Neutron optics

Figure 1. Schematic layout of the NIST BT-2 neutron imaging facility, including the main neutron optic components as well as the location of the fuel cell test and control infrastructure.

Sears, V.E. (1989) Neutron Optics, Oxford University Press, Oxford. 

As a beam of neutrons, like x-rays and beams of electrons or other elementary particles, has wave properties, neutron scattering and diffraction are known to be the important techniques for research into crystal structure and condensed matter dynamics. For details of application of neutron optics to materials science and in biophysical/biological research, one can see, e.g., the handbook by Utsuro and Ignatovich (2010). Here we only shortly describe the interaction between matter and neutron beam, according to Stock (2009). 

Utsuro, M. and V. K. Ignatovich. 2010. Handbook of Neutron Optics. Berlin, Germany Wiley-VCH. 

After leaving the moderator, neutrons have to be guided to the sample and then, to the detector. During this process, the state of the neutron, or the shape/size of the beam may have to be changed. Pieces of instrumentation that serve these purposes may be called (neutron) optical devices. 

Anker, J. F. Majkrzak, C. J. Neutron Optical Devices and Applications, SPIE Proceedinp, SPIE, Bellingham, WA 1992 Vol. 1738, pp260. 

Alefeld, B. Schwahn, D. Springer, T. Nucl. Instrum. Methods Phys. Res. A1989, 274, 210-216 Sears, V. F. Neutron Optics, Oxford University Press New York, Oxford, 1989. 

The polymer concentration profile has been measured by small-angle neutron scattering from polymers adsorbed onto colloidal particles [70,71] or porous media [72] and from flat surfaces with neutron reflectivity [73] and optical reflectometry [74]. The fraction of segments bound to the solid surface is nicely revealed in NMR studies [75], infrared spectroscopy [76], and electron spin resonance [77]. An example of the concentration profile obtained by inverting neutron scattering measurements appears in Fig. XI-7, showing a typical surface volume fraction of 0.25 and layer thickness of 10-15 nm. The profile decays rapidly and monotonically but does not exhibit power-law scaling [70]. 

The specific surface area of a solid is one of the first things that must be determined if any detailed physical chemical interpretation of its behavior as an adsorbent is to be possible. Such a determination can be made through adsorption studies themselves, and this aspect is taken up in the next chapter there are a number of other methods, however, that are summarized in the following material. Space does not permit a full discussion, and, in particular, the methods that really amount to a particle or pore size determination, such as optical and electron microscopy, x-ray or neutron diffraction, and permeability studies are largely omitted. 

Diffraction is based on wave interference, whether the wave is an electromagnetic wave (optical, x-ray, etc), or a quantum mechanical wave associated with a particle (electron, neutron, atom, etc), or any other kind of wave. To obtain infonnation about atomic positions, one exploits the interference between different scattering trajectories among atoms in a solid or at a surface, since this interference is very sensitive to differences in patii lengths and hence to relative atomic positions (see chapter B1.9). 

Analyses of alloys or ores for hafnium by plasma emission atomic absorption spectroscopy, optical emission spectroscopy (qv), mass spectrometry (qv), x-ray spectroscopy (see X-ray technology), and neutron activation are possible without prior separation of hafnium (19). Alternatively, the combined hafnium and zirconium content can be separated from the sample by fusing the sample with sodium hydroxide, separating silica if present, and precipitating with mandelic acid from a dilute hydrochloric acid solution (20). The precipitate is ignited to oxide which is analy2ed by x-ray or emission spectroscopy to determine the relative proportion of each oxide. 

Numerous methods have been pubUshed for the determination of trace amounts of tellurium (33—42). Instmmental analytical methods (qv) used to determine trace amounts of tellurium include atomic absorption spectrometry, flame, graphite furnace, and hydride generation inductively coupled argon plasma optical emission spectrometry inductively coupled plasma mass spectrometry neutron activation analysis and spectrophotometry (see Mass spectrometry Spectroscopy, optical). Other instmmental methods include polarography, potentiometry, emission spectroscopy, x-ray diffraction, and x-ray fluorescence. 

Ca.rhora.nes, These are used in neutron capture therapy (254), and as bum rate modifiers in gun and rocket propellants. They are used as high temperature elastomers and other unique materials, high temperature gas—Hquid chromatography stationary phases, optical switching devises (256), and gasoline additives (257). 

Radiation Effects. Alpha sihcon carbide exhibits a small degree of anisotropy in radiation-induced expansions along the optical axis and perpendicular to it (58). When diodes of sihcon carbide were compared with sihcon diodes in exposure to kradiation with fast neutrons (59), an increase in forward resistance was noted only at a flux about 10 times that at which the increase occurs in a sihcon diode. In general, it appears that sihcon carbide, having the more tightly bound lattice, is less damaged by radiation than sihcon. 

At T < tunneling occurs not only in irreversible chemical reactions, but also in spectroscopic splittings. Tunneling eliminates degeneracy and gives rise to tunneling multiplets, which can be detected with various spectroscopic techniques, from inelastic neutron scattering to optical and microwave spectroscopy. The most illustrative examples of this sort are the inversion of the... 

In neutron reflectivity, neutrons strike the surface of a specimen at small angles and the percentage of neutrons reflected at the corresponding angle are measured. The an jular dependence of the reflectivity is related to the variation in concentration of a labeled component as a function of distance from the surface. Typically the component of interest is labeled with deuterium to provide mass contrast against hydrogen. Use of polarized neutrons permits the determination of the variation in the magnetic moment as a function of depth. In all cases the optical transform of the concentration profiles is obtained experimentally. 

Though a powerfiil technique, Neutron Reflectivity has a number of drawbacks. Two are experimental the necessity to go to a neutron source and, because of the extreme grazing angles, a requirement that the sample be optically flat over at least a 5-cm diameter. Two drawbacks are concerned with data interpretation the reflec-tivity-versus-angle data does not directly give a a depth profile this must be obtained by calculation for an assumed model where layer thickness and interface width are parameters (cf., XRF and VASE determination of film thicknesses. Chapters 6 and 7). The second problem is that roughness at an interface produces the same effect on specular reflection as true interdiffiision. 

The single most severe drawback to reflectivity techniques in general is that the concentration profile in a specimen is not measured directly. Reflectivity is the optical transform of the concentration profile in the specimen. Since the reflectivity measured is an intensity of reflected neutrons, phase information is lost and one encounters the e-old inverse problem. However, the use of reflectivity with other techniques that place constraints on the concentration profiles circumvents this problem. 

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