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Defect parameter

The major drawback of this identification method, as used to date, is that only a part of the useful information contained into original Bscan image, i.e. segmented Bscan image, is used for defect characterization. Moreover, it requires the availability of defect classification information (i.e. if the defect is volumetric or planar, e.g. a crack or a lack of fusion), which, generally, may be as difficult to obtain as the defect parameters themselves. Therefore, we... [Pg.171]

Figure 8 is a plot showing the effect of the defect parameter x on yield for 1, 5 and 10 mask levels. Note how rapidly chip yield decreases as the number of mask levels (L) increases. [Pg.177]

Work of Harding and coworkers has clearly established the value of defect entropy calculations using these methods. Moreover, we note that comparisons have been made between entropies and energies calculated using supercell and embedded crystallite techniques. It is reassuring that the techniques yield the same defect parameters for large sizes of the supercell and of the crystallite. [Pg.4535]

The first difficulty is more fundamental, and suggests that, in complex cases, more information is needed to determine quantum defect parameters completely than is available in a set of experimental transition energies. [Pg.93]

However, most calculations are not constant pressure, but constant volume calculations (strictly speaking constant lattice parameter but the distinction is not important here) performed on a static lattice. The relationship between constant pressure and constant volume defect parameters has been discussed extensively in the literature. The results are summarized by Catlow et al. (1981). The three most important are ... [Pg.187]

An example of the kinds of result obtainable can be seen in the work of Harding (1985) on calcium fluoride. The calculated defect parameters for the formation enthalpy and entropy of the anion Frenkel defect are 2.81 eV and 5.4k, respectively. This compares with the experimental values of Jacobs and... [Pg.189]

Figure 9 Plot of the mean friction force (/k) after passing the defect va the defect parameter h for three different shearons with different wave vector q (0/%)y q2 ( / ). and <73 fA/Aj before passing the defect, with q < qi < q. For clarity, symbols are shown only at defect parameters that are integer multiples ofOA, whereas the lines show all available data. The full symbols mark the mean friction force of the unperturbed case [Le. h = ] and hence of the initial shearons, whereas open symbols are used for all other values of h. The model parameters are ay = 1, aj = 0.5, P = 1, Yil =0.75, Yj = 0.75, A = 0.1,8 = 0.01,>.= 1, = 15. Wv = 0.02. Figure 9 Plot of the mean friction force (/k) after passing the defect va the defect parameter h for three different shearons with different wave vector q (0/%)y q2 ( / ). and <73 fA/Aj before passing the defect, with q < qi < q. For clarity, symbols are shown only at defect parameters that are integer multiples ofOA, whereas the lines show all available data. The full symbols mark the mean friction force of the unperturbed case [Le. h = ] and hence of the initial shearons, whereas open symbols are used for all other values of h. The model parameters are ay = 1, aj = 0.5, P = 1, Yil =0.75, Yj = 0.75, A = 0.1,8 = 0.01,>.= 1, = 15. Wv = 0.02.
Figure 9. For h < 0.29 [regime (i)] all shearons are scattered to the shearon with wave vector 3. When 0.29 h< 1.33 [regime (ii)] all shearons are scattered to the shearon with wave vector 2, except the region with h 1 [regime (Hi)], where the scattering depends on the initial shearon. For 1.33 < 1.67 [regime (iv)] all shearons are scattered to the shearon with wave vector q. For defect parameters h> 1.67 [regime (v)] one of the particles is stuck at the defect and the shearon is annihilated [6/]. Figure 9. For h < 0.29 [regime (i)] all shearons are scattered to the shearon with wave vector 3. When 0.29 h< 1.33 [regime (ii)] all shearons are scattered to the shearon with wave vector 2, except the region with h 1 [regime (Hi)], where the scattering depends on the initial shearon. For 1.33 < 1.67 [regime (iv)] all shearons are scattered to the shearon with wave vector q. For defect parameters h> 1.67 [regime (v)] one of the particles is stuck at the defect and the shearon is annihilated [6/].
Figure JO Plot of the particles density p after passing the defect vs position y—ycms nd time X for the three different shearons and different defect parameters h. In (a) (c) the three different shearons with wave vector q, q2> cmd q are shown for tfw unperturbed case [Le. /t = 1/. For h = 0.2, = 0.8, and h=. 5 the respective final shearons are identical for all three initial shearons and are shown in (df(f), respectively. The model parameters are = 1, aj = 0.5, P= 1, Yy =0.75, Yx =0.75, A = 0.1, e = 0.01, X= 1,... Figure JO Plot of the particles density p after passing the defect vs position y—ycms nd time X for the three different shearons and different defect parameters h. In (a) (c) the three different shearons with wave vector q, q2> cmd q are shown for tfw unperturbed case [Le. /t = 1/. For h = 0.2, = 0.8, and h=. 5 the respective final shearons are identical for all three initial shearons and are shown in (df(f), respectively. The model parameters are = 1, aj = 0.5, P= 1, Yy =0.75, Yx =0.75, A = 0.1, e = 0.01, X= 1,...
In this regime, the slight dependence of the mean friction on the defect parameter h is due to the fact that the mean friction force depends on which particle / is stuck at the defect The mean friction force is highest if the last particle [/ = 1] arriving at the defect is stuck, and it decreases the deeper the defect is and hence the earlier the embedded system is stuck. If the defect is deep enough [h > 2] so that already the first particle [/ = N] arriving at the defect is stuck, the mean friction force saturates. [Pg.112]

Processing parameters have to be set according to the mold cavity design and its size, materials properties, and the quality of molded product without defects. Parameters are a focus since an optimal processing parameter design could help to solve most quality control problems. [Pg.75]

NDE is the discipline used to assess the integrity of a system or component without compromising its performance. NDE uses sensors to acquire information about these objects and perform modeling and analysis to convert the information into materials and defect parameters for performance and in-service life prediction. Figure 6.39 illustrates the specific knowledge domains involved in NDE. The inspection of in-service systems can also be complicated by the fact that these systems often operate at relatively high temperature in a closed mode. [Pg.462]

A very simplified model for such a fractured rock is demonstrated below (Schon, 1973,1996). Starting with a cube of solid material, it is assumed that the effect of aU defects (fractures, cracks, grain boundaries, intra-granular defects, etc.) can be described by one defect parameter D (Fig. 6.40). [Pg.230]

Increasing pressure p results in a closure of fractures or—more generally—in a decrease of defects. With an exponential law (see Schon, 1996), the defect parameter as a function of pressure is... [Pg.231]

Do is the initial value of the defect parameter at the pressure p = 0, a expresses the compressional characteristic of the (fractured) rock. [Pg.231]

Track 4 gives the log-derived defect parameter D, calculated with Fp,soiid = 5800m/s (maximum measured value for the compact gneiss). The curve reflects a variation of rock quality. For comparison, the result of a visual geological classification from cores is plotted in Track 5. Sections with... [Pg.294]

The defect model (see Section 6.8.4) is a solid mineral block with a cut . Defects are characterized by their relative length D (defect parameter). For a dry rock in a first approximation, and using only linear terms, the decrease of parameters caused by the defects (fractures, cracks) can be described as follows compressional wave velocity ... [Pg.408]

KRO 84] KROGER FA., Experimental and calculated values of defect parameters and the defect structure ofa-Al203 , p. 100-118, in [KIN 84],... [Pg.230]


See other pages where Defect parameter is mentioned: [Pg.353]    [Pg.750]    [Pg.750]    [Pg.302]    [Pg.107]    [Pg.120]    [Pg.156]    [Pg.188]    [Pg.55]    [Pg.11]    [Pg.6127]    [Pg.193]    [Pg.108]    [Pg.662]    [Pg.663]    [Pg.663]    [Pg.463]    [Pg.294]    [Pg.295]    [Pg.373]   
See also in sourсe #XX -- [ Pg.302 ]




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