Titanium depth profile

Fig. 12. Auger electron spectroscopy (AES) sputter-depth profile of CAA-treated titanium after various exposure.s in vacuum (a) as anodized, (b) 450°C for 1 h, and (c) 7(X)°C for 1 h. The sputter etch rate is 1.5 nm/min. The line indicates the original interface. The arrow denotes oxygen diffused into the substrate. Adapted from Ref. [51].

Another consideration is the natural line width and satellite structure of the x-ray line used. Titanium (TiKa=4510.9 eV) has seen limited use (12) for non-destructive depth profiling, but the observed spectra are complicated by the TiKa satellite structure and the large natural line width of 2.0 eV (13). 

A quite different application of GDMS is the measurement of hydrogen and deuterium concentration, including depth profile analysis, e.g. in a gold electroplated layer on a CuSn substrate as described in reference.116 The relative sensitivity coefficient of hydrogen was evaluated by measurements of titanium standard reference material. 

The relationship between the depth profiles of the metal ions of the metal ion-implanted titanium oxide photocatalysts having the same number of metal... 

Figure 10 Effect of the depth profile of V ions in the V-ion-implanted titanium oxide photocatalyst on their photocatalytic reactivity for the decomposition of NOx under visible light (X > 450 nm) irradiation at 295 K.

The application of LA-ICP-ToF-MS and LA-ICP-QMS for depth profiling of various titanium based coatings on steel and tungsten carbide and Ti based single layers is discussed in references respectively. Thickness determination was performed by LA-ICP-QMS with 5% RSD, a laser ablation rate of < 100 nm per laser shot (Nd-YAG laser at wavelength 266 nm using a laser energy of 1.5 ml at 120 p,m laser spot size), and a depth resolution of 2.5 p-m was observed. ... 

Most recent applications of GD-AES are concerned with surface analysis — mainly depth profiling — of anodic alumina films [273], painted coatings [274], titanium carbide... 

Figure 7.23 XPS Depth profile of a titanium surface coated with calcium phosphate which contains Ca, P, and O. C in the profile is from surface contamination.

Figure 5 Depth profiles of (A) dissolved scandium in the central North Pacific (solid symbols 28°N 122°W Spencer ef a/., 1970) and in the western North Atlantic (open symbols 36°N 68°W Brewer ef a/., 1972), and (B) dissolved titanium in the North Pacific (solid symbols 50°N 145°W Orians ef a/., 1990) and the western North Atlantic (32°N 64°W Orians efa/., 1990).

Figure 7.46 A GD depth profile of a titanium nitride coating on steel. TiN is a hard, brittle material often used to modify the surface of steel. The quantitative depth profile software on this system can verify the stoichiometry of the coating layer. [Courtesy of LECO Corporation, St. Joseph, MI (www.leco.com).]...

Figure 9. Auger depth profiles of (A) DA and (B) CAA pretreated titanium alloy adherends (10).

FIGURE 14.1.15 Depth profiles of Auger electron spectroscopy of the surface of titanium metal before (a) and after soaking in 5.0M—NaOH solution for 24h (b) and subsequent heat treatment at 600° C for 1 h (c). 

FIGURE 12. (a) The Ti 2p peak from oxidized titanium as a function of sputter time. The oxide film is Ti02, but ion bombardment causes a reduction to a lower oxidation state. Metallic Ti from the substrate begins to appear midway in the sputtering, (b) Sputter depth-profile, showing stoichiometric Ti02 at the surface but an apparent decrease in the 0/Ti ratio in the film. The broadness of the interface is caused by a very rough surface. (From Reference 32.)... 

FIGURE 16. Sputter depth-profiles of both sides of propagated crack in a titanium adhesive system. The depth profiles allow the locus of failure to be fixed at or near the oxide-metal interface. (From Reference 86.)... 

Depth profiles of one or both sides of the failure may also be helpful, or even necessary, depending on the situation. Figure 16 shows an example of an interfacial or near-interfacial failure between the oxide and the titanium adherend. Because the freshly exposed metal surface oxidized immediately, the initial surface spectra could not distinguish between the interfacial failure and a failure entirely within the oxide.<86,87) Depth profiles may also be needed in the analysis of complex structures, such as those comprising many layers. In these cases, the sample interface chemistry might occur at several different points. However, a profile through several layers should allow the specific locus of failure to be identified.<87)... 

One characteristic of CAA oxides is that they contain significant amounts of fluorine. Sputter depth-profiles obtained by Auger electron spectroscopy(53,5s,65) show a buildup of fluorine in the barrier layer. Although adsorbed fluorine is considered detrimental to aluminum adhesive bonds (as discussed earlier in Section 2.4),( 2) CAA titanium oxides exhibit remarkable bond durability, probably because the fluorine is incorporated into the oxide rather than adsorbed onto it. 

An XPS depth profile (Fig. 8.4) of the particle-rich region indicates that an elemental percentage of titanium of about 11% at the outer surface, decreases gradually over a thickness of approximately 100-150 nm. The aluminium signal corresponds to the aluminium present in the aluminium oxide of the anodic film and reveals some defects in the polyaniline-Ti02 layer of the outer part of the anodic film. This aluminium is not related to the substrate aluminium, and thus it does not indicate the presence of defects that allow the electrons coming from the substrate. 

The biological pump influences, to varying degrees, the distribution of many elements in seawater besides carbon, nitrogen, phosphorus, and silicon. Barium, cadmium, germanium, zinc, nickel, iron, selenium, yttrium, and many of the REEs show depth distributions that very closely resemble profiles of the major nutrients. Additionally, beryllium, scandium, titanium, copper, zirconium, and radium have profiles where concentrations increase with depth, although the correspondence of these profiles with nutrient profiles is not as tight (Nozaki, 1997). 

On 7 April 1989, a fire broke out in the stem section of the Komsomolets nuclear submarine. The submarine sank to a depth of 1685 m at 73°43T6"N, 13°15 52"E, near the south-west of Bear Island. The site is about 300 nautical miles from the Norwegian coast. The wreck contains one nuclear reactor and two nuclear warheads, one of which was fractured. The radionuclide inventory includes 1.5 PBq Sr, 2 PBq Cs, about 16 TBq " Pu in the two warheads and 5 TBq of actinides in the reactor s core. During June/July 1994, an international expedition to the Komsomolets site at the request of the Russian Federation was organised. The objectives of the scientific cmise on board the R/V Mstislav Keldysh were to close nine door holes, including torpedo tubes, by capping them with titanium metal cover caps, and to sample and monitor for ambient radioactivity. A series of 280-600 1 sea-water samples collected in profile, a suite of surface sediments and cores and various biota samples were returned to lAEA-MEL for analysis. The results showed that a very limited leakage of caesium and tritium had occurred from the submarine. 

Titanium (Ti) exists in the + 3 oxidation state as the neutral oxyhydroxide, TiO(OH)2, in sea water. Dissolved titanium ranges from 4 to 300 pmol with the lowest values in the surface waters of the North Pacific and the highest values in the deep waters. Vertical profiles of dissolved titanium in the Pacific show a minimum in the surface waters, with gradually increasing concentrations with depth to a maximum at the bottom. Dissolved titanium concentrations in surface waters range from 4 to 8 pmol 1 in the North Pacific, from 50 to 100 pmol... 

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