Fault pattern

Earthquake fault patterns and percolation model of earthquakes 143... 

Fig. 4.11. A typical cross-section of the earthquake fault pattern in the rocks near a geysers field (from Sahimi et al 1992).

Somette, A., Davy, P. and Somette, D. 1990. Growth of fractal fault patterns. Phys. Rev. Lett., 65, 18 2266-2269. 

Roberts, J.C. (1976) The joint and fault patterns of the north coast of counties Antrim and Londonderry between Murlough Bay and Castlerock. Prcx. Roy. Irish Acad., 76, 619-628. 

Thus, the stacking fault patterns noted are a function of the t5q>e of lattice involved, not on the chemical composition of the material. For the most part, these stacking faults are found only in the high symmetry lattices such as hexagonal close-packed and cubic close-packed structures. 

Fig. 3. Magnolia Field well locations and generalized fault pattern in relation to bounding allochthonous salt. The location of the seismic line shown in Figure 4 is shown as line A-A. The depositional fairway margin shown coincides with the stratigraphic extent of the principle Magnoha Field sands. Depth contours of an intra-Pleistocene surface are in feet subsea.

The TDAS is a methodology which reduces the dimension of the wavelet matrix due to applying the geometric mean to output from the wavelet transform. It is expected that the TDAS application will allow fault patterns to be identified better as shown in HALIM et al. (2008). However, the complexity involved in the vibration signals may impede this identification. This is one limitation of the TDAS method that needs to be pointed out. Additionally, this method requires a visual interpretation of the three-dimensional graph of the U(s,p), a hard task to be computationally automated. Besides, in some cases, vibration signals can be acquired from more than one source simultaneously. Therefore, the dimension of the vibration data can make use of the TDAS method difficult. 

Consider the index k represents the fault pattern, k = 1,..., AT. Where K is the number of fault patterns de lined. The SPE statistics for a condition k is denoted Ek- The TDAS of a fault pattern is represented as U k(s,p) and the TDAS of a current data is represented as U (i,/>). Then, the Squared Prediction Errorof TDAS is defined by ... 

SPEk should be calculated for all fault patterns and the lowest SPE represents the gearbox condition which should be assumed as an actual condition. 

This model overcomes the limitations presented and moves towards an approach of automated gearbox fault diagnosis systems. However, fault patterns need to be produced in order to compare these with operational data in order to predict automatically the actual condition of gearboxes. 

J. R. Whiteley andj. F. Davis, "QuaHtative Interpretation of Sensor Patterns using a Similarity-Based Approach," paper presented at the IFAC Symposium on On-Eine Fault Detection and Supervision in the Chemical Process Industries, Newark, Del., Apr. 1992. 

Warping, difficulty of moulding to close tolerances and wavy or fibre-patterned surfaces or faults arising from the high shrinkage during cure. 

Scherrer equation to estimate the size of organized regions Imperfections in the crystal, such as particle size, strains, faults, etc, affect the X-ray diffraction pattern. The effect of particle size on the diffraction pattern is one of the simplest cases and the first treatment of particle size broadening was made by Scherrer in 1918 [16]. A more exact derivation by Warren showed that. 

This factor refers to the spatial organization of the information displays. In general, instruments displaying process parameters that are functionally related should also be physically close. In this way, it is likely that a given fault will lead to a symptom pattern that is easier to interpret than a random distribution of information. Although violation of this principle may not induce errors in a direct manner, it may hinder human performance. The following example illustrates this point. 

Design faults in two-pass condensers and heat exchangers that can cause corrosion include poor division plate seals allowing the escape of water at high velocity between the passes, and flow patterns that produce stagnant zones. 

It is well known that in rutile-like structures the planes [Oil] and [0 3 1] are twinning planes. Hence, Chabre and Pannetier concluded that twinning faults in the planes [0 2 1] and [0 6 1] (the equivalent planes in the ramsdel-lite doubled unit cell) are the explanation for some features in the diffraction patterns of y — Mn02 e.g., the lineshift of the (1 1 0) reflection toward lower angles or the merging of the reflection groups (h 2 1 )/(h 4 0) and (h 6 1 )/(h 0 2). 

The correct interpretation of measured process data is essential for the satisfactory execution of many computer-aided, intelligent decision support systems that modern processing plants require. In supervisory control, detection and diagnosis of faults, adaptive control, product quality control, and recovery from large operational deviations, determining the mapping from process trends to operational conditions is the pivotal task. Plant operators skilled in the extraction of real-time patterns of process data and the identification of distinguishing features in process trends, can form a mental model on the operational status and its anticipated evolution in time. 

The pivotal component of many engineering tasks—e.g., process fault diagnosis and product quality control—is the recognition of certain distinguishing temporal patterns (i.e., features) during the operation of the... 

SO that any structural features such as twin or faults can be revealed. For larger particles, In the 20-50% size range, the diffraction pattern may be seen to change as the beam Is moved across the particle. 

For the smaller particles which Include only a few tens or hundreds of atoms, any twinning or faulting reduces the range of ordering to the extent that the pattern can not be Interpreted In the same way as a pattern from an extended crystal. The Individual single-crystal regions may contain only two or three atomic planes. Interpretation can be made only by calculation of patterns from postulated models for the configurations of atoms (22). 

Other information that can be obtained from a wide-angle diffraction pattern includes the detection of stacking faults and microstrains, the lattice parameters, and the mean-square amplitude of vibratioiu... 

B. Waiczack and D.L. Massart, Application of radial basis functions-partial least squares to non-linear pattern recognition problems diagnosis of process faults. Anal. Chim. Acta, 331 (1996) 187-193. 

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