Electron back scattering

Another new and much used variant is a procedure called orientation imaging microscopy (Adams ci al. 199.5) patterns created by electrons back-scattered from a grain are automatically interpreted by a computer program, then the grain examined is automatically changed, and finally the orientations so determined are used to create an image of the polycrystal with the grain boundaries colour- or thickness-... 

The Sccmning Electron Microscope (SEM) is a standard imaging technique based on electron back-scattering from the sample surface. It analyses the surfaces of solid objects, producing images with the resolution which is about order of magnitude better than that of optical microscopy (typically 10 nm). The SEM avoids the problem of thin samples (TEM) but the SEM observation requires the deposition of a thin conductive metal film on the sample surface to prevent sample charging. 

The EAPFS cross section is monitored by variations in the intensity of electrons back - scattered from the surface. 

Moreover, the electron-phonon interactions in nanotubes are expected to be weak, due to the small area of the Fermi surface and the relatively large Fermi-wavelength, electronic back scattering from phonons is reduced compared with normal metals [149]. 

Presently, methods are being developed that focus on the use of superresolution confocal Raman microscopy (CRM), electron back-scattered diffraction (EBSD), and, in combination with high-resolution XRD, to identify and measure the stress distributions of structures and defects that control... 

Figure 7. The energy distribution contour map based on the Monte-Carlo simulation work depicted in Fig. 6. Increasing electron back scattering probability leads to a substantially distorted energy deposition pattern.

In Fe CEMS it is the 7.3 keV internally converted electrons which are normally detected but the 6.3 keV x-rays can also be used. The advantage of CEMS over normal Mossbauer studies is the nine-fold increse in the 7.3 keV electrons over the 14.4 keV y-rays. Secondly, these electrons are rapidly attenuated within the soUd which limits the probing depth of CEMS to 300 nm from the surface. For surface studies the back-scatter method is employed and one detects the conversion electrons back-scattered from the surface of the sample under study. However, it is possible by this technique to measure the y- and X-rays back-scattered following resonant absorption to increase probing depths to several microns. 

Spectroscopic measurements (intensity, phase of incident, and emitted photons), which yield chemical, electronic, structural, and thickness information, for example, by pho-ton/photon effects (e.g. ellipsometry) or photon absorption (e.g. reflectome-try) or structural information (e.g. from Extended X-ray absorption fine structure (EXAFS) or Electron Back Scatter Diffraction EBSD). 

POW] SEM, electron back scatter diffraction as cast, Fe - 3C - 20Cr and Fe - 4C - 20Cr mass%, M7C3... 

Electron back scattering diffraction (EBSD) provides information on phase compositions and structures at a microscopic level. The combination of... 

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