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Electrochemical mechanical planarization

Several people in the IBM Semiconductor Research and Development Center including the alliance partners helped in reviewing this chapter for clarity and consistency and provided valuable input. The author would also like to thank the Applied Materials team who has been working on electrochemical-mechanical planarization for their continuous support during the development of the hybrid ECMP as well as for providing their inputs on the recent developments for full-sequence ECMP. In addition, the author gratefully acknowledge to the kind contribution from Manabu Tsujimura of Ebara on the comparison of ECP, ECP-DI, ECMP, and CMP. [Pg.341]

Goonetilleke PC, Roy D. Electrochemical-mechanical planarization of copper effects of chemical additives on voltage controlled removal of surface layers in electrolytes. Materials Chem Phy 2005 94 388-400. [Pg.342]

Economikos L, et al. Integrated electrochemical-mechanical planarization (Ecmp) for future generation device technology IITC. 2005. [Pg.343]

Kondo S, Tominaga S, Namiki A, Yamada K, Abe D, Fukaya K, Shimada M, Kobayashi N. Novel electrochemical-mechanical planarization using carbon polishing pad to achieve robust ultra-low-fe/Cu integration IITC. Jun 2005. [Pg.343]

Emery, S.B., Hubbley, J.L., Darhng, M.A., et al., 2005. Chemical factors for chemical-mechanical and electrochemical—mechanical planarization of silver examined using potentiodynamic and impedance measurements. Mater. Chem. Phys. 89, 345—353. [Pg.84]

Goonetilleke, P.C., Babu, S.V., Roy, D., 2005. Voltage-induced material removal for electrochemical mechanical planarization of copper in electrolytes containing N03, glycine, and H2O2. Electrochem. Solid State Lett. 8, G190—G193. [Pg.85]

Klug, B.K., Pettit, C.M., Pandija, S., et al., 2008. Investigation of dissolution inhibitors for electrochemical mechanical planarization of copper using beta-alanine as a complexing agent. J. Appl. Electrochem. 38, 1347—1356. [Pg.86]

Lin, J.-Y., Chou, S.-W., 2011. Synergic effect of benzotriazole and chloride ion on Cu passivation in a phosphate electrochemical mechanical planarization electrolyte. Electrochim. Acta 56, 3303—3310. [Pg.86]

Lin, J.-Y., West, A.C., 2010. Adsorption—desorption study of benzotriazole in a phosphate-based electrolyte for Cu electrochemical mechanical planarization. Electrochim. Acta 55, 2325-2331. [Pg.86]

Sulyma, C.M., GoonetiUeke, P.C., Roy, D., 2009. Analysis of current transients for voltage pulse-modulated surface processing apphcation to anodic electro-dissolution of copper for electrochemical mechanical planarization. J. Mater. Proc. Technol. 209, 1189—1198. [Pg.88]

Sulyma, C.M., Roy, D., 2010b. Voltammetric current oscillations due to general and pitting corrosion of tantalum Implications for electrochemical—mechanical planarization. Coiros. Sci. 52, 3086-3098. [Pg.88]


See other pages where Electrochemical mechanical planarization is mentioned: [Pg.6]    [Pg.264]    [Pg.223]    [Pg.331]    [Pg.334]    [Pg.335]    [Pg.337]    [Pg.339]    [Pg.340]    [Pg.58]    [Pg.85]    [Pg.170]   


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Electrochemical mechanical planarization ECMP)

Electrochemical mechanism

Full Sequence Electrochemical-Mechanical Planarization

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