Thin textured

Black Nightshade is a low-branching annual, 1 to 2 tall with triangular stems that bear oval, thin-textured, alternate leaves with wavy margins. The tiny white flowers, borne in drooping clusters on lateral stalks between the leaves, resemble tomato flowers. The berry fruit is green when immature, purplish-black when ripe. 

JISA6906 Wall coatings for thin textured finishes... 

The formation of the perovskite phase requires heat treatment of the precipitate or gel. The organic components are removed between 200 and 400 °C and the metallic elements segregate as oxides (Y2O3, CuO) and carbonate Ba2C03. Since the small size of the particles causes short-range heterogeneities only, crystallization of the perovskite occurs around 850-900°C [134.135]. These methods are interesting in the fabrication of thin textured films. 

Coercivity of Thin-Film Media. The coercivity ia a magnetic material is an important parameter for appHcations but it is difficult to understand its physical background. It can be varied from nearly zero to more than 2000 kA/m ia a variety of materials. For thin-film recording media, values of more than 250 kA / m have been reported. First of all the coercivity is an extrinsic parameter and is strongly iafluenced by the microstmctural properties of the layer such as crystal size and shape, composition, and texture. These properties are directly related to the preparation conditions. Material choice and chemical inborn ogeneties are responsible for the Af of a material and this is also an influencing parameter of the final In crystalline material, the crystalline anisotropy field plays an important role. It is difficult to discriminate between all these parameters and to understand the coercivity origin ia the different thin-film materials ia detail. 

The determination of particle size and stmctural iaformation for fibers and polymers, and the study of stress, texture, and thin films are appHcations that are growing ia importance and can be examined with x-ray iastmments. 

X-ray diffraction consists of the measurement of the coherent scattering of x-rays (phenomenon 4 above). X-ray diffraction is used to determine the identity of crystalline phases in a multiphase powder sample and the atomic and molecular stmctures of single crystals. It can also be used to determine stmctural details of polymers, fibers, thin films, and amorphous soflds and to study stress, texture, and particle size. 

As we have seen, the orientation of crystallites in a thin film can vary from epitaxial (or single crystalline), to complete fiber texture, to preferred orientation (incomplete fiber texture), to randomly distributed (or powder). The degree of orientation not only influences the thin-film properties but also has important consequences on the method of measurement and on the difficulty of identifying the phases present in films having multiple phases. 

Other excellent methods of phase identification include TEM and electron diffraction. These may be more useful for low-Z materials, ultrathin films, and for characterizing small areas, including individual grains. For multiphase films with incomplete texture, these methods and XRD are complementary, since in commonly used geometries, they probe atomic planes perpendicular and parallel to the thin film surface, respectively. 

The film thickness of epitaxial and highly textured thin films can be measured with XRD. Close to the usual or primary difftaction peaks there are secondary or subsidiary maxima in the difftacted intensity (see Figure 6), which are due to the finite film thickness. The film thickness is inversely proportional to the spacing between these maxima and is easily calculated. X-ray reflectivity is another accurate method for measuring a film s thickness. 

Strained set of lattice parameters and calculating the stress from the peak shifts, taking into account the angle of the detected sets of planes relative to the surface (see discussion above). If the assumed unstrained lattice parameters are incorrect not all peaks will give the same values. It should be borne in mind that, because of stoichiometry or impurity effects, modified surface films often have unstrained lattice parameters that are different from the same materials in the bulk form. In addition, thin film mechanical properties (Young s modulus and Poisson ratio) can differ from those of bulk materials. Where pronounced texture and stress are present simultaneously analysis can be particularly difficult. 

Another recently discovered form of epitaxy is graphoepitaxy (Geis et al. 1979). Here a non-crystalline substrate (often the heat-resistant polymer polyi-mide, with or without a very thin metallic coating) is scored with grooves or pyramidal depressions the crystalline film deposited on such a substrate can have a sharp texture induced by the geometrical patterns. More recently, this has been tried out as an inexpensive way (because there is no need for a monocrystalline substrate) of preparing oriented ZnS films for electroluminescent devices (Kanata et al. 1988). 

Ultrafiltration utilizes membrane filters with small pore sizes ranging from O.OlS t to in order to collect small particles, to separate small particle sizes, or to obtain particle-free solutions for a variety of applications. Membrane filters are characterized by a smallness and uniformity of pore size difficult to achieve with cellulosic filters. They are further characterized by thinness, strength, flexibility, low absorption and adsorption, and a flat surface texture. These properties are useful for a variety of analytical procedures. In the analytical laboratory, ultrafiltration is especially useful for gravimetric analysis, optical microscopy, and X-ray fluorescence studies. 

R. W. Smith. A kinetic Monte Carlo simulation of fiber texture formation during thin-film deposition. J Appl Physics 57 1196, 1997. 

The texture and drying properties of the paint are important. If it is too thin it will leave the peaks of the matt coating uncovered and if too thick, gas will be trapped in the valleys giving a tendency to blister. In view of the... 

Textured Tin Oxide Films Produced by Atmospheric Pressure Chemical Vapor Deposition from Tetramethyltin and Their Usefulness in Producing Light Trapping in Thin-Film Amorphous Silicon Solar Energy Mater., 18 263-281 (1989)... 

A thin film of tin oxide with a rough texture, produced by MOCVD from tetramethyl tin, (CH3)4Sn, deposited on an amorphous silicon cell provides a light-trapping surface, which enhances the efficiency of the device. 

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