NEXAFS Near Edge X-ray Absorption Fine

NEXAFS Near-Edge X-Ray Absorption Fine Structure... 

NEXAFS Near-edge X-ray absorption fine structure (see XANES)... 

Electrons ejected after the core ionization can be measured either selectively by their energy as Auger electrons or unselected as the so-called total electron yield. Due to the small free path that electrons have in condensed matter, these electrons stem from a thin layer of the surface of the sample. Under these conditions, XAS becomes a surface-sensitive probe [41] known as SEXAFS (Surface EXAFS) and NEXAFS (Near Edge X-ray Absorption Fine Structure with the same meaning as XANES,but applied exclusively to near-edge spectra detected using surface-sensitive measurements). These methods have become very important... 

Abbreviations AES, Auger emission spectrometry CRM, Certified reference material DL, Detection limit ED, Energy dispersive ESRF, European Synchrotron Radiation Facility EXAES, Extended X-ray absorption fine structure NEXAFS, Near edge X-ray absorption fine structure PCI, Phase contrast imaging RM, Reference material SR, Synchrotron radiation SRM, Standard reference material TXRF, Total reflection X-ray fluorescence XANES, X-ray absorption near edge structure XAS, X-ray absorption spectrometry XDM, X-ray diffraction microscopy XFCT, X-ray fluorescence computerized microtomography XPEEM, X-ray photoelectron microscopy XPS, X-ray photoelectron spectrometry XRD, X-ray diffraction XRF, X-ray fluorescence... 

---