Destructive analytical techniques

Of the many destructive analytical techniques, only the most widely used methods, especially tliose based on the personal experience of the author during the past 28 years will be discussed fully More background information on the various techniques for fluonne analysis can be found in the literature [I, 2, 3, 4, 5]. 

Martinez, I., Aursand, M., Erikson, U., Singstad, T.E., Veliyulin, E., and van der Zwaag, C. 2003. Destructive and non-destructive analytical techniques for authentication and composition analyses of foodstuffs. Trends Food Sci. Technol. 14,489 498. 

Brashear, R.L. Flanagan, D. Luner, P.E. Seyer, J.J. Kemper, M.S. Diffuse reflectance near-infrared spectroscopy as a non-destructive analytical technique for polymer implants. J. Pharm. Sci. 1999, 88 (12), 1348-1353. 

X-ray diffraction technique is a non-destructive analytical technique that reveals information about crystallographic structure, chemical composition and physical properties of nanostructured materials. UV/Vis spectroscopy is routinely used in the quantitative determination of films of nanostructured metal oxides. The size, shape (nanocomb and nanorods etc,) and arrangement of the nanoparticles can be observed through transmission electron microscope (TEM) studies. Surface morphology of nanostructured metal oxides can be observed in atomic force microscopy (AFM) and scanning electron microscopy (SEM) studies. 

Mass spectrometry of secondary ions (SIMS) [78, 79] or of post-ionized secondary neutral particles (SNMS) [80-82], which both are ejected from a surface which is bombarded with an ion beam, is a very sensitive but for chemical compounds also destructive analytical technique. It yields excellent qualitative information. Quantitative results are difficult to obtain. A review is given in [83]. 

Rill I. Martinez, M. Aursand, U. Erikson, T.E. Singstad, E. Veliyulin and C. Van der Zwaag, Destructive and Non-Destructive Analytical Techniques for Authentication and Composition Analyses of Foodstuffs , p.489... 

Secondary ion mass spectroscopy (SIMS) is a destructive analytical technique in which material is removed from a surface by ion beam sputtering and the resultant positive and negative ions are mass analysed in a mass spectrometer [63]. The technique is element specific and is capable of detecting all elanents as well as isotopes and molecular species. Of all the beam techruques it is the most sensitive with detection limits for some elements in the range 10 " to lO cm" if there is very little background interference signal. Lateral resolution is typically 100 pm but can be as small as 0.5 pm with a depth resolution of 5-lOmn [34]. 

Stage II - Nondestructive microscopic investigation and Stage III - Destructive analytical techniques. 

Design Control and Review, 172-3 destructive analytical techniques, 195-203... 

In contrast to NMR, which is a non-destructive analytical technique, MS requires ionization and in many cases also fragmentation of molecules in order to perform an... 

Traditionally, end product testing for solid dosage forms involved off-line destructive analytical techniques that measured various properties such as CXJ and RTS. Cogdill et presented a series of papers that demonstrated the... 

By measuring the energy of the characteristic X-rays emitted, the elemental composition of the sample can be determined. PIXE is also a non-destructive analytical technique which can be used to image the distribution of major, minor, and trace constituents in various samples. The method is sensitive to... 

Foca, G. et al. (2013) Classification of pig fat samples from different subcutaneous layers by means of fast and non-destructive analytical techniques. Food Res. Int, 52 (1), 185-197. 

Several methods of investigation were used, following a logical sequence of tests. In all forensic science investigations, the non-destructive techniques should always be performed prior to any destructive analytical techniques. Only the minimum amount of sample that will give meaningful results should be used. This is important for two reasons. First, it allows a second analysis to be performed whenever possible. Second, it allows the other side (defence or prosecution) to carry out their own investigation this principle of equal opportunity is very important in forensic science. It also important that the sample taken is representative of the item in question. 

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