Dispersed emission spectroscopy

We have also performed time resolved studies (time correlated single photon counting dispersed emission spectroscopy) on all of the above emission spectral features. An example of the data typically obtained is presented in Figure 4. This figure shows that the decay... 

To examine a sample by inductively coupled plasma mass spectrometry (ICP/MS) or inductively coupled plasma atomic-emission spectroscopy (ICP/AES) the sample must be transported into the flame of a plasma torch. Once in the flame, sample molecules are literally ripped apart to form ions of their constituent elements. These fragmentation and ionization processes are described in Chapters 6 and 14. To introduce samples into the center of the (plasma) flame, they must be transported there as gases, as finely dispersed droplets of a solution, or as fine particulate matter. The various methods of sample introduction are described here in three parts — A, B, and C Chapters 15, 16, and 17 — to cover gases, solutions (liquids), and solids. Some types of sample inlets are multipurpose and can be used with gases and liquids or with liquids and solids, but others have been designed specifically for only one kind of analysis. However, the principles governing the operation of inlet systems fall into a small number of categories. This chapter discusses specifically substances that are normally liquids at ambient temperatures. This sort of inlet is the commonest in analytical work. 

Elemental chemical analysis provides information regarding the formulation and coloring oxides of glazes and glasses. Energy-dispersive x-ray fluorescence spectrometry is very convenient. However, using this technique the analysis for elements of low atomic numbers is quite difficult, even when vacuum or helium paths are used. The electron-beam microprobe has proven to be an extremely useful tool for this purpose (106). Emission spectroscopy and activation analysis have also been appHed successfully in these studies (101). 

When the spectral characteristics of the source itself are of primary interest, dispersive or ftir spectrometers are readily adapted to emission spectroscopy. Commercial instmments usually have a port that can accept an input beam without disturbing the usual source optics. Infrared emission spectroscopy at ambient or only moderately elevated temperatures has the advantage that no sample preparation is necessary. It is particularly appHcable to opaque and highly scattering samples, anodized and painted surfaces, polymer films, and atmospheric species (135). The interferometric... 

The boron nitride obtained in this study was characterized by infrared spectroscopy, powder x-ray diffractometry and transmission electron microscopy. Trace elemental analyses were also performed by energy dispersive x-ray analysis and carbon arc emission spectroscopy. Representative spectra are displayed in Figures 2-4. 

The most frequently applied analytical methods used for characterizing bulk and layered systems (wafers and layers for microelectronics see the example in the schematic on the right-hand side) are summarized in Figure 9.4. Besides mass spectrometric techniques there are a multitude of alternative powerful analytical techniques for characterizing such multi-layered systems. The analytical methods used for determining trace and ultratrace elements in, for example, high purity materials for microelectronic applications include AAS (atomic absorption spectrometry), XRF (X-ray fluorescence analysis), ICP-OES (optical emission spectroscopy with inductively coupled plasma), NAA (neutron activation analysis) and others. For the characterization of layered systems or for the determination of surface contamination, XPS (X-ray photon electron spectroscopy), SEM-EDX (secondary electron microscopy combined with energy disperse X-ray analysis) and... 

If the linear dispersion of a spectrograph used in atomic emission spectroscopy is 2 mm for a difference in wavelength of 1 nm and the size of the exit aperture is 20 pm, calculate the spectral interval of the emissions which reach the detector. 

Effects of Chemical Purity. Zirconia tubes from five different sources were analyzed at Pennsylvania State University using scanning electron microscopy, plasma emission spectroscopy, energy dispersive X-ray spectroscopy, and electron beam microprobe analysis. The sources for the tubes included several commercially available tubes as well as tubes fabricated by the Pennsylvania State University Ceramics Department. 

All raw and treated coals were analyzed at Ames Laboratory for trace, major, and minor elements using energy-dispersive x-ray fluorescence (XRF), inductively coupled plasma-atomic emission spectroscopy (ICP-AES), and atomic absorption spectrophotometry (AA). General analytical procedures employed for each of these techniques are discussed separately below. 

The Bi-promoted catalysts were prepared by consecutive deposition of Bi onto a commercial 5 wt% Pt/alumina (Engelhard E 7004, Pt dispersion 0.30 determined by TEM) [7]. The reduction of bismuth-nitrate was carried out in a dilute aqueous acidic solution O10"6 M, pH = 3-4) by hydrogen. The metal content of the catalysts was determined by inductive coupled plasma atomic emission spectroscopy (ICP-AES). Preferential deposition of Bi onto Pt particles has been confirmed by TEM, combined with energy dispersive X-ray analysis (EDX) [7]. Pb-, Sn- and Ag-promoted catalysts were prepared similarly. 

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