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Poly resist design

Combining the lithographic and etch mask functions into a single polymer can be a major challenge, especially for deep-UV lithography. The latitude in resist design is limited, because at least 10 and preferably 15 wt % of the polymer structure must be reserved for silicon. A few materials, like silicon-substituted poly(methyl methacrylates) (6) and polysilanes (7, 8), have been used as positive two-layer resists for deep-UV lithography, but these materials suffer from either poor to moderate sensitivities to deep-UV radiation or an excessive absorption in the UV that limits exposure depth in the resist layer. [Pg.665]

A copolymer approach can provide more flexibility to the resist design because all the necessary functions do not have to reside on one component. Today s advanced positive deep UV resists are exclusively based on this concept with 4-hydroxystyrene as one component. However, early copolymer systems and some of the 193-nm resists consisted of lipophilic components only. Incorporation of 4-acetoxystyrene to poly(4- er -butoxycarbonyloxystyrene sulfone) has already been mentioned. This section deals with copolymer resists composed of lipophilic comonomers first and then the currently dominant hydroxystyrene copolymers. Co- and terpolymers for ArF excimer laser lithography will be described in a separate section. [Pg.70]

In the above condensation resist designs, the phenolic resin offers a reaction site as well as base solubility. Self-condensation of polymeric furan derivatives has been utilized as an alternative crosslinking mechanism for aqueous base development (Fig. 126) [375]. The copolymer resist is based on poly[4-hydroxy-styrene-co-4-(3-furyl-3-hydroxypropyl)styrene], which was prepared by radical copolymerization of the acetyl-protected furan monomer with BOCST followed by base hydrolysis. The furan methanol residue, highly reactive toward electrophiles due to a mesomeric electron release from oxygen that facilitates the attack on the ring carbons, readily yields a stable carbocation upon acid treatment. Thus, the pendant furfuryl groups serve as both the latent electrophile and the nucleophile. Model reactions indicated that the furfuryl carbocation reacts more preferentially with the furan nucleus than the phenolic functionality. [Pg.157]

The combination of stmctural strength and flotation has stimulated the design of pleasure boats using a foamed-in-place polyurethane between thin skins of high tensUe strength (231). Other ceUular polymers that have been used in considerable quantities for buoyancy appHcations are those produced from polyethylene, poly(vinyl chloride), and certain types of mbber. The susceptibUity of polystyrene foams to attack by certain petroleum products that are likely to come in contact with boats led to the development of foams from copolymers of styrene and acrylonitrUe which are resistant to these materials... [Pg.416]

EiaaHy, a new aluminum fire-resistant paneling consists of a composite design that iacludes a soHd thermoplastic compound core covered with a high density polyethylene adhesive film and an aluminum skin. The product is easily formable. It has sound deadening abiHties, and an optional poly(vinyHdene fluoride) resia coatiag provides damage resistance. [Pg.335]

Poly(phenylene sulfide) (PPS) is another semicrystalline polymer used in the composites industry. PPS-based composites are generally processed at 330°C and subsequently cooled rapidly in order to avoid excessive crystallisation and reduced toughness. The superior fire-retardant characteristics of PPS-based composites result in appHcations where fire resistance is an important design consideration. Laminated composites based on this material have shown poor resistance to transverse impact as a result of the poor adhesion of the fibers to the semicrystalline matrix. A PPS material more recently developed by Phillips Petroleum, AVTEL, has improved fiber—matrix interfacial properties, and promises, therefore, an enhanced resistance to transverse impact (see PoLYAffiRS containing sulfur). [Pg.8]

As previously mentioned, some urethanes can biodegrade easily by hydrolysis, while others are very resistant to hydrolysis. The purpose of this section is to provide some guidelines to aid the scientist in designing the desired hydrolytic stability of the urethane adhesive. For hydrolysis of a urethane to occur, water must diffuse into the bulk polymer, followed by hydrolysis of the weak link within the urethane adhesive. The two most common sites of attack are the urethane soft segment (polyol) and/or the urethane linkages. Urethanes made from PPG polyols, PTMEG, and poly(butadiene) polyols all have a backbone inherently resistant to hydrolysis. They are usually the first choice for adhesives that will be exposed to moisture. Polyester polyols and polycarbonates may be prone to hydrolytic attack, but this problem can be controlled to some degree by the proper choice of polyol. [Pg.806]

Cured phenolics are universally brittle in nature. This is true of both resoles and novolacs and does not depend much on the source of methylene used to promote cure. Consequently, the fillers used in molded articles are highly important to the design of the manufactured product. With resoles, the fiber or filler are usually the primary component of the final composite, with the resole acting as a binder or impregnating agent. With novolacs the resin may be the major component in the molded part. Poly-silanes and other organic polymers are also added in some applications to promote impact resistance and toughness [192]. [Pg.925]

While "conventional positive photoresists" are sensitive, high-resolution materials, they are essentially opaque to radiation below 300 nm. This has led researchers to examine alternate chemistry for deep-UV applications. Examples of deep-UV sensitive dissolution inhibitors include aliphatic diazoketones (61-64) and nitrobenzyl esters (65). Certain onium salts have also recently been shown to be effective inhibitors for phenolic resins (66). A novel e-beam sensitive dissolution inhibition resist was designed by Bowden, et al a (67) based on the use of a novolac resin with a poly(olefin sulfone) dissolution inhibitor. The aqueous, base-soluble novolac is rendered less soluble via addition of -10 wt % poly(2-methyl pentene-1 sulfone)(PMPS). Irradiation causes main chain scission of PMPS followed by depolymerization to volatile monomers (68). The dissolution inhibitor is thus effectively "vaporized", restoring solubility in aqueous base to the irradiated portions of the resist. Alternate resist systems based on this chemistry have also been reported (69,70). [Pg.11]


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See also in sourсe #XX -- [ Pg.14 , Pg.20 ]




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