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Semiconductor parameters characterizing

A logical consequence of this trend is a quantum w ell laser in which tire active region is reduced furtlier, to less tlian 10 nm. The 2D carrier confinement in tire wells (fonned by tire CB and VB discontinuities) changes many basic semiconductor parameters, in particular tire density of states in tire CB and VB, which is greatly reduced in quantum well lasers. This makes it easier to achieve population inversion and results in a significant reduction in tire tlireshold carrier density. Indeed, quantum well lasers are characterized by tlireshold current densities lower tlian 100 A cm . ... [Pg.2896]

In addition to chemical reactions, the isokinetic relationship can be applied to various physical processes accompanied by enthalpy change. Correlations of this kind were found between enthalpies and entropies of solution (20, 83-92), vaporization (86, 91), sublimation (93, 94), desorption (95), and diffusion (96, 97) and between the two parameters characterizing the temperature dependence of thermochromic transitions (98). A kind of isokinetic relationship was claimed even for enthalpy and entropy of pure substances when relative values referred to those at 298° K are used (99). Enthalpies and entropies of intermolecular interaction were correlated for solutions, pure liquids, and crystals (6). Quite generally, for any temperature-dependent physical quantity, the activation parameters can be computed in a formal way, and correlations between them have been observed for dielectric absorption (100) and resistance of semiconductors (101-105) or fluidity (40, 106). On the other hand, the isokinetic relationship seems to hold in reactions of widely different kinds, starting from elementary processes in the gas phase (107) and including recombination reactions in the solid phase (108), polymerization reactions (109), and inorganic complex formation (110-112), up to such biochemical reactions as denaturation of proteins (113) and even such biological processes as hemolysis of erythrocytes (114). [Pg.418]

Figure 1. Geometric parameters characterizing the semiconductor-electrolyte contact... Figure 1. Geometric parameters characterizing the semiconductor-electrolyte contact...
In reality, the measured ( )m comprises two parts the bulk contribution to the work function or the internal work function, ( )n,b, and a surface electric dipole Aq associated with the tail of the electron wave function spilling out of metal surface into vacuum, as depicted in Figure 6.3. Thus, the work function of metal is in fact a parameter characterized by the metal/vacuum interface. When the metal comes in contact with an organic semiconductor, naturally the dipole... [Pg.186]

To make the connection between the energy levels of the electrolyte and the semiconductor it is necessary to introduce the flat-band potential, Ufi, as a critical parameter characterizing the semiconductor electrode. The flat-band potential is the electrode potential at which the semiconductor bands are flat (zero space charge in the semiconductor) it is measured with respect to a reference electrode, usually either the standard normal H /H2 redox potential (n.h.e.) or the standard calomel electrode (s.c.e.). [Pg.267]

The methods to fabricate and characterize nanogap were demonstrated. Two chrome masks are used to fabricate this micro-gap, where polysilicon material is used to pattern the gap. The electrieal characterizations in this research were done by using Semiconductor Parameter Analyzer (SPA), Spectrum Analyzer, IV-CV Station for electrical characteristic. Conductivity, resistivity and capacitance tests are performed to... [Pg.392]

The percolation model of adsorption response outlined in this section is based on assumption of existence of a broad spread between heights of inter-crystalline energy barriers in polycrystals. This assumption is valid for numerous polycrystalline semiconductors [145, 146] and for oxides of various metals in particular. The latter are characterized by practically stoichiometric content of surface-adjacent layers. It will be shown in the next chapter that these are these oxides that are characterized by chemisorption-caused response in their electrophysical parameters mainly generated by adsorption charging of adsorbent surface [32, 52, 155]. The availability of broad spread in heights of inter-crystalline barriers in above polycrystallites was experimentally proved by various techniques. These are direct measurements of the drop of potentials on probe contacts during mapping microcrystal pattern [145] and the studies of the value of exponential factor of ohmic electric conductivity of the material which was L/l times lower than the expected one in case of identical... [Pg.72]

One difficulty with many synthetic preparations of semiconductor NCs that complicates any interpretation of NMR results is the inevitable distribution of sizes (and exact shapes or surface morphologies). Therefore attempts to make semiconductors as a sort of molecular cluster having a well-defined stoichiometry are of interest to learn potentially about size-dependent NMR parameters and other properties. One approach is to confine the semiconductor inside a template, for instance the cuboctahedral cages of the sodalite framework or other zeolite structures, which have been characterized by multinuclear NMR methods [345-347], including the mesoporous channel material MCM-41 [341, 348]. [Pg.294]

Palmour, J. W., H. S. Kong, and R. F. Davis, Characterization of Device Parameters in High-Temperature Metal-Oxide-Semiconductor Field-Effect Transistors in fi-SiC Thin Films, J. of Applied Physics, Vol. 64, No. 4, August 15, 1988, pp. 2168-2177. [Pg.174]

This potential decay implies that there is a field inside the semiconductor and that the excess-charge density slowly decays to zero as if there were an electronic cloud analogous to the ionic cloud adjacent to an electrode in solution. It can be seen that the potential due to the atmosphere of holes and electrons is characterized by the same parameter... [Pg.277]

While the ability to treat capture cross sections theoretically is very primitive and the experimental data on capture cross sections are very limited this phenomenological parameter seems to be an appropriate meeting place for experiment and theory. More work in both of these areas is needed to characterize and understand the important role of surface states in electron transfer at semiconductor-electrolyte interfaces. [Pg.116]

EPR studies of metal-doped Ti02 and other oxide colloids were used for structural and functional characterization of such materials. This information is spread in many original articles, and was partially collected in [21, 220-222]. Various paramagnetic ions such as Mo5+, W5+, Cr5+, Nb4+, Ta4+, Mn4+, Mn3+, Cr3+, Fe3+, Ce3+, Al3+, Pt3+, Ni3+, Ni2+, Ni+, Co2+, Cu2+, etc., were used as spin dopants. As in the previous paragraph, Table 8.9 contents the spin-Hamittonian parameters of metal centers in Ti02 (rutile - R, anatase - A, brookite - B), and the same data concerning other wide bandgap semiconductor oxides are collected in Table 8.10. [Pg.238]


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Semiconductor characterization

Semiconductor characterized

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