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Micrographs , back-scattering electron

Figure 2. SEM Back scatter electron micrograph of a straw ash/sand sample heated at 900 C for 6 hours. Dark areas are pores, middle grey are sand grains and light grey rims are the molten ash. [Pg.280]

Fig.l shows the back-scattered electron micrographs of the polished cross-section of Cf/SiC-BN composite. It is clear that though the inter-bundle matrix is dense, there are still some pores remaining in the intra-bundle areas. Such pores formed because of hindrance to impregnation of... [Pg.450]

Some physical and mechanical properties of composites with different fiber reinforcements were listed in table 1. Bulk density of composite with T700SC fibers (Sr, density 2.66 0.05g/cm )is some higher than that of composite with M40 fibers (Sm, density 2.47 0.05 g/cm ) though there is just little differences in the open porosities. This may be mainly caused by the different ZrC volume fractions in the composites. It can be observed from the back-scattered electron micrographs shown in Fig. 1 that the dispersion of ZrC particles... [Pg.68]

The surface analysis for morphology and average particle size was carried out with JEOL JSM 6301 F scanning electron microscope (SEM). The micrographs of the samples were observed at different magnifications under different detection modes (secondary or back-scattered electrons). [Pg.528]

Fig. 2.55 Scanning electron micrographs (SEM) in the back scattered electron (BSE) mode at 100,000x of the ABCR MgH + 5 wt.% n-Ni mixtures ball- S milled powder under 700 kPa hydrogen with varying SSA (see the insets in the pictures)... Fig. 2.55 Scanning electron micrographs (SEM) in the back scattered electron (BSE) mode at 100,000x of the ABCR MgH + 5 wt.% n-Ni mixtures ball- S milled powder under 700 kPa hydrogen with varying SSA (see the insets in the pictures)...
Furthermore, SEM micrographs, obtained with back-scattered electrons and reported in Figure 1, put in evidence the bright spots of the liquid phase having a higher average atomic number and... [Pg.22]

F jare 1. SEM micrographs of a polished section of an as received sample showing (a) fibres, Zr02 partieles and absence of porosity and (b) the same region of the sample in back scattered electrons (BSE) mode, identifying the (bright) Zr02 partieles. [Pg.178]

Figure 1. Typical SEM micrograph of Ti3(Si,AI)C2 (here Ti3(Si9o%AI o%)C2 with back-scattered electron imaging). Figure 1. Typical SEM micrograph of Ti3(Si,AI)C2 (here Ti3(Si9o%AI o%)C2 with back-scattered electron imaging).
Scanning electron microscopy micrographs taken in the normal mode do not always permit effective observation of features on fiber surfaces. Display modes such as deflection or Y modulation and imaging modes such as back-scattered electron imaging (BEI) can provide clearer contrast, as shown in Figs 5.5 and 5.6. Heat aging of polymer fibers can cause cyclic trimers and oligomers to diffuse to the fiber... [Pg.254]

Back-scattered scanning electron micrograph showing the gradation of AT distribution within the sample. Direction of infiltration is from right to left. [Pg.140]

Micrographs obtained by EPMA are shown in Figure 4. The sample in this case was VPO with 10% amorphous silica as the hard phase. This composition was prepared by spray drying an aqueous slurry with about 40% solids made of l-2 im particles of the VPO catalyst precursor and polysilicic acid. The back-scattered image shows all elements present in the porous microsphere. The X-ray image of silicon clearly shows this element concentrated exclusively on the periphery of the microsphere. Independent X-ray diffraction and electron diffraction analysis of the peripheral layer of the microspheres showed that the silicon is present as amorphous silica. [Pg.65]

Figure 11.18 (a) Optical micrograph of an abnormally grown twinned PMN-35PT ceramic with its 3-D shape (b) Electron-beam back-scattered diffraction analysis shows the crystallographic relationship between two domains in the twinned PMN-35PT ceramic. After Refs [77, 78]. [Pg.508]

Transmission electron micrographs revealed amorphous tracks which were formed by the high-energy irradiation. Rutherford back-scattering spectrometric results showed that the amorphous tracks enhanced Eu diffusion. The results could be described by ... [Pg.221]

Back-scattered scanning electron micrographs of cross-section of the specimens after laser treatment with different number of laser pulses (a) 10, (b) 25 and (c) 50 pulses (Coy et al., 2010). [Pg.258]


See other pages where Micrographs , back-scattering electron is mentioned: [Pg.242]    [Pg.87]    [Pg.242]    [Pg.87]    [Pg.152]    [Pg.547]    [Pg.19]    [Pg.22]    [Pg.556]    [Pg.189]    [Pg.143]    [Pg.591]    [Pg.35]    [Pg.479]    [Pg.243]    [Pg.591]    [Pg.106]    [Pg.4045]    [Pg.125]    [Pg.85]   
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Back-scattered electrons

Electron back scattering

Electron micrograph

Electron micrographs

Electron micrographs , back

Electrons scattered

Electrons scattering

Scattering electron micrographs

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