Atomic force microscopy principles

The very new techniques of scanning tunnelling microscopy (STM) and atomic force microscopy (AFM) have yet to establish themselves in the field of corrosion science. These techniques are capable of revealing surface structure to atomic resolution, and are totally undamaging to the surface. They can be used in principle in any environment in situ, even under polarization within an electrolyte. Their application to date has been chiefly to clean metal surfaces and surfaces carrying single monolayers of adsorbed material, rendering examination of the adsorption of inhibitors possible. They will indubitably find use in passive film analysis. 

McClelland, G. M., Erlandsson, R., and Chiang, S., Atomic Force Microscopy General Principles and a New Implementation," Review of Progress in Quantitative Nondestructive Evaluation,No. 6B, 1987, pp. 1307-1314. 

Figure 4.28 shows an example where STM recognizes the individual metal atoms in an alloy, thus revealing highly important structural information on the atomic level. The technique does not require a vacuum, and can in principle be applied under in situ conditions (even in liquids). Unfortunately, STM only works on well-defined, planar, and conducting surfaces such as metals and semiconductors, and not on oxide-supported catalysts. For the latter surfaces, atomic force microscopy offers better perspectives. 

Theoretical models based on first principles, such as Langmuir s adsorption model, help us understand what is happening at the catalyst surface. However, there is (still) no substitute for empirical evidence, and most of the papers published on heterogeneous catalysis include a characterization of surfaces and surface-bound species. Chemists are faced with a plethora of characterization methods, from micrometer-scale particle size measurement, all the way to angstrom-scale atomic force microscopy [77]. Some methods require UHV conditions and room temperature, while others work at 200 bar and 750 °C. Some methods use real industrial catalysts, while others require very clean single-crystal model catalysts. In this book, I will focus on four main areas classic surface characterization methods, temperature-programmed techniques, spectroscopy and microscopy, and analysis of macroscopic properties. For more details on the specific methods see the references in each section, as well as the books by Niemantsverdriet [78] and Thomas [79]. 

Atomic Force Microscopy Atomic force microscopy is a direct descendant of STM and was first described in 1986 [254], The basic principle behind AFM is straightforward. An atomically sharp tip extending down from the end of a cantilever is scanned over the sample surface using a piezoelectric scanner. Built-in feedback mechanisms enable the tip to be maintained above the sample surface either at constant force (which allows height information to be obtained) or at constant height (to enable force information to be obtained). The detection system is usually optical whereby the upper surface of the cantilever is reflective, upon which a laser is focused which then reflects off into a dual-element photodiode, according to the motion of the cantilever as the tip is scanned across the sample surface. The tip is usually constructed from silicon or silicon nitride, and more recently carbon nanotubes have been used as very effective and highly sensitive tips. 

We will discuss the operating principle of atomic force microscopy (AFM) and other scanning force microscopies in more detail in Chapter 7. At this point, simply think of this technique as analogous to an antiquated record player, in which the needle gently touches the surface of the record to produce music. Similarly, the AFM tip either gently taps, or hovers immediately above, the surface of a planar substrate. 

A new alternative to solve this problem is atomic force microscopy (AFM) which is an emerging surface characterization tool in a wide variety of materials science fields. The method is relatively easy and offers a subnanometer or atomic resolution with little sample preparation required. The basic principle involved is to utilize a cantilever with a spring constant weaker than the equivalent spring between atoms. This way the sharp tip of the cantilever, which is microfabricated from silicon, silicon oxide or silicon nitride using photolithography, mechanically scans over a sample surface to image its topography. Typical lateral dimensions of the cantilever are on the order of 100 pm and the thickness on the order of 1 pm. Cantilever deflections on the order of 0.01 nm can be measured in modem atomic force microscopes. 

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