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SKPFM probe force microscopy

Scanning Kelvin Probe Force Microscopy (SKPFM)... [Pg.263]

SKPFM Scanning Kelvin probe force microscopy... [Pg.319]

Defects at the interface most likely play an important role in the delamination process. Unfortunately, the defects in self-assembled films are mostly nanoscopic and can be studied only with atomic force microscopy (AFM) and STM, which require very time-consuming preparation and limit the flexibility of the experiments. Other operation modes such as scanning Kelvin probe force microscopy (SKPFM) [73] will play an important role in future work [74]. [Pg.497]

Kelvin Probe Force Microscopy (KPFM or SKPFM) was derived from the development of the atomic force microscope (AFM) al-... [Pg.249]

See other pages where SKPFM probe force microscopy is mentioned: [Pg.52]    [Pg.638]    [Pg.282]   


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