A scanning probe

There are many other experiments in which surface atoms have been purposely moved, removed or chemically modified with a scanning probe tip. For example, atoms on a surface have been induced to move via interaction with the large electric field associated with an STM tip [78]. A scaiming force microscope has been used to create three-dimensional nanostructures by pushing adsorbed particles with the tip [79]. In addition, the electrons that are tunnelling from an STM tip to the sample can be used as sources of electrons for stimulated desorption [80]. The tuimelling electrons have also been used to promote dissociation of adsorbed O2 molecules on metal or semiconductor surfaces [81, 82]. 

A scanning-probe microscope consists of a sharply pointed object, preferably so sharp that its tip is a sin-... 

FIGURE 9.16 Resilience values for chlorobutyl rubber (CIIR), butadiene rubber (BR), unfilled natural rubber (NR), filled natural rubber (SRB), and polyurethane (PU) samples tested using a Shore rebound resibometer, an Instron compression tester and a scanning probe microscope (SPM). (From Huson, M.G. and Maxweb, J.M.,... 

Huson, M.G. and Maxwell, J.M., The measurement of resilience with a scanning probe microscope, Polym. Test., 25(1), 2-11, 2006. 

FIGURE 10.1 Basic principle of a scanning probe microscope (SPM). 

When we use a scanning probe microscope, do we see atoms directly or do we see them only indirectly ... 

Why is it not possible for a scanning probe microscope to make images of the inside of an atom ... 

Near-field Raman imaging with a scanned probe has been reported [18, 19]. However, the technique is painfully slow (5-10 h, even for strong scatterers) and it has found very little use. Acquisition time can be decreased by using a polystyrene bead as a very high numerical aperture immersion lens. Working at 532 nm, Kasim et al. used a 60x/1.2 immersion aperture as an optical tweezer to simultaneously position the bead and operate it as a high NA lens [20]. They obtained a spatial resolution of about 80 nm on doped silicon with a few minutes scan time (Fig. 5.1). However, because of the need for a relatively smooth surface and a very intense scatterer, this technique is not likely to find much application in biomedical or pharmaceutical applications [21, 22],... 

Hund M, Herold H (2007) Design of a scanning probe microscope with advanced sample treatment capabilities an atomic force microscope combined with a miniaturized inductively coupled plasma source. Rev Sci Instrum 78(6) 063703... 

Fig. 1. The principle of a scanning probe microscope. The sample surface is scanned line by line with a probe by using a fine positioning system (scanner). With a coarse positioning device, the distance between the sample and the probe is stepwise reduced until the interaction regime is reached and the fine positioning system rules the scanning of the surface. The vibration isolation shields the micrscope from external vibrations.

Near-field scanning optical microscopy is a scanning probe technique that enables optical measurements to be conducted with very high spatial resolution [7-9]. NSOM overcomes the diffraction barrier that restricts the spatial resolution in conventional optical measurements and provides both optical and topographical information on samples with nanometric spatial resolution. 

Recently, another approach was used where virgin (unprocessed arc produced) MWNTs were attached to the tip of a scanning probe microscope and then lowered into liquid metal to establish electrical contact [166] (Fig. 33). These... 

Raman scattering spectroscopy integrated in a scanning probe microscope is effective and nondestructive method for analysis of the structural state, size and depth distribution of the silicon nanoinclusions in dielectric matrices. Average diameter of the nc-Si and compressive stresses obtained from Raman measurements are in good agreement with the TEM data and theoretical stress estimation. 

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