Atomic force microscopy films

Field emission scanning electron microscopy (FESEM), glancing incidence x-ray diffraction (GIXRD), transmission electron microscopy (TEM), micro Raman scattering, Fourier transform inftaied (FTIR) spectrometry, Rutherford back scattering (RBS) studies and electron probe micro analysis (EPMA) have been carried out to obtain micro-structural and compositional properties of the diamond/p-SiC nanocomposite films. Atomic force microscopy (AFM) and indentation studies have been carried out to obtain film properties on the tribological and mechanical front. 

Schryver, F.C. Multilayered clay films Atomic force microscopy study and modeling. Langmuir 1999, 15, 7520-7529. 

Fig. 5.15 Schematical illustration of photoisomerization of molecular motor, a Molecular structure of chiral motor 21. b Polygonal texture of a LC film doped with 1 wt% chiral motor 21. c Glass rod rotating on the LC during irradiation with ultraviolet light. Frames 1-4 (from l ) were taken at 15 s intervals and show clockwise rotations of 28° (Irame 2), 141° (frame 3) and 226° (Same 4) of the rod relative to the position in fiame 1. Scale bars, 50 pm. d Surface structure of the liquid-crystal film (atomic force microscopy image 15 pm ). Reproduced with permission from [103]. Copyright 2006 Nature Publishing Group...

Mate C M, Lorenz M R and Novotny V J 1989 Atomic force microscopy of polymeric liquid films J. Chem. Phys. 90... 

Roark S E and Rowlen K L 1993 Atomic force microscopy of thin Ag films. Relationship between morphology and optical properties Chem. Phys. Lett. 212 50... 

Bourdieu L, Ronsin O and Chatenay D 1993 Molecular positional order in Langmuir-Blodgett films by atomic force microscopy Science 259 798... 

The very new techniques of scanning tunnelling microscopy (STM) and atomic force microscopy (AFM) have yet to establish themselves in the field of corrosion science. These techniques are capable of revealing surface structure to atomic resolution, and are totally undamaging to the surface. They can be used in principle in any environment in situ, even under polarization within an electrolyte. Their application to date has been chiefly to clean metal surfaces and surfaces carrying single monolayers of adsorbed material, rendering examination of the adsorption of inhibitors possible. They will indubitably find use in passive film analysis. 

In this section, the thin-film formation of OPVs is investigated with optical microscopy and X-ray diffraction (XRD). In the case of Oocl-OPV5, this has been supplemented with surface imaging by means of atomic force microscopy. It is demonstrated how an annealing treatment of the films alter deposition influences... 

Film-forming chemical reactions and the chemical composition of the film formed on lithium in nonaqueous aprotic liquid electrolytes are reviewed by Dominey [7], SEI formation on carbon and graphite anodes in liquid electrolytes has been reviewed by Dahn et al. [8], In addition to the evolution of new systems, new techniques have recently been adapted to the study of the electrode surface and the chemical and physical properties of the SEI. The most important of these are X-ray photoelectron spectroscopy (XPS), SEM, X-ray diffraction (XRD), Raman spectroscopy, scanning tunneling microscopy (STM), energy-dispersive X-ray spectroscopy (EDS), FTIR, NMR, EPR, calorimetry, DSC, TGA, use of quartz-crystal microbalance (QCMB) and atomic force microscopy (AFM). 

A new measurement technique, in-situ atomic force microscopy combined with XPS and scanning Auger electron microscopy and continuous argon sputtering, recently revealed that the films are not uni-... 

Magonov, S.N., Elings, V., Cleveland, J., Denley, D., and Whangbo, M.-H., Tapping-mode atomic force microscopy study of the near-surface composition of a styrene-butadiene-styrene triblock copolymer film, Surf. Sci., 389, 201, 1997. 

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