Scanning electron microscopy with energy dispersive

Hill, A. D., A. H. Lehman, H. Arm, and M. L. Parr (2007), Using scanning electron microscopy with energy dispersive x-ray spectroscopy to analyze archaeological materials, J. Chem. Educ. 84(5), 810-813. 

In an article published in Analytical Chemistry in 2004, Keune and Boon [2004a] present the application of ToF-SIMS analysis to a paint cross-section. The sample used was from the panel painting The Descent from the Cross (Museo del Prado, Madrid) by the early Flemish painter Rogier van der Weyden (1399/1400 1464). Scanning electron microscopy with energy dispersive X-ray analysis (SEM-EDX) and infrared microscopy were also used to complete and confirm the results. 

Chong et al. [742] have described a multielement analysis of multicomponent metallic electrode deposits, based on scanning electron microscopy with energy dispersive X-ray fluorescence detection, followed by dissolution and ICP-MS detection. Application of the method is described for determination of trace elements in seawater, including the above elements. These elements are simultaneously electrodeposited onto a niobium-wire working electrode at -1.40 V relative to an Ag/AgCl reference electrode, and subjected to energy dispersive X-ray fluorescence spectroscopy analysis. Internal standardisation... 

Scanning electron microscopy with energy dispersive x-ray analysis... 

Another technique we used to observe these distributions is scanning electron microscopy with energy dispersive x-ray analysis (EDAX). Concentrations of Cyasorb UV 1084, [2-2 -thiobis(4-ter -octylphenolato)-n-butylamine nickel], a nickel-containing UV absorber, were point counted to obtain nickel concentrations along a spherulite diameter. Figure 3 shows results for 1 and 4 wt % additive. This shows a uniform melt concentration, a boundary peak, a lower concentration within the spherulite, and a central dip. The resolution and sensitivity with this technique are poorer than with the optical microscopy. With every method, thin film crystallized samples and microtomed sections of bulk samples gave similar results. 

Scanning electron microscopy with energy dispersive X-ray spectrometry has found extensive applications in the analysis of glass, paint, fibers, and especially in the identification of gunshot residues (where it is the method of choice). This technique offers high resolution, great depth of field, and qualitative and quantitative information on small samples. However, although this technique has much to offer, its use in crime detection is often overrated. 

Wagner, B., Nowak, A., Bulska, E., Kunicki-Goldfinger, X, Schalm, O., Janssens, K. (2008) Complementary analysis of historical glass by scanning electron microscopy with energy dispersive X-ray spectroscopy and laser ablation inductively coupled plasma. Microchimica Acta, 162(3-4), 415-424. 

Among the variety of micro-analytical techniques used, electron probe X-ray micro-analysis (EPXMA) and computer controlled scanning electron microscopy with energy-dispersive X-ray detection (CC-SEM/EDX) are most commonly used. Both can be used in fully automated mode, and in combination with cluster analysis and/or multivariate techniques. They are ideally suited for the analysis of representative numbers (300-1000... 

The role of silica-only systems on adhesion has been studied using model compounds with squalene [59]. It was shown that the mechanism for increased adhesion to brass-coated wire-to-rubber was not just a simple improvement of the physical properties of the rubber, but that silica moderated the thickness and composition of the interfacial layer by a chemical interaction. SEM-EDX (scanning electron microscopy with energy dispersive analysis of X-rays), XPS, AES and PIXE (proton induced X-ray emission spectroscopy) revealed that silica affected the relative concentrations of compounds present in the interfacial layer, promoting zinc oxide formation in particular. 

CAR can be observed microscopically on double-sided PWBs using back lighting (Rig. 12). Subsequent scanning electron microscopy with energy dispersive x-ray spectroscopy (SEM/EDS) analysis shows that it contains copper and chloride (Fig. 13). A CAR sample was extracted and transmission electron microscopy (TEM) analysis was used to obtain electron diffraction data. Analysis of these results identify CAR as atacamite, Cu2(OH)3Cl (Ref 24). The Pourbaix diagram (Ref 25) (Fig. 14) of the cop-... 

The surface morphology and composition of the coatings were examined by scanning electron microscopy with energy dispersive spectroscopy (SEM/EDS), using a JEOL JSM 5910LV microscope fitted with an INCA 300 spectrometer. 

RBS, Rutherford backscattering spectroscopy XPS, X-ray photoeiectron spectroscopy TOF-SIMS, time of fiight secondary ion mass spectrometry Vibrationai spectroscopies include Infrared techniques such as FTIR and Raman spectroscopy SEM/EDS, scanning electron microscopy with energy dispersive X-ray emission spectroscopy PIXE, particle-induced X-ray emission spectroscopy. 

Schmidt H, Riederer W, Krauss HL On surface compounds of transition metab. Part 40. Characterization of chromium-doped sihca catalyst systems of the Phifhps type by scanning electron microscopy with energy dispersive analyzing system (SEM/EDS), J Prakt Cfiem 338(7) 627-633, 1996. 

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