Detectors scanning electron microscopy

ECD (1) Electron-capture detector (2) Electrochemical detector E-SEM, ESEM Environmental scanning electron microscopy... 

The activity of chemically active AF paints usually relies on the reactivity of organometallic compounds (e.g. TBT-, Zn-, Si, Cu- acrylates and Zn-resinates) and inorganic pigments (i.e. CU2O). In spite of this, scanning electron microscopy coupled with energy dispersive X-ray detectors (SEM-EDX) has not been used extensively to characterise such reactions. Bishop and Silva... 

Other analytical methods can also be applied for the detection of F in archaeological artefacts, especially when it is possible to take a sample or to perform microdestructive analysis. These are namely the electron microprobe with a wavelength-dispersive detector (WDX), secondary ion mass spectrometry (SIMS), X-ray fluorescence analysis under vacuum (XRF), transmission electron or scanning electron microscopy coupled with an energy-dispersive detector equipped with an ultrathin window (TEM/SEM-EDX). Fluorine can also be measured by means of classical potentiometry using an ion-selective electrode or ion chromatography. 

Transmission electron or scanning electron microscopy coupled with an energy-dispersive detector... 

Distance between sample and detector Small-angle X-ray scattering Scanning electron microscopy Temperature... 

Microscopic measurements were performed by using a Quanta 200 ESEM (environmental scanning electron microscopy) instrument (EEY Company), operating in low-vacuum mode, with an electron beam emitted at 25 or 30 kV under 1 Torr (133 Pa) pressiue. Solid-state backscatter detector (SSB) allowed collecting backscattered electrons emitted from the samples. 

Figure 4.3 Signal collection by the Everhart-Thornley detector. B, backscattered electron trajectory SE, secondary electron trajectory F, Faraday cage S, scintillator LG, light guide PM, photomultiplier tube. (Reproduced with kind permission of Springer Science and Business Media from J.I. Goldstein et al, Scanning Electron Microscopy and X-ray Microanalysis, 2nd ed., Plenum Press, New York. 1992 Springer Science.)...

XPS data was obtained with the use of non-monochromatized Mg Ka radiation (1253.6 eV) and a hemispherical CLAM 2 (VG Microtech) analyzer. Scanning electron microscopy (SEM) was performed using an ISICL6 operating at 15 keV equipped with a Kevex X-ray detector, as previously reported [18]. 

The main factor in beam analysis that affects the reliability of the analytical information is the reproducibility of the surfaces. When using scanning electron microscopy (SEM), the apparati are connected to the computer, which makes it possible to obtain quite a bit of information about the sample, especially by X-ray and AES. However, the apparati cannot assure the same length for beam penetration on the surface, which means that the analytical information can be uncertain. Because the beam analysis is rapid, it requires very fast detectors, e.g., Ge/Li or Si/Li. The LA can be successfully used in surface analysis. An automated system has been constructed, laser-induced breakdown spectrometry (LIBS).213 This is an alternative to other surface techniques — secondary ion mas spectroscopy (SIMS), SEM, X-ray photoelectron spectroscopy (XPS) — and it increases the lateral and depth resolution. 

Scanning electron microscopy (SEM) is a useful technique for the analysis of plastic surfaces. It involves a finely collimated beam of electrons that sweeps across the surface of the specimen being analyzed. The beam is focused into a small probe that scans across the surface of a specimen. The beam s interactions with the material results in the emission of electrons and photons as the electrons penetrate the surface. The emitted particles are collected with the appropriate detector to yield information about the surface. The final product of the electron beam collision with the sample surface topology is an image (Fig. 10.18). 

Analysis and spectroscopic study. The elemental analysis was performed with anICP-6000 spectrometer. The precursors crystallization was studied by thermal analysis methods (TG85). The samples were analysed by IR spectroscopy (Nicollet, FTIR-7500) and powder X-ray diffraction (PXRD, DRON-3). The morphology of surface was studied by scanning electron microscopy (SEM) (JEOL, JSM-6100). The density of KTP particles was determined by a sink-float method. Local x-ray analysis was performed using Link ISIS microanalysis system (Si Li detector) mounted on Jeol 2000 FX microscope. Bruker-400 apparatus was used for P, C and H NMR study of precursor solution. The YAG Nd SHG was measured on LS-10 device. 

Information on the structure and homogeneity of the preceramic polymers or ceramics can be obtained by x-ray diffraction, scanning electron microscopy (SEM), and transmission electron microscopy. A conventional x-ray diffractometer as well as one equipped with a position-sensitive detector can be uti-... 

A zeolite with MFI structure was synthesised with 3 different amounts of niobium ammonium complex (NAC) in the reaction mixture. The samples obtained were characterised by scanning electron microscopy (SEM) using secondary electron detector and energy dispersive spectrum (EDS) detector, X-ray diffraction (XRD), differential thermal analysis (DTA), and electron paramagnetic resonance (EPR). The increase of NAC in the reaction mixture results in the decrease of the crystal size of the zeolite. The characterisation shows evidence that the niobium was incorporated into MFI structure. 

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