Imaging scanning probe microscopy

The development of scanning probe microscopies and x-ray reflectivity (see Chapter VIII) has allowed molecular-level characterization of the structure of the electrode surface after electrochemical reactions [145]. In particular, the important role of adsorbates in determining the state of an electrode surface is illustrated by scanning tunneling microscopic (STM) images of gold (III) surfaces in the presence and absence of chloride ions [153]. Electrodeposition of one metal on another can also be measured via x-ray diffraction [154]. 

The ability to control the position of a fine tip in order to scan surfaces with subatomic resolution has brought scanning probe microscopies to the forefront in surface imaging techniques. We discuss the two primary techniques, scanning tunneling microscopy (STM) and atomic force microscopy (AFM) the interested reader is referred to comprehensive reviews [9, 17, 18]. 

Schleef D ef a/1997 Radial-histogram transform of scanning probe microscopy images Phys. Rev. B 55 2535... 

New types of scanning probe microscopies are continually being developed. These tools will continue to be important for imaging of surfaces at atomic-scale resolution. 

Since the introduction of scanning tunnelling microscopy, a family of scanning probe microscopies (SPMs) have been developed (Table 3.1), with three main branches resulting from three different types of probe. All of the methods have in common the ability to image surfaces in real space at nanometre or better resolution, are straightforward to implement and are relatively low in cost. 

The present version of the book represents a completely revised update of the first edition as it appeared in 1993. Significant new developments in e.g. the scanning probe microscopies, imaging and vibrational techniques called for revision and additions to the respective chapters. But also the other chapters have been updated with recent examples, and references to relevant new literature. Many figures from the first version of the book have been improved to make them more informative. The chapter with case studies has been expanded with an example on polymerization catalysts. 

See also SEM/EDS detectors used in, 24 78 development of, 16 487-488 electron sources used in, 24 77-78 in surface imaging, 24 75-76 silica, 22 371-372 for trace evidence, 12 100 Scanning probe microscopies, in surface and interface analysis, 24 80-84 Scanning probe microscopy (SPM), 16 466, 495-503... 

Among the many microscopy-based techniques for the study of biomolecular interactions on surfaces, scanning probe microscopies, and especially the atomic force microscopies (AFM), are the most used because of their molecular and sub-molecular level resolution and in situ imaging capability. Apart from the high resolution mapping of siuface nanotopographies, AFM can be used for the quantification and visualisation of the distribution of chemistry, hydrophobicity and local mechanical properties on surfaces, and for the fabrication of nanostructmes on surfaces. 

STM was the first of a class of techniqnes known as scanning probe microscopy. Atomic force microscopy (AFM), invented later in the 1980s, is currently the most widely used of these techniques. Both STM and AFM depend on probes with atomically sharp tips these probes are manenvred over the snrface of the sample to be imaged, maintaining atom-scale distances between the probe and sample. Both techniques are capable of picking np atoms individnally and placing them precisely on surfaces (7). 

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