Reflected ray

Aosfalleisen, n. off-grade iron, ausfallen, v.i. precipitate, deposit fall or come out result be omitted. — ausfallender Strahl, emergent ray reflected ray. aosfiillen, v.t. precipitate. 

Gegen-stoff, m. antisubstance, antibody antidote, -strahl, m. reflected ray, reflection. -Strom, m. countercurrent, inverse current, counterflow. -stromkiihler, m. countercurrent condenser or cooler, -stiick, n. counterpart, match. 

Figure 5 shows the laser beam path reflected by the torsional cantilever. The incident angle is y on the cantilever surface before the cantilever torsion. When the torsional angle of the cantilever is 6i, reflection ray turned an angle a. Their relationship can be expressed by... 

The incident angle is a constant for this equipment, y = 15°. The torsional angle i, and the rotated angle a of the reflection ray are both infinitesimals. The formula can be simpli-... 

Transverse moving head of four-quadrant position detectors (Fig. 2), precise measuring lateral displacement which corresponds to lateral voltage F/ when it varies at the linear range of 10 V, thus we can compute the rotated angle a of the reflection ray ... 

Here multiplier 2 in front of the first term of the argument is due to the fact that 2 s is the total length of the incident and reflected rays. It is obvious, that the frequency of the measured sinusoid is... 

Electrically modulated infrared spectroscopy, ( EMIRS). In all three external reflectance approaches the signal processing technique serves two purposes (a) to remove the contributions to the reflected ray that do not change, e.g. the detector response, the source emission envelope, the solvent,... 

Although such experiments could be carried out, in practice it is usually much more accurate to measure complete extinction rather than ratios of non-zero intensities. This is accomplished by using a compensator (a wave plate) to restore linear polarisation to the reflected ray by the introduction of a known phase difference between the S- and P-components. The restored... 

Whereas the XSW technique takes advantage of the standing wave established on the total reflection of X-rays from a mirror surface, a conceptually more straightforward approach is that of simply specularly reflecting an X-ray beam from an electrode coated with the film of interest, measuring the ratio of the intensities of the incident and reflected rays, and fitting the data, using the Fresnel equations, to a suitable model an approach similar to optical ellipsometry. 

Fig. 18.4, designates the optical path for the upper prism in Abbe Refractometer. When a ray of light passes from the liquid medium and enters the upper prism, it gets refracted by an angle 0 between the lower face of the prism and the normal, an angle P between the emerging refracted ray at the upper face and the normal, and finally an angle a between the reflected ray at the upper face and the normal. Thus, we have ... 

The colour interference contrast image is achieved via special experimental conditions, which comprise the angle of the incident light, wavelength of the light of the reflected ray, chemical composition, thickness and refractive index of a sample, and refractive index and chemical composition of a substrate. 

As the light reaches each slab, some is reflected due to the change in refractive index. For the right spacing of the slabs, the reflected rays from each slab are in phase with each other but out of phase with the incident light. For such wavelengths, the incident and reflected rays cancel each other. 

Externally reflected rays, directly transmitted rays, rays transmitted after undergoing one or more internal reflections, all can contribute to the light scattered into a unit solid angle about a particular direction. The incident rays are evenly spaced but after reflection and transmission they can be concentrated in particular directions, much like the concentration or focusing of rays by a lens. 

Fig. 4.4. Reflections from various interfaces in an acoustic microscope, (a) Paths travelled by the rays the broken line shows a ray that returns as a shear wave after mode conversion from a longitudinal wave (or vice versa), (b) The arrival time and magnitude of each reflected ray in (a) the broken lines show the earlier arrival times of reflections from the specimen surface when the specimen is defocused towards the...

The limits zmjn and zmax are the values of defocus at which the reflected rays just fill the area of the transducer thus for zmin < z < zmax all the reflected rays that enter the lens fall on the transducer, while for values of defocus outside that range some of the rays miss it altogether. The value z0 is the defocus at which the geometrically reflected rays are focused on the transducer at this point, as indeed at z = 0, ray optics breaks down because it does not allow for diffraction, although it does correctly predict the position of a minimum in V(z) at z0. The approximate expressions are valid when D/n > q, as is usually the case in a high-resolution acoustic microscope. In the approximation for z0, the quantity Ft is the ratio of the separation between the transducer and the back focal plane of the lens D — q/n) to the Fresnel distance for the transducer (na /Ao),... 

Since the directions of reflected rays are obtained by joining the centre of the sphere to points on its surface, the crystal itself may be regarded as rotating in the centre of the sphere of reflection, while the reciprocal lattice of this same crystal rotates about a different point—-the point where the beam emerges from the sphere. If this seems odd, it must be remembered that the reciprocal lattice is a geometrical fiction and should not be expected to behave other than oddly the fact is, the reciprocal lattice is concerned with directions its magnitude and the location of its origin are immaterial. 

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