Scanned lines

Figure 9.11 Thiophene adsorbed at 500 K on an H-atom pretreated MoS2 cluster (50 x 54 A2). Beam-like features at the metallic edge [scan line (i)] and the shifted intensity of the outermost edge protrusions relative to the clean edge (triangles refer to the clean edge). These shifts in intensity [line scan (ii)] are associated with changes in the local electronic structure after adsorption of thiophene observed with STM. All the images were taken at room temperature subsequent to thiophene adsorption at 500 K. (Reproduced from Ref. 34).

The scanning line was chosen to cross the interface region twice, and the concentration differences of the elements in the three regions were confirmed by Faiz et al. by PIXE measurements on fixed spots in these areas. 

Fig. 2.7 The topographic view of a photobleached waveguide using atomic force microscopy (a), and the height profile along three scan lines (b). Reprinted from Ref. 15 with permission. 2008 Institute of Electrical and Electronics Engineers...

The optoelectrical characteristics of 3-a-Si H TFTs AM-PLED have been measured using the same method as outlined above [30]. To light up the whole display, we continuously applied a DC signal (30 V) to all the scan lines and Fdata the signal was varied from 0 to 30 V for different gray scales. All the measurements have been performed in the air at RT [24]. 

Resolution is adjusted by variation of the a q ratio higher a q ratio means higher resolution, and is represented by a steeper scan line Rj > R2 > R3. 

Fig. 7 Topographic images, SFM scan lines, and schematic cross-sectional representation of glass slides with chromium patterns and the formation of the polymer and copolymer layer A cleaned sample, B sample modified with SBDC, C after photopolymerization of styrene for 5h, D after photopolymerization of styrene for 15 h, and E after photopolymerization of styrene for 15 h and subsequently methyl methacrylate for 10 h. (Reproduced with permission from [45] American Chemical Society)...

Fig. 13.9. In situ tip sharpening by electrical field, (a) Tunneling at -500 mV and 1 nA with no atomic resolution, (b) By suddenly raising the bias to -7.5 V for several scan lines, the tip end is elongated, (c) A tip with atomic resolution is formed. (Reproduced from Wintterlin et al., 1989, with permission.)...

With suitable scan-line delay circuits, the filter may be applied in real time to live video images. In data communications, bandwidth extrapolation offers the opportunity to make far better use of channel capacity than is now possible. The bounded methods produce their most impressive restorations when o(x) spends a lot of time at or near the bounds. The present method was designed for use with both upper and lower bounds, which makes it ideal for the bilevel signals used in digital transmission. 

Chemical and morphological information can be combined by scanning lines or areas of the sample with the appropriate detection system. Compositional mapping of the studied region of the sample is then obtained. 

The drawback is the measurement time, which depends on the number of pixels. Spectrometer manufacturers therefore developed line mapping, in which samples are scanned line by line, thereby reducing the acquisition time. These devices were developed for Raman, IR, or near-IR (NIR) spectroscopy (with diode array detectors). However, due to the moving stage, this kind of imaging principle is only suitable for at-line applications. 

Constant-peak-width profile scans can be achieved by adjusting the RF-to-dc ratio. In this case the points of intersection on the scan line will be at the same distance below the apices (Figure 13.5). To adjust the scan line, the amount of... 

Figure 13.4. Different scan lines in a quadrupole mass filter.

In an STM experiment the dendrimer sample deposited on a conductive substrate (e.g. highly ordered pyrolytic graphite (HOPG)) is scanned line-by-line with a fine conductive microscopy tip. Depending upon the measuring mode, a piezoelectric scanner moves either the microscopy tip over the sample surface or the sample under the fixed tip. The microscopy tip approaches the sample... 

If U and V are maintained at a fixed ratio a linear operating line, or scan line, may be plotted. This line has a fixed slope of ajq. Rearrangement of Eq. (8) gives... 

The concept of resolution can be clearly demonstrated using the same stability diagram as shown earlier with additional scan lines plotted (Fig. 9). 

Fig. 1. The principle of a scanning probe microscope. The sample surface is scanned line by line with a probe by using a fine positioning system (scanner). With a coarse positioning device, the distance between the sample and the probe is stepwise reduced until the interaction regime is reached and the fine positioning system rules the scanning of the surface. The vibration isolation shields the micrscope from external vibrations.

If the time consumption is acceptable and the image drift is negligible, a scan line can be scanned twice to separate topography and electrical properties. In this case, a first scan in contact or better in a dynamic mode without an electrical excitation is performed. The tip is lifted and for the following second scan the z-piezo is controlled in a way that the tip follows the same topography as for the first scan (constant tip-sample distance or interleave scan). During this second line scan, one of the above-mentioned measurements of electrical properties can be performed [396]. 

Fig. 24 A series of phase images showing the further growth of the PE shish- kebab structure. The gray scale represents a change in phase angle of 60°. The scan rate was 6.1 lines/sec. The scale bar refers to all the images and represents 300 nm. a Taken at 132 °C. b Taken at 131.5 °C the B indicates a pair of lamellae that have changed direction to avoid joining, c Taken at 131 °C the A indicates a pair of lamellae that have joined, d Taken at 130.5 °C the arrow indicates a point on the extended chain backbone where a new nucleation event has occurred, and the dotted lines show the distorting effect of drift, in which all the lamellae on a series of scan lines are deformed [84]...

In the holographic scanner a series of phase holograms is recorded in a photopolymer film on a glass cylinder (Fig. 7). When the cylinder is rotated, the holograms cause an input beam to scan in the same way as a multifaceted prism would. However, because of the cylindrical symmetry of the device, it does not distort, even at high rotation rates. In addition, the holograms serve as lenses to focus the beam. The output beam quality is sufficient to resolve 1917 spots per scanning line at a rate of 7.76 x 10 spots per second (11). 

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