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Micrograph microscope

Liquid crystal phases possess characteristic textures when viewed in polarized light under a microscope. These textures, which can often be used to identify phases, result from defects in tire stmcture. Compendia of micrographs showing typical textures exist to facilitate phase identifications [37, 38]. These monographs also discuss tire origins of defect stmctures in some detail. [Pg.2551]

Fig. 10. Crack pinning by a SiC fiber in a glass matrix, photographed using an optical microscope and Nomarski contrast. Fiber ties perpendicular to plane of micrograph lines represent crack position at fixed intervals of time, crack mnning left to right. Fig. 10. Crack pinning by a SiC fiber in a glass matrix, photographed using an optical microscope and Nomarski contrast. Fiber ties perpendicular to plane of micrograph lines represent crack position at fixed intervals of time, crack mnning left to right.
Rossmann suggested that the canyons form the binding site for the rhi-novirus receptor on the surface of the host cells. The receptor for the major group of rhinoviruses is an adhesion protein known as lCAM-1. Cryoelectron microscopic studies have since shown that ICAM-1 indeed binds at the canyon site. Such electron micrographs of single virus particles have a low resolution and details are not visible. However, it is possible to model components, whose structure is known to high resolution, into the electron microscope pictures and in this way obtain rather detailed information, an approach pioneered in studies of muscle proteins as described in Chapter 14. [Pg.338]

Dislocations are readily visible in thin-film transmission electron micrographs, as shown in Figs. 20.28 (top) and 20.33 (top). The slip step (Fig. 20.31c) produced by the passage of a single dislocation is not readily apparent. However, for a variety of reasons, a large number of dislocations often move on the same slip plane or on bands of closely adjacent slip planes this results in slip steps which are very easily seen in the light microscope, as shown by the slip lines in Fig. 20.33 (bottom). [Pg.1266]

Figure 36-1. Electron micrograph of nucleosomes attached by strands of nucleic acid. (The bar represents 2.5 pm.) (Reproduced, with permission, from Oudet P, Gross-Bellard M, Chambon P Electron microscopic and biochemical evidence that chromatin structure is a repeating unit. Cell 1975 4 281.)... Figure 36-1. Electron micrograph of nucleosomes attached by strands of nucleic acid. (The bar represents 2.5 pm.) (Reproduced, with permission, from Oudet P, Gross-Bellard M, Chambon P Electron microscopic and biochemical evidence that chromatin structure is a repeating unit. Cell 1975 4 281.)...
Figure 48-6. Dark field electron micrograph of a proteoglycan aggregate in which the proteoglycan subunits and filamentous backbone are particularly well extended. (Reproduced, with permission, from Rosenberg L, Heilman W, Kleinschmidt AK Electron microscopic studies of proteoglycan aggregates from bovine articular cartilage. J Biol Chem 1975 250 1877.)... Figure 48-6. Dark field electron micrograph of a proteoglycan aggregate in which the proteoglycan subunits and filamentous backbone are particularly well extended. (Reproduced, with permission, from Rosenberg L, Heilman W, Kleinschmidt AK Electron microscopic studies of proteoglycan aggregates from bovine articular cartilage. J Biol Chem 1975 250 1877.)...
Figure 10. (a) Transmission-electron microscope micrograph of a self-assembled chain of 50 nm An particles functionalized with... [Pg.114]

The surface analysis for morphology and average particle size was carried out with JEOL JSM 6301 F scanning electron microscope (SEM). The micrographs of the samples were observed at different magnifications under different detection modes (secondary or back-scattered electrons). [Pg.528]

Recent developments have allowed atomic force microscopic (AFM) studies to follow the course of spherulite development and the internal lamellar structures as the spherulite evolves [206-209]. The major steps in spherulite formation were followed by AFM for poly(bisphenol) A octane ether [210,211] and more recently, as seen in the example of Figure 12 for a propylene 1-hexene copolymer [212] with 20 mol% comonomer. Accommodation of significant content of 1-hexene in the lattice allows formation and propagation of sheaf-like lamellar structure in this copolymer. The onset of sheave formation is clearly discerned in the micrographs of Figure 12 after crystallization for 10 h. Branching and development of the sheave are shown at later times. The direct observation of sheave and spherulitic formation by AFM supports the major features that have been deduced from transmission electron and optical microscopy. The fibrous internal spherulite structure could be directly observed by AFM. [Pg.275]

Precise thickness measurements by TEM require sections transverse to the basal lamellar surface. Conversely, only lamellae that can be identified as untilted "edge-on" or "flat-on" in AFM images are suitable for thickness analysis. The average thickness obtained by these techniques is based on sampling microscopic areas and will only be correct if the morphology is uniform in the sample. Micrographs taken from different areas of the specimen are usually studied, and statistical analysis of histograms used for quantitative analysis [255,256]. [Pg.284]

Fig. 1. Electron micrograph of ultrathin platinum film average platinum density 0.12 jug cm-2, deposited on mica in UHV at 275°C. Film catalyst used in reaction of n-hexane at 275°C before microscopic examination. Micrograph obtained by direct transmission through mica sliver. (X400,000). Fig. 1. Electron micrograph of ultrathin platinum film average platinum density 0.12 jug cm-2, deposited on mica in UHV at 275°C. Film catalyst used in reaction of n-hexane at 275°C before microscopic examination. Micrograph obtained by direct transmission through mica sliver. (X400,000).
In all films there is a distribution of crystallite diameters. An example is shown in Fig. 2 for the film with a specific weight of 0.12 fig cm-2. The smallest particles whose diameters can be measured in a micrograph (and then only very approximately) have diameters of about 10 A, and this is the lower size limit used in Fig. 2. However, particles smaller than this can readily be observed in the micrograph, and there is no doubt that this type of film contains some crystallites down to the limit of microscopic resolution (about 8 A in our case), and presumably beyond. However, their number appears to be relatively small. It is interesting to compare the specific film weight of these ultrathin platinum films with the amount of platinum per unit actual surface area of support for typical supported platinum catalysts. A typical supported catalyst would have 1% (w/w) of platinum on a... [Pg.7]

TEM Studies. Electron micrographs were obtained on JE0L, TEMSCAN --100 CX11 combined electron microscope and a HITACHI H1M1B (TEM) operated at 2 x 10 magnification. The specimens for TEM were obtained by placing a drop of the colloid solution on a copper grid coated by a carbon film. [Pg.261]

Nitrogen adsorption was performed at -196 °C in a Micromeritics ASAP 2010 volumetric instrument. The samples were outgassed at 80 °C prior to the adsorption measurement until a 3.10 3 Torr static vacuum was reached. The surface area was calculated by the Brunauer-Emmett-Teller (BET) method. Micropore volume and external surface area were evaluated by the alpha-S method using a standard isotherm measured on Aerosil 200 fumed silica [8]. Powder X-ray diffraction (XRD) patterns of samples dried at 80 °C were collected at room temperature on a Broker AXS D-8 diffractometer with Cu Ka radiation. Thermogravimetric analysis was carried out in air flow with heating rate 10 °C min"1 up to 900 °C in a Netzsch TG 209 C thermal balance. SEM micrographs were recorded on a Hitachi S4500 microscope. [Pg.390]

Fig. 20. Optical micrograph, lOOOx, taken with a metalographic microscope of CdTe deposits. The good deposit is on the left, and was produced using reasonable potentials. The bad deposit is on the right, and was produced with a program where the potential for Te was excessively negative, leading to roughening of the deposit, and what is referred to here as sand, due to its appearance in the microscope. Fig. 20. Optical micrograph, lOOOx, taken with a metalographic microscope of CdTe deposits. The good deposit is on the left, and was produced using reasonable potentials. The bad deposit is on the right, and was produced with a program where the potential for Te was excessively negative, leading to roughening of the deposit, and what is referred to here as sand, due to its appearance in the microscope.
A common feature of anorthite crystals in Allende Type B inclusions is large variations (up to a factor of -v 5) in Mg content on a scale of 10 to 50 pm. (Mg variability and its correlation with Na content and cathodoluminescence color are discussed extensively in [12].) Guided by cathodoluminescence micrographs, we used the microscopic spatial resolution of the ion-probe to measure the Mg isotopic composition at several points with distinct 27Al/24Mg ratios within individual crystals from TS-21 and TS-23. Data from each individual crystal define an... [Pg.120]


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Atomic force microscope micrographs

Scanning electron microscope/microscopy micrograph

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