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RHEED reflection high energy electron

RHEED Reflection high-energy electron diffraction [78, 106] Similar to HEED Surface structure, composition... [Pg.313]

RHEED Reflection high-energy electron diffraction... [Pg.4]

RHEED Reflection High-Energy Electron Diffraction... [Pg.352]

Fig. 1. Experimental techniques available for surface studies. SEM = Scanning electron microscopy (all modes) AES = Auger electron spectroscopy LEED = low energy electron diffraction RHEED = reflection high energy electron diffraction ESD = electron stimulated desorption X(U)PS = X-ray (UV) photoelectron spectroscopy ELS = electron loss spectroscopy RBS = Rutherford back scattering LEIS = low energy ion scattering SIMS = secondary ion mass spectrometry INS = ion neutralization spectroscopy. Fig. 1. Experimental techniques available for surface studies. SEM = Scanning electron microscopy (all modes) AES = Auger electron spectroscopy LEED = low energy electron diffraction RHEED = reflection high energy electron diffraction ESD = electron stimulated desorption X(U)PS = X-ray (UV) photoelectron spectroscopy ELS = electron loss spectroscopy RBS = Rutherford back scattering LEIS = low energy ion scattering SIMS = secondary ion mass spectrometry INS = ion neutralization spectroscopy.
RHEED reflection high-energy electron diffraction SEM... [Pg.90]

RHEED Reflection High Energy Electron Diffraction Surface Electron beam at grazing angle 6-60 keV Reflected electrons 0.2-10 nm <6 pm Surface symmetry 36,37... [Pg.1968]

UPS Ultraviolet Photoelectron Spectroscopy XPS X-ray Photoelectron Spectroscopy AES Auger Electron Spectroscopy ESCA Electron Spectroscopy for Chemical Analysis TDMS Thermal Desorption Mass Spectroscopy LEED Low-Energy Electron Diffraction RHEED Reflection High-Energy Electron Diffraction EELS Electron Energy Loss Spectroscopy... [Pg.259]

Braun, W. (1999) Applied RHEED Reflection High-Energy Electron Diffraction during Crystal Growth, vol. 154, Springer Tracts in Modem Physics, Springer. [Pg.168]

Fig. 2. Methods of surface analysis based on the examination of reflected radiation and/or particles. Abbreviations MIRS, multiple interference reflection spectroscopy LEED, low energy electron diffraction RHEED, reflected high energy electron diffraction ESCA, electron spectroscopy for chemical analysis (Ref. 7). Fig. 2. Methods of surface analysis based on the examination of reflected radiation and/or particles. Abbreviations MIRS, multiple interference reflection spectroscopy LEED, low energy electron diffraction RHEED, reflected high energy electron diffraction ESCA, electron spectroscopy for chemical analysis (Ref. 7).

See other pages where RHEED reflection high energy electron is mentioned: [Pg.269]    [Pg.93]    [Pg.695]    [Pg.214]    [Pg.6044]    [Pg.269]    [Pg.6043]   


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