Cluster ion beams

A cluster ion beam, which is composed of atomic particles such as and Auj/, where n is the number of atoms in the cluster [7], or molecular ions such as OH and AlO, has attracted a great deal of interest in atomic physics [8,9] and in materials science [10]. The cluster ion beam has distinctive properties of vicinity effects caused in substances, which is... 

The result of intensity alternation for the boron nitride cluster ions is in accordance with the generation of high cluster ion beams MnXn, for several systems (e.g. NaCl, CuBr or Csl26 49) by other methods of cluster formation such as by quenching condensation in a cold rare gas or by ion bombardment of hahdes. 

LMIG filled with bismuth (or gold) has been developed for SIMS (especially employed in ToF-SIMS) measurements. This primary ion source provides cluster beams of Bi with n = 1-7 which allow higher secondary ion yields compared to gallium or indium LMIGs ° and is well suited for special applications (biological imaging). Bismuth cluster ion beams have much better... 

Coupling the ICR with a cluster ion beam now allows the study of larger cluster ions J. M. Alford, P. E. Williams, D. J. Trevor, and R. E. Smalley, Intemat. J. Mass Spec. Ion Phys. 72,33 (1986). 

Bourelle, E., Suzuki, A., Sato, A., Seki, T., and J. Matsuo. 2005. Sidewall polishing with a gas cluster ion beam for photonic device applications. Nuclear Instruments and Methods in Physics Research B 241 622-625. 

Insepov, Z., Hassanein, A., Norem, J., and D. R. Swenson. 2007. Advanced surface polishing using gas cluster ion beams. Nuclear Instruments and Methods in Physics Research B 261 664—668. 

Yamada, I., Matsuo, J., and N. Toyoda. 2003. Cluster ion beam process technology. Nuclear Instruments and... 

Moritani, K., Mukai, G., Hashinokuchi, M., Mochiji, K. (2009) Energy-dependent fragmentation of polystyrene molecule using size-selected Ar gas cluster ion beam projectile. Appl. Phys. Express, 2,046001. 

In the last decade, cluster ion sources have been frequently reported to be better than atomic ion sources for mass spectral analysis and imaging of organic and polymeric materials. A representative example of the secondary ion yield enhancement induced by the use of a cluster ion beam for the characterization of polymeric materials is presented in Figure 42.8 for the case of low MW PS, PS-2000 [137]. The results obtained for PS-2000 are representative of those obtained from the other studied polymers poly(ethylene terephthalate) (PET) and poly(tetrafluoroethylene) (FIFE). With respect to the more traditional Ga" projectiles, the mass spectra obtained with Ceo show a large increase in secondary ion yield. In comparison, the MWD was not even detectable in the mass spectra acquired with the 10 keV Ga" source. 

For completeness, it should be noted that other cluster ion beams, including C24H12+ and Cgo [370], giant glycerol [371], Ir4(CO)7+ [372], Au4oo [373], and Aruoo [374] also have potential for molecular depth profiling and some of them have already proved their ability in... 

Cheng, X, Wucher, A., Winograd, N. (2006) Molecular depth profiling with cluster ion beams. J. Phys. Chem. B, J JO, 8329-8336. 

Ninomiya, S., Ichiki, K., Yamada, H., Nakata, Y., Seki, T., Aoki,T., Matsuo, J. (2009) Precise and fast secondary ion mass spectrometry depth profihng of polymer materials with large Ar cluster ion beams. Rapid Commun. Mass Spectrom.,23,1601-1606. 

Winograd, N. 2005, Imaging mass spectrometry on the nanoscale with cluster ion beams, Anal. Chem., 6 328-333. 

Willingham, D., Kucher, A., Winograd, N. (2008) Molecular depth profiling and imaging using cluster ion beams with femtosecond laser postionization. Appl Surf Set, 255, 831-833. 

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