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Beam sources

To date, the IR-CRLAS studies have concentrated on water clusters (both FI2O and D2O), and methanol clusters. Most importantly, these studies have shown that it is in fact possible to carry out CRLAS in the IR. In one study, water cluster concentrations in the molecular beam source under a variety of expansion conditions were characterized [34]- hr a second study OD stretching bands in (020) clusters were measured [35]. These bands occur between 2300... [Pg.1170]

Cambridge Instruments builds the first commercial SEM 1968 Crewe and colleagues introduce the PEG as electron beam source 1968 Crewe and colleagues build the first STEM prototype 1995 Zach proves the concept of a corrected LVSEM... [Pg.1624]

Figure B2.3.7. Schematic apparatus of crossed molecular beam apparatus with synclirotron photoionization mass spectrometric detection of the products [12], To vary the scattering angle, the beam source assembly is rotated in the plane of the detector. (By pemrission from AIP.)... Figure B2.3.7. Schematic apparatus of crossed molecular beam apparatus with synclirotron photoionization mass spectrometric detection of the products [12], To vary the scattering angle, the beam source assembly is rotated in the plane of the detector. (By pemrission from AIP.)...
Valentin J J, Coggiola M J and Lee Y T 1977 Supersonic atomic and molecular halogen nozzle beam source Rev. Sc/. Instrum 48 58-63... [Pg.2086]

Dharmasena G, Copeland K, Young J H, Lasell R A, Phillips T R, Parker G A and Keil M 1997 Angular dependence for v /-resolved states in F + H2 -> HF(v /) + H reactive scattering using a new atomic beam source J. Rhys. Chem. A101 6429—40... [Pg.2086]

Faubel M, Martinez-Haya B, Rusin L Y, Tappe U and Toennies J P 1996 An intense fluorine atom beam source J. Rhys. D Appl. Rhys. 29 1885-93... [Pg.2086]

Once the primary electron beam is created, it must be demagnified with condenser lenses and then focused onto the sample with objective lenses. These electron lenses are electromagnetic in nature and use electric and magnetic fields to steer the electrons. Such lenses are subject to severe spherical and chromatic aberrations. Therefore, a point primary beam source is blurred into a primary beam disk to an extent dependent on the energy and energy spread of the primary electrons. In addition, these lenses are also subject to astigmatism. AH three of these effects ultimately limit the primary beam spot size and hence, the lateral resolution achievable with sem. [Pg.271]

H. R. Kaufman and R. S. Robinson, Operation of Broad-Beam Sources, Commonwealth Scientific, Alexandria, Va., 1987. [Pg.403]

Alloys. Alloys consist of two or mote elements of different vapor pressures and hence different evaporation rates. As a result, the vapor phase and therefore the deposit constantiy vary in compositions. This problem can be solved by multiple sources or a single rod- or wire-fed electron beam source fed with the alloy. These solutions apply equally to evaporation or ion-plating processes. [Pg.42]

SJng Je Rod-Fed Electron Beam Source. The disadvantages of multiple sources for alloy deposition can be avoided by using a single wire-fed or rod-fed source (Fig. 3) (3). A molten pool of limited depth is above the soHd rod. If the equiUbrium vapor pressures of the components of an alloy A B are in the ratio of 10 1 and the composition of the molten pool is A qB, under steady-state conditions, the composition of the vapor is the same as that of the soHd being fed into the molten pool. The procedure can be started with a pellet of appropriate composition A qB on top of a rod A B to form the molten pool initially, or with a rod of alloy A B to evaporate the molten pool until it reaches composition A qB. The temperature and volume of... [Pg.42]

Unlike traditional surface science techniques (e.g., XPS, AES, and SIMS), EXAFS experiments do not routinely require ultrahigh vacuum equipment or electron- and ion-beam sources. Ultrahigh vacuum treatments and particle bombardment may alter the properties of the material under investigation. This is particularly important for accurate valence state determinations of transition metal elements that are susceptible to electron- and ion-beam reactions. Nevertheless, it is always more convenient to conduct experiments in one s own laboratory than at a Synchrotron radiation focility, which is therefore a significant drawback to the EXAFS technique. These focilities seldom provide timely access to beam lines for experimentation of a proprietary nature, and the logistical problems can be overwhelming. [Pg.224]

The models in the THERdbASE CD are Chemical Source Release, Instantaneous Emission, Chemical Source Release, Timed Application, Indoor Air (2-Zone), Indoor Air (N-Zone), Exposure Patterns for Chemical Agents, Benzene Exposure Assessment Model (BEAM), Source Ba.sed Exposure Scenario (Inhalation + Dermal), and Film Thickness Based Dermal Dose. [Pg.373]

Generally, the more intense the available beam source, the shorter the time scales, the weaker the heterogeneities, and the longer the distances that can be probed by a scattering method. Hence, there is a strong drive to utilize high-powered lasers, synchrotrons, and intense neutron somces in research on surfaces, interfaces, and microstmctures. This is particularly tme in the study of liquid materials and of systems that undergo rapid physical transformations or chemical reactions. [Pg.184]

As an electrolyte, Nafion 112 (Du Pont, Inc) membrane was pretreated using H2O2, H2SO4 and deionized water before ion beam bombardment. The prepared membranes with a size of 8 X 8 cm were mounted on a bombardment frame with a window size of 5 x 5 cm, equal to the active area of the test fuel cells, and dried up at 80 C for 2 hr. Then, the mounted membrane was brought in a vacuum chamber equipped with a hollow cathode ion beam source as described in the previous study [1]. Ion dose was measured using a Faraday cup. Ion density... [Pg.605]

The spectrometer is fitted with a skimmed c.w. supersonic molecular beam source. Many chiral species of interest are of low volatility, so a heated nozzle-reservoir assembly is used to generate, in a small chamber behind a 70-pm pinhole, a sample vapor pressure that is then seeded in a He carrier gas as it expands through the nozzle [103], Further details of this apparatus are given elsewhere [36, 102, 104],... [Pg.305]

Those fixed-angle measurements reported to date have all used either a heated effusive inlet, or heated gas cell for sample admission [55, 56, 61, 62, 65]. Probably the higher sample number densities these sources generate, compared to a supersonic beam source, provides some compensation for the reduced collection efficiency in the fixed-angle measurement. [Pg.308]

The accuracy of experimentally determined structure factors is limited by various error sources, which may be introduced by the experimental method itself or during the data reduction stage. A reduction of those errors is expected by the use of high-energy synchrotron radiation (E(/ ) > 100 keV) as primary beam source, because absorption and extinction corrections are negligible in most practical cases. [Pg.220]

Figure 3.9. Transient C02 formation rates on Pd30 (a) and Pd8 (b) mass-selected clusters deposited on a MgO(lOO) film at different reaction temperatures [74]. In these experiments CO was dosed from the gas background while NO was dosed via a pulsed nozzle molecular beam source. The turnover frequencies (TOFs) calculated from the experiments displayed in (a) and (b) are displayed in the last panel (c). C02 formation starts at lower temperatures but reaches lower maximum rates on the larger cluster. (Figure provided by Professor Heiz and reproduced with permission from Elsevier, Copyright 2005). Figure 3.9. Transient C02 formation rates on Pd30 (a) and Pd8 (b) mass-selected clusters deposited on a MgO(lOO) film at different reaction temperatures [74]. In these experiments CO was dosed from the gas background while NO was dosed via a pulsed nozzle molecular beam source. The turnover frequencies (TOFs) calculated from the experiments displayed in (a) and (b) are displayed in the last panel (c). C02 formation starts at lower temperatures but reaches lower maximum rates on the larger cluster. (Figure provided by Professor Heiz and reproduced with permission from Elsevier, Copyright 2005).
The apparatus shown in Fig. 2 consists of three main components two rotatable molecular beam sources, laser ionization and TOF spectrometer. [Pg.5]

H2 molecular beam. The H-atom products were detected by the Rydberg tagging TOF technique using the same scheme described in the last paragraph with a rotatable MCP detector. Figure 4 shows the experimental scheme of the crossed beam setup for the 0(1D) + H2 reactive scattering studies. The scheme used for the H + D2(HD) studies is very similar to that used in the 0(1D) + H2 except that the H-atom beam source is generated from HI photodissociation rather than the 0(1D)-atom beam source from 02 photodissociation. [Pg.95]


See other pages where Beam sources is mentioned: [Pg.1331]    [Pg.1823]    [Pg.1824]    [Pg.2061]    [Pg.2065]    [Pg.2066]    [Pg.2066]    [Pg.2086]    [Pg.2389]    [Pg.131]    [Pg.399]    [Pg.50]    [Pg.110]    [Pg.43]    [Pg.321]    [Pg.568]    [Pg.646]    [Pg.1032]    [Pg.494]    [Pg.162]    [Pg.873]    [Pg.223]    [Pg.225]    [Pg.141]    [Pg.159]    [Pg.366]    [Pg.1]    [Pg.5]    [Pg.73]    [Pg.73]   


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Beam sources discharge

Beam sources dissociative

Beam sources excited states

Beam sources hyperthermal

Beam sources neutral

Beam sources nozzle

Beam sources seeded

Beam sources sputtering

Beam sources unstable species

Beam-foil light source

Discharge corona, beam source

Effusive beam source

Electron beam as a local heat source

Electron beam ion source

Initiation of Polymerization with Radioactive Sources and Electron Beams

Ion beam sources

Molecular beam sources

Plasma source molecular beam epitaxy

Polymerization with Radioactive Sources and Electron Beams

Proton beam source

Rotating beam source photofragmentation

Rotating beam source photofragmentation apparatus

Source beam condensing system

Supersonic beam sources

Supersonic cluster beam source

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