cross sectional view of the annihilation detector showing the inner two layers of silicon strip detectors for charged particle detection and the outer cylinder of Csl crystals for 511 keV 7 detection...

Two new detectors marketed by the Bruker Corporation provide sensitivities much greater than the detectors aheady described. The Lynx Eye is a linear silicon strip detector that is claimed to have sensitivity 200 times that of the standard scintillation detector. The Vantec is a linear microgap/wire detector. It is an ultra-low noise detector and is about 100 times more sensitive than the scintillation detector. 

Lightly sand one surface of each silicone strip. This will aid in adhesion. Make sure to clean the surface of the rubber strips after abrasion. 

Silicone strips Silicone rubber, PDMS Water boundary layer... 

A low energy GRB telescope based on the use of silicon strip detectors and 1-D coded masks is proposed. It has the ability to locate a GRB rapidly with accuracy better than 2. It therefore should permit rapid follow-up observations to be made at other wavelengths and may enhance the probability of making an identification with counterparts in the optical waveband. The system can be extended to higher energies by the use of a second, thicker layer of silicon strip detectors. The telescope can also be used as an all sky X-ray monitor, by utilising the satellite orbit precession and Radon transforms [6]. 

GLAST - A BROADBAND HIGH ENERGY 7-RAY TELESCOPE USING SILICON STRIP DETECTORS... 

The primary components of the GLAST pair conversion telescope are the solid state (silicon strip) tracker and the segmented Csl calorimeter. The tracker has 12 conversion layers (0.5 radiation lengths) plus a front veto... 

GLAST - a broadband high energy 7-ray telescope using silicon strip detectors... 

The CMS experiment—one of the four large LHC experiments— is a general-purpose detector designed to optimally exploit the physics potential of the LHC. Located inside the superconducting solenoid, which provides a 3.8 Tesla held, are the hadronic and electromagnetic calorimeters as well as the tracking system. The latter is based on silicon pixels and silicon strip detectors, with a total sUicon area of 210 m. A multi-layer muon system embedded in the return yoke outside the solenoid completes the CMS detector. 

The pixel detector was inserted into CMS after the installation and cabling of the silicon strip detector had been completed. The BPIX detector fits into the small volume limited by the outer radius of the beam pipe at 2.9 cm and the inner radius of the first layer of the strip tracker at about 21 cm. A system with bending rails on top and bottom inside CMS had been designed to insert the pixel detector and the supply tubes along the beam pipe. A clearance of 7-8 mm to the beam pipe had been calculated in simulations and checked with the help of a design model. The transport box with the pixel detector was placed on an insertion table and the rail system inside the box was joint with the rail system inside CMS using temporary extension rails (see Fig. 8.14). In this way, the pixel detector could slide out of the transport box into its final position. At the end, the service lines were connected at the so-called patch panel 0 (PPO) to the detector infrastructure. 

The results of the alignment of the silicon strip and pixel detectors is detailed in [14], After performing a track-based alignment, the precision of the detector position with respect to particle trajectories had been derived from the distribution of the median of the cosmic muon track residuals measured in each module. A precision of 3 /rm in the direction and 4 /xm in the z direction has been achieved for the BPIX detector. 

The silicon strip tracker has a length of 5.8 m and a diameter of 2.4m and is composed of four subsystems the four-layer Tracker Inner Barrel (TIB), the six-layer tracker outer barrel (TOB) and on each side three-disk Tracker Inner Disks (TID) and nine-disk Tracker Endcaps (TEC). An rz-view of the tracker geometry is shown in Fig. 2.3. 

The silicon strip tracker is built from 15,148 single-sided modules that provide 9.3 million readout channels. Modules for the TIB, the TID and the first four rings of the TEC are single-sided while the TOB and the outer three rings of the TEC are equipped with double-sided modules. A double-sided module is constructed from two single-sided modules glued back-to-back at a stereo angle of lOOmrad. 

Ellipsometric measurements were done using a Gaertner model L-115B ellipsom-eter (HeNe laser, wavelength 632.8 nm, Gaertner Scientific, Chicago, IL). Six points were measured on the dip-coated slider rows and silicon strips. Three points were measured on the dip-coated silicon wafers. The PFOM thickness was calculated from... 

Since the air bearing surface of the slider is carbon-overcoated, the same carbon overcoat was placed on some of the silicon strips to evaluate the PFOM film thickness and ellipsometric measurement procedure on carbon- and non-carbon-overcoated substrates. A nominally 12.5-nm-thick layer of sputtered carbon was deposited on silicon strips, and the strips were dip coated with PFOM. The ellipsometric angles A and T were measured. The two-layer model (two films on an absorbing substrate) was used with the optical constants for the materials listed in table 4.6 in calculating the PFOM thickness from A and T on carbon-overcoated silicon. The apparent... 

Optical Constants from Ellipsometry and Ellipsometric Angles A and P for the Carbon-Overcoated Silicon Strips... 

PFOM Thickness on Carbon-Overcoated Silicon Strips as Measured by Ellipsometry and as Estimated from XPS d/X... 

Since an additional ellipsometric measurement would be needed to determine the carbon-overcoat thickness, the ellipsometric measurement of PFOM thickness directly on non-carbon-overcoated silicon is more straightforward. Silicon strips and wafers were dip coated with PFOM. The PFOM thickness measnred by ellipsometry and the dIX from XPS are listed in table 4.8. The thickness measured by ellipsometry was divided by the dIX from XPS for each sample (last two columns in table 4.8). The experimentally determined average electron mean free path for PFOM film is X = 2.66 nm. Sliders were dip coated with PFOM at the same conditions as the silicon wafers and strips, and dIX was measured on the air bearing surface of each slider by XPS. These dIX were multiplied by A, = 2.66 nm, as determined above, to estimate the PFOM thickness on the air bearing surface. These results are listed in table 4.9. The concentration of the PFOM solution was 650 ppm, and the withdrawal rate was 1.6 mm/s. 

PFOM Thickness as Measured by Ellipsometry on Silicon Strips and Wafers, and the Mean Free F th Determined from XPS Measurement on the Same Samples... 

Note Magnetic recording sliders were dip coated at the same time and conditions as the silicon strips and wafers in table 4.7 using the experimental average mean free path X = 2.66 nm from table 4.8. 

FIGURE 4.10 Atomic force images from 1x1 tm scans on 5 nm thick PFOM fihn on silicon equilibrated at ambient 50% relative humidity, 0.26 nm nns ronghness (a), the same PFOM film as in (a) following equilibration in a vacuum desiccator, 0.17 nm rms roughness (b), and an uncoated silicon strip, 0.09 nm rms roughness (c). 

The development of an industrial procedure for applying a magnetic recording slider coating and for measuring the coating thickness was described. Both ellipsometry and XPS were employed to complement one another for thickness measurement and calibration. Ellipsometric measurement cannot be performed on slider rails, so it was done on slider rows or on silicon strips cut into the shape of slider rows. XPS was necessary to obtain the resolution needed for manufacturing process control. 

Wrede, C., Hussein, A., Rogers, J.G., D Auria, J. A double sided silicon strip detector as a DRAGON end detector. Nucl. Instrum. Methods Phys. Res. B204, 619-624 (2003)... 

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