Scanning electron microscopy coupled with energy-dispersive

Scanning electron microscopy coupled with energy-dispersive X-ray analysis (SEM-EDX)... 

The activity of chemically active AF paints usually relies on the reactivity of organometallic compounds (e.g. TBT-, Zn-, Si, Cu- acrylates and Zn-resinates) and inorganic pigments (i.e. CU2O). In spite of this, scanning electron microscopy coupled with energy dispersive X-ray detectors (SEM-EDX) has not been used extensively to characterise such reactions. Bishop and Silva... 

In addition, scanning electron microscopy coupled with energy-dispersive energy analysis (SEM-EDX) has been implemented as a complementary analytical tool for various purposes (i) to estimate the mean particle size of the metallic particles and look at the eventual influence of the used precursors on these characteristics (ii) to investigate more deeply the composition and dispersion anomalies detected by XPS on certain catalysts (iii) to find experimental evidence for bismuth redeposition on the catalyst surface after use. 

In microanalysis, LA-ICP-MS takes a position as complement to scanning electron microscopy coupled with energy dispersive X-ray spectroscopy (SEM-EDX) with the advantages of lower limits of detection and the possibility to analyze volatile contaminants as it is a nonvacuum technique [96]. Microcontaminations or microscopic features can be analyzed qualitatively or, given the availability of suitable standards, also quantitatively (e.g., PbSn solder bumps with -100 pm diameters on a finished chip) [96]. Further use of spatial mapping is the study of Ga diffusion from a refill material deposited by focused ion beam (FIB) [96]. 

The Atomic emission spectrometry (ICP-AES) results on the solids confirm the chemical purity of Py, Cp, Qz, Cal and Dol samples. The Po sample contains calcium which, after conversion into calcite, gives approximately 10wt% of this mineral. Sid sample contains 10.3 wt% Mn and 1.86 wt% Mg, in agreement with measurements using a Scanning Electron Microscopy coupled to Energy Dispersive X-Ray Spectroscopy (SEM-EDS) analysis again this explains the difference between the measured and theoretical density of the Sid powder. 

Kamiya et al. [83] evaluated particulate contamination in 199 samples of admixed and un-admixed parenteral nutrition solution bags from 10 hospitals in Japan. Seven samples were used as controls since they had not been mixed with ampoules or vials (un-admixed samples). Size and number of particles were measured using a particle counter, and the identification of elements was carried out by scanning electron microscopy coupled to energy dispersion spectroscopy. The authors collected the residual volume of the samples (10-60 mL) after their usage. The results are presented in Table 40. 

A wide range of analytical techniques is necessary to provide an unambiguous identification of pigments in a sample. Elemental techniques are often used, such as scanning electron microscopy (SEM) with energy-dispersive spectroscopy (EDS), X-ray fluorescence (XRE) spectrometry, scanning electron microprobe analysis (EPMA), X-ray photoelectron spectroscopy (XPS), particle-induced X-ray emission (PDCE), neutron activation analysis (NAA), atomic absorption spectrometry (AAS), inductively coupled... 

Other analytical methods can also be applied for the detection of F in archaeological artefacts, especially when it is possible to take a sample or to perform microdestructive analysis. These are namely the electron microprobe with a wavelength-dispersive detector (WDX), secondary ion mass spectrometry (SIMS), X-ray fluorescence analysis under vacuum (XRF), transmission electron or scanning electron microscopy coupled with an energy-dispersive detector equipped with an ultrathin window (TEM/SEM-EDX). Fluorine can also be measured by means of classical potentiometry using an ion-selective electrode or ion chromatography. 

Transmission electron or scanning electron microscopy coupled with an energy-dispersive detector... 

The toxicity of the mineral is such that quantitative characterization of erionite is extremely important. Samples should be characterized by using one or more of the following techniques (1) powder X-ray diffraction, (2) electron probe microanalysis or inductively coupled plasma-mass spectroscopy, (3) scanning electron microscopy equipped with wavelength dispersive spectroscopy (WDS) and/or energy dispersive spectroscopy (EDS), (4) transmission electron microscopy equipped with WDS and/or EDS and selected area electron diffraction, and (5) similar or better analytical techniques. 

Such data are derived by correlating morphological analyses (on a per colloid basis), obtained by TEM, with information from the following techniques elemental composition analysis using scanning transmission electron microscopy coupled to energy dispersive spectroscopy (STEM-EDS) TEM-based... 

The samples were air-dried at room temperature, sieved to < 63 pm and analysed by x-ray diffraction (XRD) and scanning electron microscopy combined with an energy dispersive system (SEM-EDS). For chemical analysis, samples were submitted to an extraction with Aqua Regia and analysed by inductively coupled plasma-optical emission spectrometry (ICP/OES). Firing experiments were performed following the procedure described by Brindley Brown (1980). 

Although a number of secondary minerals have been predicted to form in weathered CCB materials, few have been positively identified by physical characterization methods. Secondary phases in CCB materials may be difficult or impossible to characterize due to their low abundance and small particle size. Conventional mineral identification methods such as X-ray diffraction (XRD) analysis fail to identify secondary phases that are less than 1-5% by weight of the CCB or are X-ray amorphous. Scanning electron microscopy (SEM) and transmission electron microscopy (TEM), coupled with energy dispersive spectroscopy (EDS), can often identify phases not seen by XRD. Additional analytical methods used to characterize trace secondary phases include infrared (IR) spectroscopy, electron microprobe (EMP) analysis, differential thermal analysis (DTA), and various synchrotron radiation techniques (e.g., micro-XRD, X-ray absorption near-eidge spectroscopy [XANES], X-ray absorption fine-structure [XAFSJ). 

The brazed Joints were mounted in epoxy, ground, polished, and examined using Field Emission Scanning Electron Microscopy (FESEM) (model Hitachi 4700) coupled with energy dispersive x-ray spectroscopy (EDS). Microhardness scans were made with a Knoop indenter across the joint interfaces on a Struers Duramin-A300 machine under a load of 200 g and loading time of 10 s. Multiple (4 to 6) hardness scans were made across each joint to check the reproducibility. 

All three catalysts were characterized ex situ by scanning electron microscopy (SEM) coupled with energy dispersive X-ray analysis (EDX) and X-ray diffraction... 

Scanning electron microscopy (SEM) (Figure 15-2-0) coupled with energy dispersive spectroscopy (EDS)... 

XAS requires synchrotron radiation and a relatively large amount of material but no vacuum condition. On the other hand, EELS can be performed directly using an electron spectrometer fitted to a scanning transmission electron microscope (STEM). Here, the main advantage is the high spatial resolution attainable. (The incident electron beam can be as. small as I nm in diameter.) EELS can also be coupled with conventional transmission electron microscope (TEM) facilities and particularly high-resolution transmission electron microscopy (HRTEM) and energy dispersive X-ray spectroscopy (EDS). 

This chapter summarizes results obtained during the past 5 years, on the design, preparation and study of titanium and vanadium compounds as candidate precursors to TiC, TiN, VC, and VN. The study of the precursor molecules was conducted through several steps. After their synthesis, thermoanalytical studies (TG-DTA), coupled to simultaneous mass spectroscopic (MS) analysis of the decomposition gases, were carried out to determine their suitability as precursors. CVD experiments were then conducted and were followed by characterization of the deposits by scanning electron microscopy (SEM) energy dispersive spectroscopy (EDS), X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and electron microprobe analysis with wavelength dispersion spectroscopy (EPMA-WDS). 

Additional techniques such as FT-IR microspectroscopy, IR and Raman spectroscopy, NMR, and energy dispersive x-ray, in conjunction with scanning electron microscopy, inductively coupled plasma, etc., may also be utilized to provide additional pieces of information toward the comprehensive analysis of materials and the identification of unknowns. Although HSM may not be a technique that all laboratories require, it is clear that the technique can provide valuable information for the visual confirmation of thermal transitions. 

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