NEXAFS

NEXAFS Near-edge EXAFS Variant of EXAFS Variant of EXAFS... 

XANES X-ray adsorption nearedge spectroscopy [178a] Same as NEXAFS Same as NEXAFS... 

The 02-graphite system has been studied by means of quite a few techniques LEED, RHEED, EELS, and NEXAFS (see Ref. 101). It was concluded,... 

Studies to determine the nature of intermediate species have been made on a variety of transition metals, and especially on Pt, with emphasis on the Pt(lll) surface. Techniques such as TPD (temperature-programmed desorption), SIMS, NEXAFS (see Table VIII-1) and RAIRS (reflection absorption infrared spectroscopy) have been used, as well as all kinds of isotopic labeling (see Refs. 286 and 289). On Pt(III) the surface is covered with C2H3, ethylidyne, tightly bound to a three-fold hollow site, see Fig. XVIII-25, and Ref. 290. A current mechanism is that of the figure, in which ethylidyne acts as a kind of surface catalyst, allowing surface H atoms to add to a second, perhaps physically adsorbed layer of ethylene this is, in effect, a kind of Eley-Rideal mechanism. 

From the above descriptions, it becomes apparent that one can include a wide variety of teclmiques under the label diffraction methods . Table Bl.21.1 lists many techniques used for surface stmctural detemiination, and specifies which can be considered diffraction methods due to their use of wave interference (table Bl.21.1 also explains many teclmique acronyms commonly used in surface science). The diffraction methods range from the classic case of XRD and the analogous case of FEED to much more subtle cases like XAFS (listed as both SEXAFS (surface extended XAFS) and NEXAFS (near-edge XAFS) in the table). 

As the table shows, a host of other teclmiques have contributed a dozen or fewer results each. It is seen that diffraction teclmiques have been very prominent in the field the major diffraction methods have been LEED, PD, SEXAFS, XSW, XRD, while others have contributed less, such as NEXAFS, RHEED, low-energy position diffraction (LEPD), high-resolution electron energy loss spectroscopy (HREELS), medium-energy electron diffraction (MEED), Auger electron diffraction (AED), SEELFS, TED and atom diffraction (AD). 

Figure Bl.22.10. Carbon K-edge near-edge x-ray absorption (NEXAFS) speetra as a fiinotion of photon ineidenee angle from a submonolayer of vinyl moieties adsorbed on Ni(lOO) (prepared by dosing 0.2 1 of ethylene on that surfaee at 180 K). Several eleetronie transitions are identified in these speetra, to both the pi (284 and 286 eV) and the sigma (>292 eV) imoeeupied levels of the moleeule. The relative variations in the intensities of those peaks with ineidenee angle ean be easily eonverted into adsorption geometry data the vinyl plane was found in this ease to be at a tilt angle of about 65° from the surfaee [71], Similar geometrieal detenninations using NEXAFS have been earried out for a number of simple adsorbate systems over the past few deeades.

Monolayers of alkanetliiols adsorbed on gold, prepared by immersing tire substrate into solution, have been characterized by a large number of different surface analytical teclmiques. The lateral order in such layers has been investigated using electron [1431, helium [144, 1451 and x-ray [146, 1471 diffraction, as well as witli scanning probe microscopies [122, 1481. Infonnation about tire orientation of tire alkyl chains has been obtained by ellipsometry [149], infrared (IR) spectroscopy [150, 151] and NEXAFS [152]. 

Similarly to LB films, the order of alkanetliiols on gold depending on temperature has been studied witli NEXAFS. It was observed tliat tire barrier for a gauche confonnation in a densely packed film is an order of magnitude higher tlian tliat of a free chain [48]. 

Near edge x-ray absorption fine stmcture spectroscopy (nexafs) and x-ray photoelectron spectroscopy (xps) have been used to study SAMs of OTS, octadecyltrimethoxysilane (OTMS), CH2(CH2) ySi(OCH2)3, and (17-aminoheptadecyl)-trimethoxysilane (AHTMS), H2N(CH2) ySi(OCH3)3 (149). A number of important observations have been reported. First, the chains in OTS SAMs are practicaUy perpendicular to the substrate surface (tilt angle... 

Nearly all of the important chemical (identification of elements, purity, homogeneity, speciation) and physical (roughness, thickness, serie of the layers) parameters of such a structure can be determned non-destructively by X-ray methods (e.g., EDXRS, WDXRS, TXRS, SYXRS, g-XRS, NEXAFS). 

Surface Extended X-Ray Absorption Fine Structure and Near Edge X-Ray Absorption Fine Structure (SEXAFS/NEXAFS)... 

EXAFS is part of the field of X-ray absorption spectroscopy (XAS), in which a number of acronyms abound. An X-ray absorption spectrum contains EXAFS data as well as the X-ray absorption near-edge structure, XANES (alternatively called the near-edge X-ray absorption fine structure, NEXAFS). The combination of XANES (NEXAFS) and EXAFS is commonly referred to as X-ray absorption fine structure, or XAFS. In applications of EXAFS to surface science, the acronym SEXAFS, for surface-EXAFS, is used. The principles and analysis of EXAFS and SEXAFS are the same. See the article following this one for a discussion of SEXAFS and NEXAFS. 

Structure of Surfaces and Interfaces as Studied Using Synchrotron Radiation. Faraday Discussions Chem. Soc. 89, 1990. A lively and recent account of studies in EXAFS, NEXAFS, SEXAFS, etc. 

There are several ways to make a SEXAF/NEXAFS measurement surface sensitive. 

The advantages of SEXAFS/NEXAFS can be negated by the inconvenience of having to travel to synchrotron radiation centers to perform the experiments. This has led to attempts to exploit EXAFS-Iike phenomena in laboratory-based techniques, especially using electron beams. Despite doubts over the theory there appears to be good experimental evidence that electron energy loss fine structure (EELFS) yields structural information in an identical manner to EXAFS. However, few EELFS experiments have been performed, and the technique appears to be more raxing than SEXAFS. 

Rgure 5 NEXAFS spectra above the C K-edge for a saturation coverage of pyridine C5H5N on Pt(111), measured at two different polarisation angles with the X-ray beam at normal incidence and at 20° to the sample surface. 

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