Energy-dispersive x-ray spectrum

This method has often been used in the investigation of PolyPs in mycorrhiza fungi (Ashford et al., 1975 Callow et al., 1978 Orlovich and Ashford, 1993 Bucking et al., 1998 Ashford et al., 1999). For example, an energy dispersive X-ray spectrum from a... 

Figure 2.5 Energy dispersive X-ray spectrum optained from a spherical electron-opaque granule of the fungus Pisolithus tinctorius, showing peaks for P and Ca (Orlovich and Ashford, 1993).

Figure 2. Backscattered electron image of Fust lignite (a), Ca X-ray map of the same area (b), and an energy-dispersive X-ray spectrum from an individual maceral (c).

Fig. 28. Polymer Blend, Polystyrene/Polybromostyrene 47 53 with energy dispersive X-ray spectrum...

Figure 4. Inverted backscattered electron image of a polished sample of Montana Past seam lignite (left) and energy-dispersive x-ray spectrum of an individual maceral (right). Note, in comparison to Figure 1, the enhanced contrast of the macerals due to the presence of inorganic elements.

FIGU RE 1.22 Electron microscope images of the tracks (a) irradiating from aparticle containing uranium (b) and the energy-dispersive x-ray spectrum of the particle after plasma ashing (c). (Adapted from Esaka, F. et al Anal. Chim. Acta, 721,122, 2012. With permission.)... 

Figure 88. Energy-dispersive X-ray spectrum of InAs (logarithmic scale of counts per channel) recorded by excitation with 30-keV electrons (E) and X-ray fluorescence (X) using the molybdenum K radiation excited in a molybdenum foil target in front of the specimen...

Figures 4a, 4b, shows energy dispersive X-ray spectrum of the ferrites and aluminates of lanthanides compounds to confirm the assumptions made from the X-ray diffraction powder results.

TS-1 has been obtained by the hydrothermal crystallization of a gel obtained from TEOS and TEOT in the presence of tetrapropylammonium hydroxyde (TPA-OH). The structure of TS-1 has been demonstrated by X-ray diffraction (XRD), energy dispersive X-ray (EDX), microprobe analysis, and 29Si magic-angle spinning (MAS) NMR spectroscopy. Furthermore, an absorption band in the IR spectrum at 960 cm-, present in TS-1 and absent from that of silicalite, was initially considered a fingerprint for the characterization of TS-1. However, later work (discussed below) has shown that this band is also present in many other silica compounds, and therefore its relation to framework Tilv is not straightforward. 

The introduction of sulphonic acid groups (-S03H) onto the PE surface was substantiated by FTIR, energy-dispersive X-ray spectroscopy (EDX) and XPS techniques. The appearance of signal at 1038 cm 1 and band at 1156 cm 1 in the FTIR spectrum of photo-modified PE film is attributed to... 

Figure 9-6 The scanning electron microscopy (SEM) in the backscattered mode, the energy dispersive X-ray (EDX) spectrum and X-ray distribution maps of a spherical particle from Sudbury soil showing Ni and Fe microstructures in a silicate matrix (from Adamo et al., 1996).

Energy-dispersive X-ray analysis consists of generation of X-rays characteristic of the elements when an electron beam impinges on the sample. By using this technique a rapid analysis of the elements present in the sample can be done with detection limits of the order of 0.1 wt %. A typical spectrum obtained in the analysis of deposits within a crack in pipe in a petrochemical plant is shown in Figure 2.30. 

An analysis of a Pto.sRhos with dispersion 0.40 by energy-dispersive X-ray spectroscopy showed that the individual particles had approximately the overall composition. The CO/ Pt double-resonance spectrum of CO close to Pt in the Pto.sRho.s surface is shown in Fig. 40b. The mere existence of this double-resonance signal shows that there is platinum in the surfaces of these particles. Its position, however, is different from that of CO on a pure platinum surface, showing that these particles are alloys. From the analysis of the Pt/ CO double-resonance spectrum of platinum in Fig. 62b, it is found that a fraction 0.49 + 0.07 of the Pt atoms are attached to CO, whereas the dispersion is estimated to be between 0.40 and 0.67 (Sec-... 

The surface morphology, thickness and quality of the deposited carbon films are analyzed by scanning electron microscopy (SEM), by energy dispersive x-ray (EDx) and by Raman spectroscopy (RS). The Raman spectrum was recorded using an argon ion laser Raman microprobe. The exciting laser wavelength is 632.81 nm with a laser power equal to 1.75 mW. The instrument was operated in the multi-channel mode with the beam focused to a spot diameter of approximately 2 pm. 

Transmission electron micrographs (TEM) can be performed to characterize the AuNPs. An example of TEM images is shown in Fig. 1. Fast Fourier Transform (FFT) of crystalline planes distances, UV-Vis spectrum and energy dispersive X-ray can be also employed to achieve a better characterization of the AuNP obtained (results not shown here). 

---