Auger spectroscopy advantages

Each type of mass spectrometer has its associated advantages and disadvantages. Quadrupole-based systems offer a fairly simple ion optics design that provides a certain degree of flexibility with respect to instrument configuration. For example, quadrupole mass filters are often found in hybrid systems, that is, coupled with another surface analytical method, such as electron spectroscopy for chemical analysis or scanning Auger spectroscopy. 

Auger spectroscopy (q.v.) is usually employed in the study of cleavage surfaces, but an advantage of XPS in such studies is that the chemical nature of elements segregating on the surface can be investigated. 

Four UHV spectroscopies used for the compositional and chemical analysis of surfaces are discussed. These are X-ray Photoemission, Auger Spectroscopy, Secondary Ion Mass Spectroscopy, and Ion Scattering (both low and high energy). Descriptions of the basic processes and information contents are given, followed by a comparative discussion of the surface sensitivities, advantages and disadvantages of each spectroscopy. 

The advantage of the magnetic bottle TOF-PEPECO technique relative to classical Auger spectroscopy, that it allows separate examination of the Auger... 

What are the advantages and disadvantages of ESCA as a method for analysis of surfaces 7 Compare ESCA with Auger spectroscopy. 

Three techniques (FEGSTEM/EDX, Auger spectroscopy and APT) provide information on grain boundary chemistry. There are advantages and disadvantages of each as summarised in Table 9.3. Assumptions are involved in the interpretation of data from each of the techniques and there have been relatively few studies in which two or more of these techniques have been applied to the same material conditions. 

This kind of estimation of the relative concentration is the most widely used method for quantitative EELS analysis. It is advantageous because the dependence on the primary electron current, Iq, is cancelled out this is not easily determined in a transmission electron microscope under suitable analytical conditions. Eurthermore, in comparison with other methods, e. g. Auger electron spectroscopy and energy-disper-... 

The most widely used techniques for surface analysis are Auger electron spectroscopy (AES), x-ray photoelectron spectroscopy (XPS), secondary ion mass spectroscopy (SIMS), Raman and infrared spectroscopy, and contact angle measurement. Some of these techniques have the ability to determine the composition of the outermost atomic layers, although each technique possesses its own special advantages and disadvantages. 

These experiments also show the value of NEXAFS as a technique for following the kinetics of surface processes. We have shown that experiments can be tailored so a specific reaction can be studied, even if gas evolution is not involved. This represents an advantage over thermal desorption experiments, where several steps may be required in order to desorb the products to be detected. Another advantage of NEXAFS is that rates are measured isothermally, so the kinetic parameters can be determined with accuracy. Finally, NEXAFS is not a destructive technique, so we need not to worry about modifying the surface compounds while probing the system, as would be the case with other techniques such as Auger electron spectroscopy. 

Although not capable of the micrometer-sized lateral resolutions available with the aforementioned techniques, the surface spectroscopy, electron spectroscopy for chemical analysis (ESCA), also deserves mention. The ESCA experiment involves the use of X-rays rather than electrons to eject core electrons (photoelectrons), and it has comparable surface specificity and sensitivity to that of Auger electron spectroscopy (AES) (25, 26, 29). The principal advantage of ESCA relative to AES is that small... 

Concerning the first advantage, one can as easily study reactions on a single crystal metal surface as on a planar surface generated to duplicate the properties of a supported metal catalyst, as described above. Furthermore, with planar surfaces, LEED, Auger and photoelectron spectroscopies, along with many other analytical methods of surface science, can provide characterization of the surface composition and structure. 

As a surface analytical tool, SIMS has several advantages over X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES). SIMS is sensitive to all elements and isotopes in the periodic table, whereas XPS and AES cannot detect H and He. SIMS also has a lower detection limit of 10 5 atomic percent (at.S) compared to 0.1 at.S and 1.0 at.% for AES and XPS, respectively. However, SIMS has several disadvantages. Its elemental sensitivity varies over five orders of magnitude and differs for a given element in different sample matrices, i.e., SIMS shows a strong matrix effect. This matrix effect makes SIMS measurements difficult to quantify. Recent progress, however, has been made especially in the development of quantitative models for the analysis of semiconductors [3-5]. 

Castle (LI, 12) and McIntyre (5) have shown how X-ray photoelectron spectroscopy (XPS or ESCA) can be applied to corrosion problems and uses of Auger electron spectroscopy (AES) in corrosion have been given by Clough (18, 19) and Thomas et al ( 0). Possible uses of ion beams in corrosion studies were presented by Deamaley (JU). Raman spectroscopy (.22, 23) and ellipsometry (19) are not discussed in detail in this paper, but they offer the advantage of allowing in situ measurements in a wide variety of corrosive environments. 

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