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INDEX pressure dependence

Here functions Qnt X), Qj(X), and QP(X) can be determined experimentally using calibration samples. If these functions are linear independent then the parameters Ank, A, and Ap can be uniquely determined from the variation of P /1, , n2,. .. /( . /. / considered as a function of X. In particular, the side effects, i.e., the temperature and pressure dependences, can be eliminated from the transmission spectrum. The sensing method based on this simple idea was applied in Ref. 69 for determination of microfluidic refractive index changes in two microcapillaries coupled to a single MNF illustrated in Fig. 13.26c. The developed approach allowed to compensate the side temperature and pressure variation effects. [Pg.372]

Garcia et al. plotted Ap2/Ap as a function of for various values of pressure dependence b. They used a power law index n = 0.3 and two typical low and high injection pressures of 40 MPa (400 bar) and 100 MPa (1000 bar), respectively. Figure 4.17 presents a plot of the pressure increase as a function of the down-scaled thickness, (R. As expected, the pressure increases with a decrease in thickness and with an increase in the pressure dependence coefficient, b. The process that already begins with a high pressure requirement of 1000 bars,... [Pg.203]

It is obvious that the intensity of the radiant intensity of MTV flares increases with the mass flow (kg s-1, larger flares) and the burning rate. Current research is amongst other problems concerned with finding additives (e.g. 10 % Zr powder), which raise the burning rate by a factor of up to 1.5. The largest influence on the burning rate r is the pressure p (see Ch. 1.3), while the coefficient [i describes the influence of the temperature = 1(7 )) on the linear bum rate and the index a, the pressure dependence ... [Pg.86]

Where / is the temperature dependent coefficient (fi = f(T)) and a is the index of the burning rate, which describes the pressure dependence. For deflagrations a < 1, however, this value increases to a > 1 for detonations. The DDT transition can occur when an explosive is ignited in a confined tube, where the gases formed cannot fully escape. This results in a sharp increase of the pressure and reaction velocity. Therefore, in a detonating explosive, the reaction velocity can increase above the speed of sound, turning the deflagration into a detonation. [Pg.99]

Figure 14 shows that the heat loss by radiation becomes insignificant (the oxygen index becomes independent of pressure) at P > 0.3 atm for PMMA, and at P > 2 atm and P > 6 atm for poly(vinyl chloride) and Teflon, respectively. A weak pressure dependence of Y (1/P° ) accounts for extinction of the flame by convective... [Pg.202]

Because of the oscillation of electrons rather than linear motion, the influence of magnetic field imposed by the magnetrons also diminishes. Thus, the predominant role of the cathode observed in DC and AC discharge diminishes in 13.5-MHz discharge. The deposition rate characteristics (on electrode surface), i.e., the system pressure dependence and the refractive index of the deposit, are completely different from those for DC or 40-kHz discharge [1]. [Pg.45]

Figure 8.9 The system pressure dependence of deposition rate and refractive index of TMS in DC LCVD 1 seem TMS, 5W power input. Figure 8.9 The system pressure dependence of deposition rate and refractive index of TMS in DC LCVD 1 seem TMS, 5W power input.
The system pressure dependence of the deposition rate onto the electrode surface in DC, 40-kHz, and 13.56-MHz discharges are shown in Figure 8.8. In order to see the influence of electrical contact, some silicon wafers were electrically insulated from the substrate plate used as the cathode by placing a thin slide cover glass between the silicon wafer and the substrate. The influence of the electrical contact on deposition rate onto the electrode and onto the floating substrate is shown in Figures 8.8-8.10 as a function of system pressure. In the lower part of the figures, the influence of the same factors on the refractive index is shown. The scale of the deposition rate axis is different for each case in order to show the system pressure dependence clearly in each case. [Pg.264]

In equations 3-S, a is the anion-cation close-approach distant, B and C are the Dd ye-Huckel parameters at 0.1 MPa, n is the refractive index of the solvent, and the other symbols have the usual SI meanings. Thus, theory predicts that AF can be equated approximately with AF r Since the pressure dependences of both n and D are closely linked to that of the density p of the solvent, i.e., to P, it follows that A is determined in large part by the compressibility of the solvent. Sample calculations for model 3+/2+ couples are given in Table 1. [Pg.239]

The index 0 indicates properties of the evacuated aerogel, k is an effective adiabatic exponent for the system gas-skeleton. For most aerogels it is very close to unity. Only at extremely low aerogel densities does it become both larger and pressure dependent [65]. In Fig. 6, the variation in Ci with gas pressure is depicted for air and SFe for p = 5 kg/m3 aerogel. [Pg.324]

Connell and Paul (1971) studied shifts of the absorption edges and indices of refraction of a-Ge, Si and several III—V compounds by hydrostatic pressure. (Table 4.2) They observed no hysteresis on pressure release. The pressure coefficients are very different from those observed in the corresponding crystals indicating a profound change of the wavefunctions. The pressure dependence of the index of refraction is similar in amorphous and crystalline films. Kastner (1972) studied pressure dependence of n for several chalcogenide glasses. [Pg.214]

Jones SC, Robinson MC, Gupta YM (2003) Ordinary refractive index of sapphire in unitixial tension and compression along the c axis. J Appl Phys 93 1023-1031 Balzaretti NM, da Jornada JAH (1996) Pressure dependence of the refractive index of diamond, cubic silicon carbide and cubic boron nitride. Solid State Commun 99 943-948 Balzaretti NM, da Jornada JAH (1996) Pressure dependence of the refractive index and electronic polarizability of LiF, MgF2 and CaF2. J Phys Chem Solids 57 179-182... [Pg.527]

The optimum depth depends on the diameter, screw speed, power law index, consistency index, pressure gradient, and helix angle. The optimum helix angle for output can be determined from ... [Pg.520]

Uchino, K., Nomura, S., Vedam, K., etal. (1984) Pressure dependence of the refractive index and dielectric constant in a fluoroperovskite, KMgF3, Phys Rev., B29, 6921-5. [Pg.333]

Thus it appears that at long times, flow in the squeezing indexer is dominated by simple, steady shear, and it can be used to collect true viscosity shear rate data. Further analyses may even allow better interpretation of the transient regime. The influence of bulk modulus and pressure dependence of viscosity may be important in fast squeezing. [Pg.274]


See other pages where INDEX pressure dependence is mentioned: [Pg.721]    [Pg.290]    [Pg.169]    [Pg.169]    [Pg.272]    [Pg.171]    [Pg.146]    [Pg.36]    [Pg.269]    [Pg.161]    [Pg.264]    [Pg.255]    [Pg.300]    [Pg.202]    [Pg.168]    [Pg.89]    [Pg.470]    [Pg.695]    [Pg.305]    [Pg.670]    [Pg.358]    [Pg.279]    [Pg.26]    [Pg.69]    [Pg.2495]    [Pg.28]    [Pg.58]    [Pg.541]    [Pg.14]    [Pg.431]   
See also in sourсe #XX -- [ Pg.49 , Pg.237 , Pg.240 , Pg.241 ]




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