Atomic cantilever

AFM Atomic force microscopy [9, 47, 99] Force measured by cantilever deflection as probe scans the surface Surface structure... 

To enable an atomic interpretation of the AFM experiments, we have developed a molecular dynamics technique to simulate these experiments [49], Prom such force simulations rupture models at atomic resolution were derived and checked by comparisons of the computed rupture forces with the experimental ones. In order to facilitate such checks, the simulations have been set up to resemble the AFM experiment in as many details as possible (Fig. 4, bottom) the protein-ligand complex was simulated in atomic detail starting from the crystal structure, water solvent was included within the simulation system to account for solvation effects, the protein was held in place by keeping its center of mass fixed (so that internal motions were not hindered), the cantilever was simulated by use of a harmonic spring potential and, finally, the simulated cantilever was connected to the particular atom of the ligand, to which in the AFM experiment the linker molecule was connected. 

Fig. 5. Block diagram of contact atomic force microscope system in which cantilever deflection monitored optically with position-sensitive photodiode...

All this being said, perhaps the most definitive study of the relative roles of electrostatic and van der Waals forces was performed by Gady et al. [86,101,102]. In their studies, they attached a spherical polystyrene particle, having a radius between 3 and 6 p.m, to the cantilever of an atomic force microscope. They then conducted three distinct measurements that allowed them to distinguish between electrostatic and van der Waals forces that attracted the particle to various conducting, smooth substrates. 

Chui, B.W., Stowe, T.D., Kenny, T.W., Mamin, H.J., Terris, B.D. and Rugar, D., Lowstiffness silicon cantilevers for thermal writing and piezoresistive readback with the atomic force microscope. Appl. Phys. Leu., 69(18), 2767-2769 (1996). 

Binnig et al. [48] invented the atomic force microscope in 1985. Their original model of the AFM consisted of a diamond shard attached to a strip of gold foil. The diamond tip contacted the surface directly, with the inter-atomic van der Waals forces providing the interaction mechanism. Detection of the cantilever s vertical movement was done with a second tip—an STM placed above the cantilever. Today, most AFMs use a laser beam deflection system, introduced by Meyer and Amer [49], where a laser is reflected from the back of the reflective AFM lever and onto a position-sensitive detector. 

According to the distance from probe to the sample, three operation modes can be classified for the AFM. The first and foremost mode of operation is referred to as contact mode or repulsive mode. The instrument lightly touches the sample with the tip at the end of the cantilever and the detected laser deflection measures the weak repulsion forces between the tip and the surface. Because the tip is in hard contact with the surface, the stiffness of the lever needs to be less than the effective spring constant holding atoms together, which is on the order of 1 — 10 nN/nm. Most contact mode levers have a spring constant of <1 N/m. The defection of the lever can be measured to within 0.02 nm, so for a typical lever force constant at 1 N/m, a force as low as 0.02 nN could be detected [50]. 

Therefore, for a rough surface, although it is smooth macro-scopically, the friction coefficient is greatly affected by its surface morphology. For a smooth surface on atomic scale, 0 can be neglected and the friction coefficient is only related to the twist angle of the cantilever. 

Recent advances of the Seeman group led to the construction of a nanomechanical device from DNA [89]. In this molecular apparatus, the ion-dependent transition of B-DNA into the Z-conformation is used to alter the distance between two DNA DX domains attached to the switchable double helix. Atomic displacements of about 2-6 nm were attained. Ionic switching of nanoparticles by means of DNA supercoiling has also been reported [53]. Additional advances regarding the use of DNA is nanomechanical devices have been reported by Fritz et al., who showed that an array of cantilevers can be used to... 

Atomic force microscopy (AFM) or, as it is also called, scanning force microscopy (SFM) is based on the minute but detectable forces - of the order of nano Newtons -between a sharp tip and atoms on the surface. The tip is mounted on a flexible arm, called a cantilever, and is positioned at a subnanometre distance from the surface. If the sample is scanned under the tip in the x-y plane, it feels the attractive or repulsive force from the surface atoms and hence it is deflected in the z-direction. The deflection can be measured with a laser and photo detectors as indicated schematically in Fig. 4.29. Atomic force microscopy can be applied in two ways. 

Figure 4.29. Experimental set-up for atomic force microscopy. The sample is mounted on a piezo electric scanner and can be positioned with a precision better than 0.01 nm in thex, y, and z directions. The tip is mounted on a flexible arm, the cantilever. When the tip is attracted or repelled by the sample, the deflection of the cantilever/tip assembly is...

Figure 3.2 The essential elements of an atomic force microscope. The sample is moved beneath a tip mounted on a cantilever a laser beam reflected off the back of the tip and on to a photodiode amplifies deflections of the cantilever.

Atomic force microscopy (AFM) is a variant of STM and was introduced in 1986 by Binnig et al. (11). AFM belongs to a family of near-field microscopies and is capable of imaging a wide variety of specimens surface down to an atomic scale. The technique employs a probe (pyramidal tip) mounted at the end of a sensitive but rigid cantilever (see Fig. 2). The probe is drawn across the specimen under very light mechanical loading (1). Measurements of the probe s interaction with the sample s surface are accomplished with a laser beam reflected from the cantilever. 

Figure 7.14 Experimental set-up for atomic force microscopy. The sample is mounted on a piezoelectric scanner and can be positioned with a precision better than 0.01 nm in the x, y, and z direction. The tip is mounted on a flexible arm the cantilever. When the tip is attracted or repelled by the sample, the deflection of the cantilever/tip assembly is measured as follows. A laser beam is focussed at the end of the cantilever and reflected to two photodiodes, numbered 1 and 2. If the tip bends towards the surface, photodiode 2 receives more light than 1, and the difference in intensity between 1 and 2 is a measure of the deflection of the cantilever and thus of the force between the sample and the tip. With four photodiodes, one can also measure the sideways deflection of the tip, for example at an edge on the sample surface.

Chen et al. (2007) have developed a nanoinjector that injects compounds immobilized on MWNT-atomic force microscopy (AFM) tips into the cells. First, a MWNT-AFM tip was fabricated from a normal AFM tip with an MWNT on one end. Next, a compound of interest was immobilized on the MWNT-AFM tip through a disulfide bond linkage. After MWNT-AFM tip was tapped on the cell, the cantilever was further lowered and the MWNT nanoneedle then penetrated the membrane. Once inside the cell, the disulfide linkage was broken under the cells reducing environment and the compound of interest was released inside the cell. The MWNT-AFM tip was then removed from the cell. In this study, protein was... 

The AFM [7] uses a sharp tip mounted at the end of a flexible cantilever to probe a number of properties of the sample, including its topographical features and its mechanical characteristics. Interaction forces, both attractive and repulsive, between atoms on the AFM tip and atoms on the sample cause deflections of the flexible cantilever (for a detailed description of the interaction forces sensed by the AFM, see Ref. [8]). These deflections are registered by a laser beam reflected off of the back of the cantilever onto a photodiode position detector (Fig. la) ... 

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