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Scanning Maxwell-stress microscopy

Alternate Multilayered Systems for Scanning Maxwell Stress Microscopy As already described, the LB technique is suitable for making highly oriented molecular assemblies. But detailed structures of LB films had not been clarified until these films were studied by scanning probe microscopies (SPMs) [95-101]. The SPMs, such as scanning tunneling microscopy (STM)... [Pg.6380]

Keywords Phenol-formaldehyde resin Monolayer LB film Condensation Brewster angle microscopy scanning Maxwell-stress microscopy... [Pg.265]

Electric force microscopy (EFM) or Scanning maxwell stress microscopy (SMM)... [Pg.595]

Many-pass techniques Electric Force Microscopy (EFM) Scanning Capacitance Microscopy (SCaM) Kelvin Probe Microscopy (SKM) DC Magnetic Force Microscopy (DC MFM) AC Magnetic Force Microscopy (AC MFM) Dissipation Force Microscopy-Scanning Surface Potential Microscopy (SSPM) Scanning Maxwell Stress Microscpy (SMMM) Magnetic Force Microscopy (MFM) Van der Waals Force Microscopy (VDWFM)... [Pg.358]

See other pages where Scanning Maxwell-stress microscopy is mentioned: [Pg.595] [Pg.6381] [Pg.265] [Pg.265] [Pg.266] [Pg.267] [Pg.267] [Pg.268] [Pg.268] [Pg.273] [Pg.595] [Pg.6381] [Pg.265] [Pg.265] [Pg.266] [Pg.267] [Pg.267] [Pg.268] [Pg.268] [Pg.273]

See also in sourсe #XX -- [ Pg.265 , Pg.269 ]

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Maxwell stress

Maxwell stress microscopy