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Microscope fluorescence spectrometer

The Fe-B nanocomposite was synthesized by the so-called pillaring technique using layered bentonite clay as the starting material. The detailed procedures were described in our previous study [4]. X-ray diffraction (XRD) analysis revealed that the Fe-B nanocomposite mainly consists of Fc203 (hematite) and Si02 (quartz). The bulk Fe concentration of the Fe-B nanocomposite measured by a JOEL X-ray Reflective Fluorescence spectrometer (Model JSX 3201Z) is 31.8%. The Fe surface atomic concentration of Fe-B nanocomposite determined by an X-ray photoelectron spectrometer (Model PHI5600) is 12.25 (at%). The BET specific surface area is 280 m /g. The particle size determined by a transmission electron microscope (JOEL 2010) is from 20 to 200 nm. [Pg.389]

Fig. 5. Effect of WH on [Ca +], in Ang II-, CaCU or Bay K8644-stimulated VSMC. Ang II (10 UM)-induced [Ca " ]/ elevation (a) in Fura-2/AM-loaded VSMC was measured in the absence (Control) or presence of WH (300 juM). One pM PD 123177 as an AT2-receptor antagonist was added 10 min before Ang II addition. CaCf (2.5 mM) was added to VSMC treated with 2-APB (200 /xM IP3-R blocker)-containing Ca free PSS buffer (b). Effect of WH on [Ca ]/ in Bay K8644-stimulated VSMC was measured using a con-focal microscope and a fluorescent spectrometer (c). Bay K8644 (50 /xM)-induced [Ca ]/ elevation in VSMC was measured in the absence (Control) or presence of WH (300 /xM). Fig. 5. Effect of WH on [Ca +], in Ang II-, CaCU or Bay K8644-stimulated VSMC. Ang II (10 UM)-induced [Ca " ]/ elevation (a) in Fura-2/AM-loaded VSMC was measured in the absence (Control) or presence of WH (300 juM). One pM PD 123177 as an AT2-receptor antagonist was added 10 min before Ang II addition. CaCf (2.5 mM) was added to VSMC treated with 2-APB (200 /xM IP3-R blocker)-containing Ca free PSS buffer (b). Effect of WH on [Ca ]/ in Bay K8644-stimulated VSMC was measured using a con-focal microscope and a fluorescent spectrometer (c). Bay K8644 (50 /xM)-induced [Ca ]/ elevation in VSMC was measured in the absence (Control) or presence of WH (300 /xM).
In our experiment, the compression strength of supports was tested by an intellect strength tester (Model ZQJ, China). Specific areas, pore volume and average pore diameters were measured by a static physical absorber (Model ASAP-2000, America). The surface of catalyst was observed under an electron microscope (Model JEM-1200EX). The crystal structure was detected by an X-ray fluorescence spectrometer (Model 3015, Japan). The content of Ru was detected by a plasma spectrum instrument (Model ICPS-IOOOII). [Pg.266]

Spectroscopic techniques based on the optical microscope are being used with increasing success in photophysics. Microscopic fluorescence decay measurements have been made on both thin liquid films and droplets of concentrated dye solutions.Illustrative data are given for rhodamine B in 20 pm films. A luminescence lifetime microscope spectrometer based on time-correlated single photon counting with an avalanche diode detector has measured... [Pg.8]

Side-window PMTs are rugged and inexpensive, and they often have a somewhat higher cathode efficiency than front window PMTs. Their broad TTS and long SER pulses make them less useful for TCSPC applications. However, side-window PMTs are used in many fluorescence spectrometers, in femtosecond correlators, and in laser scanning microscopes. If instruments like these have to be upgraded with TCSPC, it can be difficult to replace the detector. Therefore, some typical instrument response functions for side-window PMTs are given below. [Pg.256]

The optofluidic devices can be very effective in microscopic analysis just as typical optical equipment such as UV, IR, Raman, visible light spectrometers, or fluorescence spectrometers are used to analyze molecular information. [Pg.2402]

The following apparatus was used for the measurements X-ray fluorescence spectrometer VRA-30 (GDR) for XSFS, Universal Roentgen-Diffractometer HZG-4 (GDR) for XRD, and BS 300 scanning microscope (Czechoslovakia) for SEM. [Pg.489]

FIGURE 2.1 A diagram of a multi-photon microscope. For AF, SFIG and exogenous probe fluorescence only one laser is used. The fluorescence or SHG signal passes through a dichroic mirror to the detector(s). One or two detectors and the appropriate filters can be used to collect multiple emission signals simultaneously. A spectrometer can be placed in the detector path to collect spectra, or a polarizer can be used to collect polarization data. [Pg.34]

Of the five probes evaluated only Probes 1, 3, and 5 were worth evaluating in detail, as the others had small Stokes shift (excitation wavelength, /v, minus emission wavelength, /Vln) or no detectable emission. Fluorescence behavior was measured using a Zeiss LSM 510 Laser Scanning Confocal Microscope (LSCM) and an Ocean Optics USB2000 spectrometer. [Pg.445]

Figure 5. (A) Scheme of two-photon laser scanning microscope (1) Ti Sa laser, 100 fs, 80 MHz, 750-980 nm, 1.6W 800 nm (TSUNAMI, Spectra Physics), (2) pre-chirp, (3) beam multiplexer, (4) scanning mirrors, (5) microscope (Olympus IX 71, XLUMPLFL20XW, WD = 2 mm, NA = 0.95), (6) fluorescent foci in sample, (7) filter wheel/spectrograph (SpectraPro 2300i, Acton Research Corporation)/spectrometer (home built), (8) back illuminated EMCCD camera (IXON BV887ECS-UVB, Andor Technology), (9) dichroic mirror (2P-Beamsplitter 680 DCSPXR, Chroma). (B) Experimental setup of two-photon laser scanning microscope. Figure 5. (A) Scheme of two-photon laser scanning microscope (1) Ti Sa laser, 100 fs, 80 MHz, 750-980 nm, 1.6W 800 nm (TSUNAMI, Spectra Physics), (2) pre-chirp, (3) beam multiplexer, (4) scanning mirrors, (5) microscope (Olympus IX 71, XLUMPLFL20XW, WD = 2 mm, NA = 0.95), (6) fluorescent foci in sample, (7) filter wheel/spectrograph (SpectraPro 2300i, Acton Research Corporation)/spectrometer (home built), (8) back illuminated EMCCD camera (IXON BV887ECS-UVB, Andor Technology), (9) dichroic mirror (2P-Beamsplitter 680 DCSPXR, Chroma). (B) Experimental setup of two-photon laser scanning microscope.
Chemical analysis a sodium thiosulfate volumetric method for Cu, x-ray fluorescence for Zn, carbon and sulfur analysis (LECO CS-344) and a benzidine hydrochloride precipitation method for S04 X-ray diffraction for the measurement of Cu crystallite size and bulk component analysis scanning electron microscope (Phillip SEM-5Q5) XPS spectrometer (KRATOS XSAM 800). [Pg.494]


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See also in sourсe #XX -- [ Pg.715 ]




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