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Drift instrument

Many instruments utilize a double beam principle in that radiation absorbed or emitted by the sample is automatically compared with that associated with a blank or standard. This facilitates the recording of data and corrects for matrix effects and instrumental noise and drift. Instrumentation for the generation of radiation is varied and often peculiar to one particular technique. It will be discussed separately in the relevant sections. Components (b) and (c), however, are broadly similar for most techniques and will be discussed more fully below. [Pg.277]

To find explosives Gas analyzers, chromatography instruments, drift-spectrometers, neutron defectosopes, nuclear-magnetic and nuclear-quadrupole resonant instruments... [Pg.912]

Vibrational Spectroscopy. Infrared absorption spectra may be obtained using convention IR or FTIR instrumentation the catalyst may be present as a compressed disk, allowing transmission spectroscopy. If the surface area is high, there can be enough chemisorbed species for their spectra to be recorded. This approach is widely used to follow actual catalyzed reactions see, for example. Refs. 26 (metal oxide catalysts) and 27 (zeolitic catalysts). Diffuse reflectance infrared reflection spectroscopy (DRIFT S) may be used on films [e.g.. Ref. 28—Si02 films on Mo(llO)]. Laser Raman spectroscopy (e.g.. Refs. 29, 30) and infrared emission spectroscopy may give greater detail [31]. [Pg.689]

Determinate measurement errors can be minimized by calibration. A pipet can be calibrated, for example, by determining the mass of water that it delivers and using the density of water to calculate the actual volume delivered by the pipet. Although glassware and instrumentation can be calibrated, it is never safe to assume that the calibration will remain unchanged during an analysis. Many instruments, in particular, drift out of calibration over time. This complication can be minimized by frequent recalibration. [Pg.60]

Monitoring by Electromechanical Instrumentation. According to basic engineering principles, no process can be conducted safely and effectively unless instantaneous information is available about its conditions. AH sterilizers are equipped with gauges, sensors (qv), and timers for the measurement of the various critical process parameters. More and more sterilizers are equipped with computerized control to eliminate the possibiUty of human error. However, electromechanical instmmentation is subject to random breakdowns or drifts from caUbrated settings and requires regular preventive maintenance procedures. [Pg.406]

Quality control elements required by the instrumental analyzer method include analyzer calibration error ( 2 percent of instrument span allowed) verifying the absence of bias introduced by the sampling system (less than 5 percent of span for zero and upscale cah-bration gases) and verification of zero and calibration drift over the test period (less than 3 percent of span of the period of each rim). [Pg.2200]

Fig. 4.23. EDXS instrumentation for TEM and SEM (a) conventional EDX detector attached to a TEM/STEM (b) EDX system with Si drift-... Fig. 4.23. EDXS instrumentation for TEM and SEM (a) conventional EDX detector attached to a TEM/STEM (b) EDX system with Si drift-...
The second, mechanical and electrical manometers, require more frequent calibration. Changes in the elastic properties of the pressure transducer, wearing in mechanical parts, and electronic circuitry drift influence the properties of the instruments, giving rise to repeated calibration. [Pg.1151]

Knowing what checks have been made using the instrument since it was last checked, so that you can repeat them should the instrument be subsequently found out of calibration - this is only necessary for instruments whose accuracy drifts over time, i.e. electronic equipment. (It is not normally necessary for mechanical devices. You will need a traceability system for this purpose.)... [Pg.401]

Regarding the adjustment of measuring devices, adjustment is only possible with devices that have been designed to be adjustable. Mechanical devices are normally adjusted to the null position on calibration. Electronic devices should only be adjusted if found to be outside the limits. If you adjust the device at each calibration you will not be able to observe drift. Adjustments, if made very frequently, may also degrade the instrument. It is best to observe the adage ... [Pg.414]

Valve voltmeters were widely used in the past, but have been replaced by transistor voltmeters. With instruments of this type it is possible to achieve an input resistance of 50 MQ or more, the current required to operate the instrument being of the order of 10" A. The early instruments had a tendency to zero drift on the lower ranges, but this has been overcome in the modern transistor types. Such instruments are most often used to make potential readings in extremely high-resistance electrolytes. The accuracy of such instruments is of the order of 2% full-scale deflection. It is necessary to ensure that both types are so designed that they do not respond to alternating currents. [Pg.248]

Note. It is good practice to make the fluorescence measurements for samples and standards as close together as possible to minimise any drift in instrument response. [Pg.737]

It is usually difficult, if not impossible, to quantify all of the components in our samples. This is expecially true when we consider the meaning of the word "components" in the broadest sense. Even if we have accurate values for all of the constituents in our samples, how do we quantify the contribution to the spectral absorbance due to instrument drift, operator effect, instrument aging, sample cell alignment, etc. The simple answer is that, generally, we can t. To the extent that we do not provide CLS with the concentration of all of the components in our samples, we might expect CLS to have problems. In the case of our simulated data, we have samples that contain 4 components, but we only have concentration values for 3 of the components. Each sample also contains a random baseline for which "concentration values are not available. Let s see how CLS handles these data. [Pg.54]

As was the case for PCR, we see that the PLS spectral residuals for a sample will be higher whenever there is something in the data that introduces a mode of variation into the spectrum that was not present in any of the training samples used to develop the basis space. The anomolous variation could be caused by instrument drift, an unexpected interfering component, a misaligned sample cell, or whatever. We can use this property of residuals as an indicator that can signal... [Pg.152]

Kinetic data may be collected in which the final instrument reading is unreliable or unavailable. Perhaps excessive time would be needed, or a slow secondary reaction sets in, or the instrument baseline slowly drifts. Nowadays, with readily available nonlinear least-squares programs, one may simply treat as a floated variable, along with k. [Pg.25]

The short-term noise shown in Figure 2.5(b) arises primarily from the electronic components of the system and stray signals in the environment. Drift may also arise from electronic components of the system, particularly just after an instrument has been turned on and while it is stabilizing. [Pg.40]

Various calibration schemes similar to those given in Section 2.2.8 were simulated. The major differences were (1) the assumption of an additional 100% calibration sample after every fifth determination (including replications) to detect instrument drift, and (2) the cost structure outlined in Table 4.6, which is sununarized in Eq. (4.2) below. The results are depicted graphically in Figure 4.5, where the total cost per batch is plotted against the estimated confidence interval CI(X). This allows a compromise involving acceptable costs and error levels to be found. [Pg.187]

Relatively long time-constants of 1 to 60 s are used in order to minimize the noise inherent in c.d. spectra. Thus, the scanning rate is low, and as c.d. instruments tend to drift with time, they should be calibrated daily, and baselines should be measured for each sample. [Pg.78]


See other pages where Drift instrument is mentioned: [Pg.3468]    [Pg.3468]    [Pg.1353]    [Pg.1354]    [Pg.189]    [Pg.467]    [Pg.342]    [Pg.765]    [Pg.2576]    [Pg.2576]    [Pg.11]    [Pg.129]    [Pg.129]    [Pg.893]    [Pg.1122]    [Pg.1131]    [Pg.1143]    [Pg.1158]    [Pg.4]    [Pg.14]    [Pg.125]    [Pg.371]    [Pg.556]    [Pg.188]    [Pg.304]    [Pg.6]    [Pg.140]    [Pg.300]    [Pg.4]    [Pg.431]   
See also in sourсe #XX -- [ Pg.61 , Pg.155 , Pg.417 ]

See also in sourсe #XX -- [ Pg.61 , Pg.156 , Pg.419 ]




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