Area - depth method

It is clear that if the area - depth method had been applied to the above example, it would have led to a gross over-estimation of STOMP. It would also have been impossible to target the best developed reservoir area with the next development well. 

Keywords deterministic methods, STOllP, GllP, reserves, ultimate recovery, net oil sands, area-depth and area-thickness methods, gross rock volume, expectation curves, probability of excedence curves, uncertainty, probability of success, annual reporting requirements, Monte-Carlo simulation, parametric method... 

Connecting the measured points will result in a curve describing the area - depth relationship of the top of fhe reservoir. If we know the gross thickness (H) from logs we can establish a second curve representing the area - depth plot for the base of the reservoir. The area between the two lines will equal the volume of rock between the two markers. The area above the OWC is the oil bearing GRV. The other parameters to calculate STOIIP can be taken as averages from our petrophysical evaluation (see Section 5.4.). Note that this method assumes that the reservoir thickness is constant across the whole field. If this is not a reasonable approximation, then the method is not applicable, and an alternative such as the area - thickness method must be used (see below). 

During the optical coat work stress examination method the upper plate of the head of some of the bolts was covered with an optical coat work (Fig. 4). On the head of some other bolts strain gauges were stuck which measured the plain biaxial stress state in the middle of the top surface of the head of the bolt (3.5 x 3 mm). The magnetic probe detected average stresses up to 0.1 mm depth in an area of 14 mm diameter in the middle of the head of the bolt. 

The technological importance of thin films in snch areas as semicondnctor devices and sensors has led to a demand for mechanical property infonnation for these systems. Measuring the elastic modnlns for thin films is mnch harder than the corresponding measurement for bnlk samples, since the results obtained by traditional indentation methods are strongly perturbed by the properties of the substrate material. Additionally, the behaviour of the film under conditions of low load, which is necessary for the measnrement of thin-film properties, is strongly inflnenced by surface forces [75]. Since the force microscope is both sensitive to surface forces and has extremely high depth resolntion, it shows considerable promise as a teclnhqne for the mechanical characterization of thin films. 

FIG. 18-85 Depth correction factorto he applied to unit areas determined with Wilhelm-Naide and direct methods. Velocity ratio calculated using tangents to settling cun e at a particular settled solids concentration and at start of test. 

In this last chapter we cover techniques for measuring surfece areas, surfece roughness, and surface and thin-fdm magnetism. In addition, the effects that sputter-induced surface roughness has on depth profiling methods are discussed. 

Like XPS, the application of AES has been very widespread, particularly in the earlier years of its existence more recently, the technique has been applied increasingly to those problem areas that need the high spatial resolution that AES can provide and XPS, currently, cannot. Because data acquisition in AES is faster than in XPS, it is also employed widely in routine quality control by surface analysis of random samples from production lines of for example, integrated circuits. In the semiconductor industry, in particular, SIMS is a competing method. Note that AES and XPS on the one hand and SIMS/SNMS on the other, both in depth-profiling mode, are complementary, the former gaining signal from the sputter-modified surface and the latter from the flux of sputtered particles. 

While the term adequacy is a little vague it should be taken as meaning that the document is fit for its purpose. If the objective is stated in the document, does it fulfill that objective If it is stated that the document applies to a certain equipment, area, or activity, does it cover that equipment, area, or activity to the depth expected for such a document One of the difficulties in soliciting comments to documents is that you will gather comments on what you have written but not on what you have omitted. One useful method is to ensure that the procedures requiring the document specify the required content so that the reviewers can check the document against an agreed standard. 

Depending on the depth and location of the coalbed and the geology of the surrounding area, coal can be mined using either surface nr undergi ound methods. In the United States, coal is usually mined undcr-gi ound if the depth of the deposit exceeds 200 ft. 

The basis of Method II may be deduced from Figure 6-3. To do this, let us consider the ideal case, in which the x-rays involved are monochromatic, all influences of composition are absent, the simplest x-ray optics obtain, and excitation of a characteristic line in the film by a characteristic line of the substrate does not occur. Suppose now that a beam of intensity Iq falls upon a metal film d cm thick to excite a characteristic line of intensity Id- The contribution to Id of a volume element of constant area and of thickness dx, located at depth x, is... 

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