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High-voltage electron microscopes

Lossinsky AS, Pluta R, Song MJ, Badmajew V, Moretz RC, Wisniewski HM (1991) Mechanisms of inflammatory cell attachment in chronic relapsing experimental allergic encephalomyelitis A scanning and high-voltage electron microscopic study of the injured mouse blood-brain barrier. Microvasc Res 41 299-310. [Pg.39]

Preparation of semithin sections (up to a few micrometers thick) by ultramicrotomy, and investigation of these sections in a 1000-kV, high-voltage electron microscope (HVEM) to reveal larger particles more precisely and, thus, the true particle-diameter distribution. [Pg.262]

We thank J. Heydenreich for giving us the opportunity to carry out the deformation tests in the 1000-kV high-voltage electron microscope of the Max-Planck-Institute of Microstructure-Physics. We gratefully acknowledge the financial support provided to J.-U. Starke by the Max-Buchner-Forschungsstiftung and the Deutsche Forschungsgemeinschaft. [Pg.283]

Landis WJ, Hodgens KJ, Arena J, Song MJ, McEwen BF (1996) Stmctural relations between collagen and mineral in bone as determined by high voltage electron microscopic tomography. Microscopy Res and Technique. 33 192-202... [Pg.664]

Steflik, D.E., Sisk, A.L., Parr, G.R. et al. 1993. Osteogenesis at the dental implant interface High voltage electron microscopic and conventional transmission electric microscopic observations. /. Biomed. Mater. Res. 27 791. [Pg.778]

Barnard, D. P., Turner. J. N., Frank, J., and McEwen, B. F. (1992). A 360 degree single-axis tilt stage for the high-voltage electron microscope. J. Microsc. (Oxford) 167, 39-48. [Pg.121]

McEwen, B. F., Arena, J. T.. Frank. J., and Rieder, C. L. (1993). Structure of the colcemid-treated PtKl kinetochore outer plate as determined by high voltage electron microscopic tomography. J. Cell Biol 120,301-312. [Pg.123]

Hamaoka T, Satoh Y and Matsui H (2010), One-dimensional motion of selfinterstitial atom clusters in A533B steel observed using a high-voltage electron microscope , / IVmc/ Mater, 399, 26-31. [Pg.208]

For the study of semiconductor devices, diffraction contrast images made in a high-voltage electron microscope (% 1000 kV) are often useful since thicker specimens can be tolerated than in a... [Pg.1107]

Provides an up-to-date collection of micrographs from the millimeter scale down to the micrometer and nanometer scale from all types of microscopes (optical microscope, scanning, and transmission electron microscopes (SEM and TEM), environmental scanning electron microscope, high-voltage electron microscope, atomic force microscope)... [Pg.6]

Michler GH, Dietzsch C. Investigation of crystalline polymeric solids at reduced beam damage in the high voltage electron microscope. CrystRes Technol 1982 17 1241-1254. [Pg.53]


See other pages where High-voltage electron microscopes is mentioned: [Pg.27]    [Pg.243]    [Pg.319]    [Pg.64]    [Pg.76]    [Pg.243]    [Pg.15]    [Pg.311]    [Pg.450]    [Pg.49]    [Pg.147]    [Pg.183]    [Pg.197]    [Pg.183]    [Pg.197]    [Pg.38]    [Pg.32]    [Pg.32]    [Pg.396]    [Pg.44]    [Pg.155]    [Pg.163]    [Pg.533]   


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