Different Schemes of Laser Ablation

Different analytical techniques are used for detection of the elemental composition of the solid samples. The simplest is direct detection of emission from the plasma of the ablated material formed above a sample surface. This technique is generally referred to as LIBS or LIPS (laser induced breakdown/plasma spectroscopy). Strong continuous background radiation from the hot plasma plume does not enable detection of atomic and ionic lines of specific elements during the first few hundred nanoseconds of plasma evolution. One can achieve a reasonable signal-to-noise ra- 

The intrinsic drawback of LIBS is a short duration (less than a few hundreds microseconds) and strongly non-stationary conditions of a laser plume. Much higher sensitivity has been realized by transport of the ablated material into secondary atomic reservoirs such as a microwave-induced plasma (MIP) or an inductively coupled plasma (ICP). Owing to the much longer residence time of ablated atoms and ions in a stationary MIP (typically several ms compared with at most a hundred microseconds in a laser plume) and because of additional excitation of the radiating upper levels in the low pressure plasma, the line intensities of atoms and ions are greatly enhanced. Because of these factors the DLs of LA-MIP have been improved by one to two orders of magnitude compared with LIBS. 

The sensitivity, accuracy, and precision of solid-sample analysis have been greatly improved by coupling LA with ICP-OES-MS. The ablated species are transported by means of a carrier gas (usually argon) into the plasma torch. Further atomization, excitation, and ionization of the ablated species in the stationary hot plasma result in a dramatic increase in the sensitivity of the detection of radiation (LA-ICP-OES) or of the detection of ions (LA-ICP-MS). 

The analytical capabilities of LIBS and LA-MIP-OES were recently noticeably improved by use of an advanced detection scheme based on an Echelle spectrometer combined with a high-sensitivity ICCD (intensified charge-coupled device) detector. 

Multilayer coatings of different composition and thickness are widely used in materials science and in the production of high-technology materials. The single- or multi-component thin layers significantly improve important characteristics of the materials with, e.g., specific properties. 

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