Maxwell stress microscopy

The detection and compensation of the a.c. current is the classical Kelvin method however, the resulting electrostatic forces, i.e. the corresponding cantilever bending, can also be used to establish a potential sensitive feedback. If an a.c. voltage is applied between the tip and the back electrode of the sample instead of using the dither piezo, the Maxwell stress microscopy (MSM) [379-381] or the electrostatic force microscopy (EFM) [317, 382-393] can be performed. [Pg.172]

Alternate Multilayered Systems for Scanning Maxwell Stress Microscopy As already described, the LB technique is suitable for making highly oriented molecular assemblies. But detailed structures of LB films had not been clarified until these films were studied by scanning probe microscopies (SPMs) [95-101]. The SPMs, such as scanning tunneling microscopy (STM)... [Pg.6380]

Keywords Phenol-formaldehyde resin Monolayer LB film Condensation Brewster angle microscopy scanning Maxwell-stress microscopy... [Pg.265]

Electric force microscopy (EFM) or Scanning maxwell stress microscopy (SMM)... [Pg.595]

Many-pass techniques Electric Force Microscopy (EFM) Scanning Capacitance Microscopy (SCaM) Kelvin Probe Microscopy (SKM) DC Magnetic Force Microscopy (DC MFM) AC Magnetic Force Microscopy (AC MFM) Dissipation Force Microscopy-Scanning Surface Potential Microscopy (SSPM) Scanning Maxwell Stress Microscpy (SMMM) Magnetic Force Microscopy (MFM) Van der Waals Force Microscopy (VDWFM)... [Pg.358]