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Electron beam ion source

Figure 2, Pulsed electron beam ion source for operation at elevated pressures. A 3-kV e-beam enters through a 50-pm aperture located at the center of one wall of the ion source. Ions are sampled through a 50-pm aperture located at the center of the other wall of the ion source. A 2-mm thick copper gasket determines the depth of the active source volume. Figure 2, Pulsed electron beam ion source for operation at elevated pressures. A 3-kV e-beam enters through a 50-pm aperture located at the center of one wall of the ion source. Ions are sampled through a 50-pm aperture located at the center of the other wall of the ion source. A 2-mm thick copper gasket determines the depth of the active source volume.
Because the HITRAP facility will not be able to continuously obtain the ESR beam for testing the Cooler trap and the experimental setups, it was decided to install an electron beam ion source (EBIS), which was available from the University of Frankfurt, on the platform for off-line tests. This source (MAXEBIS) is currently being tested and will be used to tune the low-energy beam line (LEBT) towards the Cooler trap, and for tests of the Cooler trap itself. Afterwards, the components will be moved to the HITRAP facility. A more complete overview of the time planning for the construction of the HITRAP facility is presented in Table 7.2. [Pg.89]

Electron Beam Ion Source (EBIS) and Ion Trap (EBIT). 2333... [Pg.2319]

Some ion sources and fusion facilities in the plasma plane. PIG Penning Ion Gauge, ECRIS Electron Cyclotron Resonance Ion Source, EBIS/EBIT Electron Beam Ion Source or Trap, laser plasma produced by laser ablation in solids, tokamak fusion device of light ions, fully stripped uranium ion... [Pg.2324]

By working principle, they can be classified as hot filament sources, ion sources based on Penning discharge (PIG), radio frequency (RF) and microwave (MW) ion sources, electron cyclotron resonance (ECR) ion sources, electron beam ion sources (EBIS, EBIT), laser ion sources, cusp and multicusp ion sources, sputtering ion sources. [Pg.2325]

The radiation sources employed in microlithography include conventional (>300 nm) and deep-UV (<300 nm) light, electron-beam, ion-beam and x-ray sources. By far the predominant lithographic technology is conventional photolithography which... [Pg.132]

Energy Transfer Processes. Luminescence is a complex sequence of energy transfer processes. Figure 2 is a schematic of the most important of these for photoluminescence, cathodoluminescence, and candoluminescence. The ultimate source of energy is the excitation UV light, electron beam, ion beam, or radical recombination excitation. We are not concerned here about the triggered release of previously trapped energy such as occurs in thermoluminescence and triboluminescence. [Pg.123]

Abstract. Absolute measurements of the energies of helium-like vanadium resonances on an electron beam ion trap (EBIT) axe reported. The results agree with recent theoretical calculations and the experimental precision (27-MO ppm) lies at the same level as the current uncertainty in theory (0.1 eV). The measurements represent a 5.7%-8% determination of the quantum electrodynamics (QED) contribution to the transition energies and are the most precise measurements of the helium-hke resonances in the Z = 19—31 range. These are the first precision X-ray measurements on the National Institute of Standards and Technology EBIT and strongly commend the EBIT as a new spectroscopic source for QED investigations. [Pg.699]

Most precision spectroscopy of medium Z ions has been conducted at accelerators or tokamak plasmas, but the recent development of the electron beam ion trap (EBIT) has offered a new spectroscopic source to experimenters. Our experimental method takes advantage of the Doppler free and relatively clean spectra produced by an EBIT and is coupled with an external calibration source to allow absolute measurement of highly charged ions. These are the first precision X-ray measurements conducted at the NIST EBIT [12],... [Pg.700]

An electron accelerated through a potential of v volts has an associated de Broglie wavelength of "v/loO/F (A) but, because of the poor energy resolution in most electron-impact ion sources, there is a spread in electron-beam energy. A spread of 0-5 volts in the visible region of the electromagnetic spectrum corresponds to a spread of 1200 A, not a... [Pg.157]

In the late 1960s several major advances were made in the study of thermal electron reactions. These were based on the ECD, the extension of the magnetron method of studying electron molecule reactions to determine equilibrium constants for electron molecule reactions, and the invention of high-pressure thermal electron negative-ion sources for mass spectrometry [5-7], Electron swarms were also used to determine rate constants for thermal electron reactions [8, 9]. The electron affinities of molecules were measured using electron and alkali metal beams [10, 11]. Relative electron affinities were obtained from the direction of the reaction of a negative ion with a molecule [12, 13], Other major advances were photodetachment and photoelectron spectroscopy [14—17],... [Pg.2]


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See also in sourсe #XX -- [ Pg.2324 , Pg.2325 , Pg.2333 ]




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