Laser-induced photoelectron ionisation

Impurity inclusions and surface defects are a cause of many difficulties to the polymer producer and user. Equipment used for studying these phenomena discussed in Chapter 4 include electron microprobe x-ray emission/spectroscopy, NMR micro-imaging, various forms of surface infrared spectroscopy, e.g., diffusion reflection FTIR, ATR, also photoacoustic spectroscopy and x-ray diffraction - infrared microscopy of individual polymer fibres. Newer techniques such as scanning electron microscopy (SECM), transmission electron microscopy, time of flight secondary ion mass spectrometry (TOFSIMS), laser induced photoelectron ionisation with laser desorption, atomic force microscopy and microthermal analysis are discussed. [Pg.2]

Laser-Induced Photoelectron Ionisation with Laser Desorption... [Pg.186]

Schrimmer and Li [50] carried out surface analysis of bulk polymers using laser-induced photoelectron ionisation (LIPI) with laser desorption in a ToFS. In this method the... [Pg.186]

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